Resin molded type semiconductor device having a conductor film

Claim 2

A semiconductor integrated circuit device having element regions which are formed in one major surface of a substantially tetragonal semiconductor substrate, a broad conductor film which provides a power source wiring and which is formed on an insulating film on the major surface of the semiconductor substrate and arranged to extend along a peripheral part of the major surface and on at least one corner of said semiconductor substrate, an inorganic passivation film which is formed over said conductor film, and a sealing member of a resin which overlies said passivation film and molds the semiconductor substrate; said broad conductor film having at least one opening therein for substantially limiting the effective width at a portion of the conductor film located on said at least one corner of said semiconductor substrate and for reducing stresses caused by the sealing member overlying the conductor film at said at least one corner thereby eliminating the occurrence of cracks in said passivation film; said at least one opening having a width that is substantially smaller than the width of said broad conductor film provided by portions of the broad conductor film adjacent to said at least one opening and the width of said broad conductor film being sufficient to act as a power wiring for said element regions.

Claim 3

A semiconductor device according to claim 1, wherein said conductor film is covered with a passivation film of phosphosilicate glass.

Claim 4

A semiconductor device according to claim 1, wherein said conductor film is electrically connected with said semiconductor substrate at an outer terminating part of the conductor film.

Claim 5

A semiconductor device according to claim 1, wherein said at least one opening is an L-shaped slit.

Claim 6

A semiconductor device according to claim 1, wherein said at least one opening comprises a plurality of holes arrayed into an L-letter shape.

Claim 7

A semiconductor device according to claim 1, wherein said conductor film is made of aluminum.

Claim 8

A semiconductor integrated circuit device comprising: a holding member; a substantially tetragonal semiconductor substrate having opposite major surfaces and fixed on said holding member at one of said major surfaces, said semiconductor substrate having an elongated broad conductor film which provides a power source wiring and which is formed on an insulating film on the other of said major surfaces and arranged to extend along the periphery of said substantially tetragonal semiconductor substrate, said elongated broad conductor film having at least one opening therein for substantially limiting the effective width of a portion of the film located on at least one of the four corners of said substantially tetragonal semiconductor substrate; said at least one opening having a width that is substantially smaller than the width of said broad conductor film provided by portions of the broad conductor film adjacent to said at least one opening and the width of said broad conductor film being sufficient to act as a power wiring for element regions formed in the other of said major surfaces; an inorganic passivation film formed over said conductor film and said other of said major surfaces of said semiconductor substrate; a molding member of a resin covering said holding member, said semiconductor substrate, said conductor film and said passivation film; a plurality of leads, each having one end portion which extends to the vicinity of a peripheral edge of said holding member inside said molding member and the other end portion which protrudes out of said molding member, said one end portions of said plurality of leads being electrically connected to electrodes on said semiconductor substrate.

Claim 9

A semiconductor integrated circuit device comprising: a holding member; a substantially tetragonal semiconductor substrate having opposite major surfaces and fixed on said holding member at one of said major surfaces, said semiconductor substrate having an elongated broad conductor film which provides a power source wiring and which is formed on an insulating film on the other of said major surfaces and arranged to extend along the periphery of said substantially tetragonal semiconductor substrate, said elongated broad conductor film having at least one opening therein for substantially limiting the effective width of a portion of the film located on at least one of the four corners of said substantially tetragonal semiconductor substrate; said at least one opening having a width that is substantially smaller than the width of said broad conductor film provided by portions of the broad conductor film adjacent to said at least one opening and the width of said broad conductor film being sufficient to act as a power wiring for element regions formed in the other of said major surfaces; an inorganic passivation film formed over said conductor film and said other of said major surfaces of said semiconductor substrate; a molding member of a resin covering said holding member, said semiconductor substrate, said conductor film and said passivation film; a plurality of leads, each having one end portion which extends to the vicinity of a peripheral edge of said holding member inside said molding member and the other end portion which protrudes out of said molding member, said one end portions of said plurality of leads being electrically connected to electrodes on said semiconductor substrate.

Claim 10

A semiconductor device according to claim 7, wherein said at least one opening formed in the portion of the conductor film located on at least one corner of said substantially tetragonal semiconductor substrate is a slit.

Claim 11

A semiconductor device according to claim 8, wherein said slit is L-shaped.

Claim 12

A semiconductor device according to claim 7, wherein said at least one opening formed in the portion of the film located on at least one corner of said substantially tetragonal semiconductor substrate comprises a plurality of arrayed holes.

Claim 13

A semiconductor device according to claim 10, wherein said plurality holes are arrayed into an L-letter shape.

Claim 14

A semiconductor device according to claim 7, wherein said elongated broad conductor film is electrically connected with said semiconductor substrate.

Claim 15

A semiconductor device according to claim 7, wherein said elongated broad conductor film is covered with a film of phosphosilicate glass.

Claim 16

A semiconductor device according to claim 7, wherein said elongated broad conductor film is made of aluminum.

Claim 17

A semiconductor device according to claim 7, wherein the width of said broad conductor film is 100 μm.

Claim 18

A semiconductor device according to claim 15, wherein the width of said opening is approximately 10 μm.

Claim 19

A semiconductor integrated circuit device comprising: a semiconductor substrate having one major surface thereon; a plurality of element regions formed in said one major surface; a narrow conductor film formed over one portion of the major surface of the semiconductor substrate; a broad conductor film formed over another portion of the major surface of the semiconductor substrate including a peripheral part of said major surface; an inorganic passivation film formed over the narrow conductor film and the broad conductor film; a sealing member comprised of a resin which covers the passivation film and molds at least the major surface of the semiconductor substrate; the broad conductor film including at least one opening within a portion of the conductor film overlying a peripheral portion of said semiconductor substrate to which relatively strong stress is applied by said sealing member whereby cracks which occur in said passivation film, in absence of said at least one opening are avoided; said at least one opening having a width that is substantially smaller than the width of said broad conductor film provided by portions of the broad conductor film adjacent to said at least one opening and said width of the broad conductor being sufficient to act as a power wiring for said element regions.

Claim 20

A semiconductor integrated circuit device comprising: a semiconductor substrate having one major surface thereon; a plurality of element regions formed in said one major surface; a narrow conductor film formed over one portion of the major surface of the semiconductor substrate; a broad conductor film formed over another portion of the major surface of the semiconductor substrate including a peripheral part of said major surface; an inorganic passivation film formed over the narrow conductor film and the broad conductor film; a sealing member comprised of a resin which covers the passivation film and molds at least the major surface of the semiconductor substrate; the broad conductor film including at least one opening within a portion of the conductor film overlying a peripheral portion of said semiconductor substrate to which relatively strong stress is applied by said sealing member whereby cracks which occur in said passivation film, in absence of said at least one opening are avoided; said at least one opening having a width that is substantially smaller than the width of said broad conductor film provided by portions of the broad conductor film adjacent to said at least one opening and said width of the broad conductor being sufficient to act as a power wiring for said element regions.

Claim 21

A semiconductor integrated circuit device according to claim 17, wherein the at least one opening comprises a slit.

Claim 22

A semiconductor integrated circuit device according to claim 17, wherein the at least one opening includes a plurality of holes that are formed through said conductor film.

Claim 23

A semiconductor integrated circuit device according to claim 1, wherein said sealing member is formed of a thermosetting or thermoplastic resin and the substrate is a silicon chip.

Claim 24

A semiconductor integrated circuit device according to claim 20, wherein said broad conductor film is made of aluminum.

Claim 25

A semiconductor integrated circuit device according to claim 20, wherein said broad conductor film is made of a metal and said passivation film is made of a glass.

Claim 26

A semiconductor integrated circuit device comprising: (a) a holding member; (b) a substantially tetragonal semiconductor substrate having a first major surface and a second major surface, and secured on said holding member at the second major surface, said semiconductor substrate having a plurality of narrow conductor films and a broad conductor film formed substantially simultaneously over the first major surface extending along peripheral edge of said semiconductor substrate; (c) a plurality of element regions formed in said first major surface; (d) an inorganic passivation film formed over the narrow conductor films the broad conductor film and the element regions; (e) a sealing member of a resin covering said holding member, said semiconductor substrate, said narrow conductor films, said broad conductor film and said passivation film; (f) a plurality of leads, each having one end portion which extends to the vicinity of a peripheral edge of said holding member inside said sealing member, and the other end portion which protrudes out of said sealing member, said one end portions of said plurality of leads being electrically connected to electrodes at the first major surface of said semiconductor substrate; said broad conductor film having at least one opening therein for substantially limiting the effective width at a portion of the broad conductor film overlying a portion of the semiconductor substrate to which stress is applied by said sealing member; said at least one opening having a width that is substantially smaller than the width of said broad conductor film provided by portions of the broad conductor film adjacent to said at least one opening and the width of said broad conductor film being sufficient to act as a power wiring for said element regions.

Claim 27

A semiconductor integrated circuit device comprising: (a) a holding member; (b) a substantially tetragonal semiconductor substrate having a first major surface and a second major surface, and secured on said holding member at the second major surface, said semiconductor substrate having a plurality of narrow conductor films and a broad conductor film formed substantially simultaneously over the first major surface extending along peripheral edge of said semiconductor substrate; (c) a plurality of element regions formed in said first major surface; (d) an inorganic passivation film formed over the narrow conductor films the broad conductor film and the element regions; (e) a sealing member of a resin covering said holding member, said semiconductor substrate, said narrow conductor films, said broad conductor film and said passivation film; (f) a plurality of leads, each having one end portion which extends to the vicinity of a peripheral edge of said holding member inside said sealing member, and the other end portion which protrudes out of said sealing member, said one end portions of said plurality of leads being electrically connected to electrodes at the first major surface of said semiconductor substrate; said broad conductor film having at least one opening therein for substantially limiting the effective width at a portion of the broad conductor film overlying a portion of the semiconductor substrate to which stress is applied by said sealing member; said at least one opening having a width that is substantially smaller than the width of said broad conductor film provided by portions of the broad conductor film adjacent to said at least one opening and the width of said broad conductor film being sufficient to act as a power wiring for said element regions.

Claim 28

A semiconductor integrated circuit device according to claim 23, wherein the at least one opening comprises a slit.

Claim 29

A semiconductor integrated circuit device according to claim 23, wherein the at least one opening includes a plurality of holes that are formed through said broad conductor film.

Claim 30

A semiconductor integrated circuit device according to claim 23, wherein said narrow and broad conductor films are composed of metal material mechanically softer than that of said passivation film.

Claim 31

A semiconductor integrated circuit device having a plurality of element regions which are formed in one major surface of a substantially tetragonal semiconductor chip, and metal wiring means for electrically connecting said plurality of element regions formed on the major surface of the semiconductor chip; said metal wiring means comprising a broad metal conductor film formed adjacent to the peripheral edge of the semiconductor chip, an inorganic passivation film which is formed over said broad metal conductor film and a thermosetting sealing resin which overlies said passivation film and which encapsulates the semiconductor chip, said broad metal conductor film having at least one opening for substantially limiting the effective width at a portion of the semiconductor chip at which stress is applied by said sealing resin, said at least one opening having a width that is substantially smaller than the width of said broad conductor film provided by portions of the broad conductor film adjacent to said at least one opening and the width of said broad conductor film being sufficient to act as a power wiring for the plurality of element regions.

Claim 32

A semiconductor integrated circuit device having a plurality of element regions which are formed in one major surface of a substantially tetragonal semiconductor chip, and metal wiring means for electrically connecting said plurality of element regions formed on the major surface of the semiconductor chip; said metal wiring means comprising a broad metal conductor film formed adjacent to the peripheral edge of the semiconductor chip, an inorganic passivation film which is formed over said broad metal conductor film and a thermosetting sealing resin which overlies said passivation film and which encapsulates the semiconductor chip, said broad metal conductor film having at least one opening for substantially limiting the effective width at a portion of the semiconductor chip at which stress is applied by said sealing resin, said at least one opening having a width that is substantially smaller than the width of said broad conductor film provided by portions of the broad conductor film adjacent to said at least one opening and the width of said broad conductor film being sufficient to act as a power wiring for the plurality of element regions.

Claim 33

A semiconductor device according to claim 27, wherein said broad conductive film is covered with a passivation film comprised of phosphosilicate glass.

Claim 34

A semiconductor device according to claim 27, wherein said at least one opening comprises a slit.

Claim 35

A semiconductor device according to claim 27, wherein said at least one opening comprises a plurality of holes.

Claim 36

A semiconductor device according to claim 27, wherein said broad conductor film comprises aluminum.

Claim 37

A semiconductor integrated circuit device according to claim 1, wherein said power source wiring is a wiring for applying a ground potential to said element regions.

Claim 38

A semiconductor integrated circuit device according to claim 2, wherein said power source wiring is a wiring for applying a power source potential to said element regions.