US4624863A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of fabricating Schottky diodes and electrical interconnections in semiconductor structures
Assignee: National Semiconductor Corp
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Filing: 1985-01-31
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Granted: 1986-11-25
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Expires: 2005-01-31
Abstract
Abstract A bipolar memory cell is fabricated by forming diodes 60 and 65 on top of the transistors Q1 and Q2 formed in the underlying substrate 10. Metal silicide 30 overlies strips 34 and 35 of doped polycrystalline silicon 25, 28, 37, and 38 to cross-couple the bases and collectors of the two transistors Q1 and Q2 forming the memory cell. The metal silicide 30 shorts PN junctions 29 in polycrystalline 23. Two further strips 50 and 52, each comprising a sandwich of P type polycrystalline silicon 42, metal silicide 45, and N conductivity type polycrystalline silicon 47, are formed to couple the cross-coupled bases and collectors to respective diodes 60 and 65. The diodes 60 and 65 are formed by depositing metal 62 and 64 in electrical contact with the underlying N type polycrystalline silicon 47.
Inventors
- 👤 Madhukar B. Vora
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 01:42
CPC Classifications
H; H10; H10B; H10B10/00; H10B10/10; H10W; H10W20/00; H10W20/40
Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
155 words
A method of fabricating Schottky diodes and electrical connections between opposite conductivity type regions in an underlying semiconductor structure comprising: depositing a first layer of semiconductor material across the surface of the underlying semiconductor structure; doping the first layer of semiconductor material to correspond to the desired conductivity of the opposite conducting type regions in the underlying semiconductor structure between which electrical connections are desired; depositing a first electrically conductive layer on the first layer of semiconductor material to short any PN junctions therein; forming insulating material over the first electrically conductive layer; depositing a second layer of semiconductor material over the insulating material and on the underlying semiconductor structure; depositing a second electrically conductive layer on the second layer of semiconductor material; depositing a third layer of semiconductor material on the second electrically conductive layer; and depositing metal in contact with selected portions of third layer of semiconductor material to thereby form Schottky diodes.
Claim 2
Independent Claim
155 words
A method of fabricating Schottky diodes and electrical connections between opposite conductivity type regions in an underlying semiconductor structure comprising: depositing a first layer of semiconductor material across the surface of the underlying semiconductor structure; doping the first layer of semiconductor material to correspond to the desired conductivity of the opposite conducting type regions in the underlying semiconductor structure between which electrical connections are desired; depositing a first electrically conductive layer on the first layer of semiconductor material to short any PN junctions therein; forming insulating material over the first electrically conductive layer; depositing a second layer of semiconductor material over the insulating material and on the underlying semiconductor structure; depositing a second electrically conductive layer on the second layer of semiconductor material; depositing a third layer of semiconductor material on the second electrically conductive layer; and depositing metal in contact with selected portions of third layer of semiconductor material to thereby form Schottky diodes.
Claim 3
Dependent Claim
21 words
A method as in claim 1 wherein the step of depositing the first layer of semiconductor material comprises depositing polycrystalline silicon.
Claim 4
Dependent Claim
15 words
A method as in claim 2 wherein the first electrically conductive layer comprises metal silicide.
Claim 5
Dependent Claim
20 words
A method as in claim 3 wherein the insulating material comprises an oxide of the first layer of semiconductor material.
Claim 6
Dependent Claim
16 words
A method as in claim 4 wherein the second layer of semiconductor material comprises polycrystalline silicon.
Claim 7
Dependent Claim
15 words
A method as in claim 5 wherein the second electrically conductive layer comprises metal silicide.
Claim 8
Dependent Claim
16 words
A method as in claim 6 wherein the third layer of semiconductor material comprises polycrystalline silicon.
Claim 9
Dependent Claim
11 words
A method as in claim 7 wherein the metal comprises aluminum.
Claim 10
Dependent Claim
20 words
A method as in claim 8 wherein the second layer of semiconductor material is doped with P conductivity type impurities.
Claim 11
Dependent Claim
20 words
A method as in claim 9 wherein the third layer of semiconductor material is doped with N conductivity type impurities.
Claim 12
Dependent Claim
59 words
A method as in claim 1 wherein, following the step of depositing the first electrically conductive layer, a step of patterning the first layer of semiconductor material and the first electrically conductive layer is performed to define two strips, each including a portion of the first layer of semiconductor material and a portion of the first electrically conductive layer.
Claim 13
Dependent Claim
46 words
A method as in claim 11 wherein, following the step of depositing a third layer of semiconductor material, a step of patterning the second and third layers of semiconductor material and the second electrically conductive layer is performed to define those layers into two additional strips.
Claim 14
Dependent Claim
44 words
A method as in claim 12 wherein the strips comprising the second and third layers of semiconductor material and the second electrically conductive layer are substantially perpendicular to the strips formed from the first layer of semiconductor material and the first electrically conductive layer.
Claim 15
Dependent Claim
24 words
A method as in claim 13 wherein, following the step of depositing metal, a step of patterning the metal into two strips is performed.
Claim 16
Dependent Claim
31 words
A method as in claim 14 wherein the two strips of metal are parallel to the two strips comprising the first layer of semiconductor material and the first electrically conductive layer.
Claim 17
Dependent Claim
102 words
A method as in claim 1 wherein the step of depositing metal comprises: depositing a layer of selected material on the third layer of semiconductor material; removing the selected material from everywhere on the third layer of semiconductor material except where the metal is to contact the third layer of semiconductor material; forming a layer of insulating material over all of the third layer of semiconductor material except where the selected material remains; removing the remaining regions of selected material; and depositing the metal across the surface of the insulating material and the exposed portions of the third layer of semiconductor material.
Claim 18
Dependent Claim
13 words
A method as in claim 16 wherein the selected material comprises silicon nitride.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-11-24 | 1990-05-26 | 1990-11-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-11-24 | 1994-05-26 | 1994-11-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-11-24 | 1998-05-26 | 1998-11-25 | $7700.00 | Window Closed / Lapsed |