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US4624767A Expired / Lapsed US ⏱️ 0.0 years remaining

Sputter etching apparatus having a second electrically floating electrode and magnet means

Assignee: Ulvac Inc
•
Filing: 1985-02-20
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Granted: 1986-11-25
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Expires: 2005-02-20
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Abstract

Abstract Sputter etching apparatus which includes a sputter etching electrode for mounting a substrate in a vacuum treatment chamber and another electrode oppositely facing the sputter etching electrode. The other electrode is in an electrically floating condition; that is, it is electrically insulated from contact with the chamber structure and from direct connection with the power source. Plasma generated is confined between the two electrodes. An annular magnetic field can be generated surrounding the space confining the plasma to further concentrate it.

Inventors

  • 👤 Hisaharu Obinata

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 11:04
CPC Classifications
C; C23; C23C; C23C14/00; C23C14/22; C23C14/34; C23C14/35; H; H01; H01J; H01J37/00; H01J37/32; H01J37/34

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 163 words
A sputter etching apparatus comprising: an evacuatible vacuum treatment chamber, a sputter etching electrode mounted in said chamber for supporting a substrate to be etched, means for evacuating said chamber, means for introducing an etching gas into said evacuated chamber, means for supplying electric power to said electrode for generating a plasms from said etching gas in said chamber, an opposite electrode mounted in said chamber in an electrically floating condition facing said sputter etching electrode for confining the plasma in the space formed between said opposite electrode and said sputter etching electrode, said opposite electrode being electrically insulated from contact with said chamber and from direct connection with said means for supplying electric power, and magnet means mounted in said chamber for generating a magnetic field which extends substantially perpendicularly to said opposite electrode and said sputter etching electrode and extends in an axial direction along a peripheral open region surrounding said space so that the plasma is confined in said space.
Claim 2
Dependent Claim 163 words
A sputter etching apparatus comprising: an evacuatible vacuum treatment chamber, a sputter etching electrode mounted in said chamber for supporting a substrate to be etched, means for evacuating said chamber, means for introducing an etching gas into said evacuated chamber, means for supplying electric power to said electrode for generating a plasms from said etching gas in said chamber, an opposite electrode mounted in said chamber in an electrically floating condition facing said sputter etching electrode for confining the plasma in the space formed between said opposite electrode and said sputter etching electrode, said opposite electrode being electrically insulated from contact with said chamber and from direct connection with said means for supplying electric power, and magnet means mounted in said chamber for generating a magnetic field which extends substantially perpendicularly to said opposite electrode and said sputter etching electrode and extends in an axial direction along a peripheral open region surrounding said space so that the plasma is confined in said space.
Claim 3
Dependent Claim 27 words
The apparatus as claimed in claim 1, wherein said magnet means comprises two annular permanent magnets mounted around said sputter etching electrode and said opposite electrode respectively.
Claim 4
Dependent Claim 45 words
An apparatus as claimed in claim 1, wherein said means for supplying electric power is an RF power source producing 200-500 watts, and said magnet means produces a magnetic field having an intensity of 20-60 gauss in an axial direction of the peripheral open region.

References Cited (Backward Citations)

US3325394A Cited
US3669861A Cited
US4025410A Cited
US4033843A Cited
US4352725A Cited
US4333814A Cited
EP0040081A2 Cited
US4349409A Cited
US4426274A Cited
US4431473A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1989-11-24 1990-05-26 1990-11-25 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1993-11-24 1994-05-26 1994-11-25 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1997-11-24 1998-05-26 1998-11-25 $7700.00 Window Closed / Lapsed

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