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US4608690A Expired / Lapsed US ⏱️ 0.0 years remaining

Detecting improper operation of a digital data processing apparatus

Assignee: Tektronix Inc
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Filing: 1985-06-10
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Granted: 1986-08-26
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Expires: 2005-06-10
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Abstract

Abstract Improper operation of a digital data processing apparatus is detected by applying a predetermined pattern of test digits to a data input of the apparatus and determining whether the pattern of digits provided at the data output of the apparatus in response to the application of the predetermined pattern of test digits to the data input is the same as the pattern that would be provided at the data output if the apparatus were operating properly.

Inventors

  • 👤 John L. Judge

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 22:09
CPC Classifications
G; G06; G06F; G06F11/00; G06F11/22; G06F11/2205; G06F11/2215

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 188 words
A method of testing a digital memory apparatus that comprises a memory device having first through mth separately addressable memory locations each memory location storing a digital word having n binary digits, input means for writing a digital signal into the memory device, and means for reading the contents of each memory location out of the memory device, the method comprising applying a digital input signal having a succession of sequences of p digital words, where p is an even number less than m and is not an integral submultiple of m, to the input means, modifying the digital input signal by inserting a predetermined digital test word into the digital input signal in place of the qth word of each sequence, writing the modified sequences into the first through mth separately addressable memory locations sequentially and repeatedly, reading the contents of the first through mth memory locations sequentially and repeatedly, and comparing at least one predetermined digit of the qth digital word of each sequence read out of the memory device with other digits of that word and thereby determining whether the memory apparatus is operating properly.
Claim 2
Independent Claim 188 words
A method of testing a digital memory apparatus that comprises a memory device having first through mth separately addressable memory locations each memory location storing a digital word having n binary digits, input means for writing a digital signal into the memory device, and means for reading the contents of each memory location out of the memory device, the method comprising applying a digital input signal having a succession of sequences of p digital words, where p is an even number less than m and is not an integral submultiple of m, to the input means, modifying the digital input signal by inserting a predetermined digital test word into the digital input signal in place of the qth word of each sequence, writing the modified sequences into the first through mth separately addressable memory locations sequentially and repeatedly, reading the contents of the first through mth memory locations sequentially and repeatedly, and comparing at least one predetermined digit of the qth digital word of each sequence read out of the memory device with other digits of that word and thereby determining whether the memory apparatus is operating properly.
Claim 3
Dependent Claim 102 words
A method according to claim 1, wherein q is less than p/2 and the method comprises inserting a first predetermined digital test word into the digital input signal in place of the qth word of each sequence and inserting a second predetermined test word into the digital input signal in place of the (q+p/2)th word of each sequence, the second test word being the complement of the first test word, and the method further comprises comparing at least one digit of the qth and (q+p/2)th words of each sequence read out of the memory device with the other digits of that word.
Claim 4
Dependent Claim 51 words
A method according to claim 2, further comprising inserting the second predetermined digital test word into the digital input signal in place of the (q+1)th word of each sequence and inserting the first predetermined digital test word into the digital input signal in place of the (q+p/2+1)th word of each sequence.
Claim 5
Dependent Claim 44 words
A method according to claim 2, wherein the most significant digit of the first digital test word has one of the two possible binary states and each other digit of the first digital test word has the other of the two possible binary states.
Claim 6
Dependent Claim 47 words
A method according to claim 2, wherein each sequence of p digital words represents in digital form one frame of a composite video signal, and wherein the qth and (q+p/2)th words fall within the vertical blanking interval following respective fields of one frame of the video signal.
Claim 7
Dependent Claim 217 words
In combination, digital memory apparatus operating to receive a digital signal having a succession of sequences of p digital words, where p is an even number and greater than zero, and test apparatus for determining whether the memory apparatus is operating properly, the memory apparatus comprising a memory device having first through mth separately addressable memory locations (where m is greater than p and is not an integral multiple of p) each memory location storing a digital word having n binary digits, input means for receiving a succession of sequences of p digital input words and writing the succession of sequences of p digital words into the memory device sequentially and repeatedly, and output means for reading digital words from the memory device sequentially and repeatedly, and the test apparatus comprising means operating during normal operation of the memory apparatus for modifying the succession of sequences of p digital input words received by the input means by replacing the qth word of each sequence by a predetermined digital test word having n binary digits, so that the modified sequences are written into the memory device sequentially and repeatedly, and comparison means for determining whether the word read out of the memory device as the qth word of each sequence is identical to the predetermined digital test word.
Claim 8
Dependent Claim 217 words
In combination, digital memory apparatus operating to receive a digital signal having a succession of sequences of p digital words, where p is an even number and greater than zero, and test apparatus for determining whether the memory apparatus is operating properly, the memory apparatus comprising a memory device having first through mth separately addressable memory locations (where m is greater than p and is not an integral multiple of p) each memory location storing a digital word having n binary digits, input means for receiving a succession of sequences of p digital input words and writing the succession of sequences of p digital words into the memory device sequentially and repeatedly, and output means for reading digital words from the memory device sequentially and repeatedly, and the test apparatus comprising means operating during normal operation of the memory apparatus for modifying the succession of sequences of p digital input words received by the input means by replacing the qth word of each sequence by a predetermined digital test word having n binary digits, so that the modified sequences are written into the memory device sequentially and repeatedly, and comparison means for determining whether the word read out of the memory device as the qth word of each sequence is identical to the predetermined digital test word.
Claim 9
Dependent Claim 93 words
A combination according to claim 6, wherein q is less than p/2 and the means for modifying the sequences of digital input words comprise means for replacing the qth and (q+p/2)th words of each sequence by first and second predetermined digital test words respectively, the second test word being the complement of the first test word, and the comparison means comprise means for determining whether the digital words read out of the memory device as the qth and (q+p/2)th words of each sequence are identical to the first and second test words respectively.

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1989-08-25 1990-02-24 1990-08-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1993-08-25 1994-02-24 1994-08-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1997-08-25 1998-02-24 1998-08-26 $7700.00 Window Closed / Lapsed

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