US4607366A
Expired / Lapsed
US
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Apparatus for testing a highly-integrated, microprogram-controlled electronic component
Assignee: Siemens AG
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Filing: 1983-11-07
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Granted: 1986-08-19
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Expires: 2003-11-07
Abstract
Abstract An apparatus for testing a highly-integrated microprogram-controlled electronic component in combination with the component, includes a sequencer disposed in the component for forming microprogram sequence links, and a test register disposed in the component having outputs connected to the sequencer for controlling a test, the test register having an input being connectible to a central processing unit and to an external testing device.
Inventors
- 👤 Hans Stadlmeier
- 👤 Franz Schonberger
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 00:26
CPC Classifications
G; G06; G06F; G06F11/00; G06F11/22; G06F11/2205; G06F11/2236; G06F11/2268
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
104 words
Apparatus for testing a highly-integrated microprogram-controlled electronic component in combination with the component, comprising a sequencer disposed in the component for forming micro-program sequence links, and a test register having a plurality of storage locations; a central processing unit connected to the component and an in-circuit emulator (ICE) external to the component, both being capable of addressingly engaging the test register; the ICE, in case of a fault condition, operatively engaging the test register for executing test-control microcommands by the test register; the test register disposed in the component and having a plurality of output channels connected to said sequencer for controlling the test.
Claim 2
Dependent Claim
104 words
Apparatus for testing a highly-integrated microprogram-controlled electronic component in combination with the component, comprising a sequencer disposed in the component for forming micro-program sequence links, and a test register having a plurality of storage locations; a central processing unit connected to the component and an in-circuit emulator (ICE) external to the component, both being capable of addressingly engaging the test register; the ICE, in case of a fault condition, operatively engaging the test register for executing test-control microcommands by the test register; the test register disposed in the component and having a plurality of output channels connected to said sequencer for controlling the test.
Claim 3
Dependent Claim
27 words
Apparatus according to claim 1 comprising a first storage location for storing a test address enable microcommand for selectively applying a corresponding test address on the sequencer.
Claim 4
Dependent Claim
26 words
Apparatus according to claim 2, comprising a second storage location for storing a single step mode microcommand for activating a micro-command one step at a time.
Claim 5
Dependent Claim
26 words
Apparatus according to claim 3, comprising a third storage location for storing an error stop mode microcommand for stopping at least one of said output channels.
Claim 6
Dependent Claim
25 words
Apparatus according to claim 4, comprising a fourth storage location for storing a cyclic mode microcommand for the cyclically repeated execution of a given microcommand.
Claim 7
Dependent Claim
32 words
Apparatus according to claim 5, comprising two fifth storage locations for reading out at least part of the contents of a microcommand memory and transmitting said part to a given external bus.
Claim 8
Dependent Claim
41 words
Apparatus according to claim 6, comprising a sixth storage location for storing a "slatch-out" micro-command for enabling at least one of a microcommand sequence link or micro address generated by the sequencer to be connected to selected pins of the component.
Claim 9
Dependent Claim
27 words
Apparatus according to claim 7, comprising a seventh storage location for storing a "fixed channel number" microcommand for limiting the component to operate a single channel only.
Claim 10
Dependent Claim
26 words
Apparatus according to claim 8, comprising an eighth storage location for storing a register test access microcommand for providing test access to registers having write protection.
Claim 11
Dependent Claim
28 words
Apparatus according to claim 2, comprising a diagnostic register for storing the code of a just executed microcommand, for saving said code in case of a fault condition.
Claim 12
Dependent Claim
25 words
Apparatus according to claim 10, comprising means for reading said diagnostic register and an internal bus included in said component for reading said diagnostic register.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1989-08-18 | 1990-02-17 | 1990-08-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1993-08-18 | 1994-02-17 | 1994-08-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1997-08-18 | 1998-02-17 | 1998-08-19 | $7700.00 | Window Closed / Lapsed |