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US4599678A Expired / Lapsed US ⏱️ 0.0 years remaining

Plasma-deposited capacitor dielectrics

Assignee: Polyplasma Inc
•
Filing: 1985-03-19
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Granted: 1986-07-08
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Expires: 2005-03-19
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Abstract

Abstract A plasma-deposited silicon compound thin film dielectric for use in a thin film capacitor. The film is produced in a high frequency glow discharge with a substrate heated to a temperature in excess of 50° C. A thin film capacitor using such a film has a lower dissipation factor and a reduced tendency to age.

Inventors

  • 👤 Michael R. Wertheimer
  • 👤 Tyamagondlu S. Ramu

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 07:10
CPC Classifications
H; H01; H01G; H01G4/00; H01G4/002; H01G4/018; H01G4/06; H01G4/08; H01G4/085; Y; Y10; Y10T; Y10T428/00; Y10T428/31504; Y10T428/31652; Y10T428/31663

Claims Analysis

Total Claims: 29
Claim 1
Independent Claim 35 words
A plasma-deposited silicon compound thin film dielectric material for use in a thin film capacitor, such film being produced in a glow discharge with a substrate heated to a temperature in excess of 50° C.
Claim 2
Dependent Claim 35 words
A plasma-deposited silicon compound thin film dielectric material for use in a thin film capacitor, such film being produced in a glow discharge with a substrate heated to a temperature in excess of 50° C.
Claim 3
Dependent Claim 19 words
A dielectric film as defined in claim 1 wherein the deposition frequency of the glow discharge is 2.45 GHz.
Claim 4
Dependent Claim 15 words
A dielectric film as defined in claim 1 wherein said silicon compound comprises an organo-silicone.
Claim 5
Dependent Claim 15 words
A dielectric film as defined in claim 3 wherein said organosilicone comprises plasma-polymerized hexamethyldisiloxane (PPHMDSO).
Claim 6
Dependent Claim 15 words
A dieletric film as defined in claim 3 wherein said organosilicone comprises plasma-polymerized hexamethyldisilazane (PPHMDSN).
Claim 7
Dependent Claim 26 words
A dielectric film as defined in claim 5 wherein said inorganic silicon compound is selected from the group of silicon nitride, silicon oxide or silicone oxynitride.
Claim 8
Dependent Claim 17 words
A dielectric film as defined in claim 1 wherein said silicon compound comprises an inorganic silicon compound.
Claim 9
Dependent Claim 35 words
A plasma-deposited silicon compound thin film dielectric material for use in a thin film capacitor, such film being produced in a glow discharge with a substrate heated to a temperature between 50° and 1000° C.
Claim 10
Dependent Claim 35 words
A plasma-deposited silicon compound thin film dielectric material for use in a thin film capacitor, such film being produced in a glow discharge with a substrate heated to a temperature between 50° and 1000° C.
Claim 11
Dependent Claim 15 words
A dielectric film as defined in claim 8 wherein said silicon compound comprises an organo-silicone.
Claim 12
Dependent Claim 15 words
A dielectric film as defined in claim 9 wherein said organosilicone comprises plasma-polymerized hexamethyldisiloxane (PPHMDSO).
Claim 13
Dependent Claim 15 words
A dielectric film as defined in claim 9 wherein said organosilicone comprises plasma-polymerized hexamethyldisilazane (PPHMDSN).
Claim 14
Dependent Claim 26 words
A dielectric film as defined in claim 11 wherein said inorganic silicon compound is selected from the group of silicon nitride, silicon oxide or silicone oxynitride.
Claim 15
Dependent Claim 17 words
A dielectric film as defined in claim 8 wherein said silicon compound comprises an inorganic silicon compound.
Claim 16
Dependent Claim 35 words
A plasma-deposited silicon compound thin film dielectric material for use in a thin film capacitor, such film being produced in a glow discharge with a substrate heated to a temperature between 100° and 650° C.
Claim 17
Dependent Claim 35 words
A plasma-deposited silicon compound thin film dielectric material for use in a thin film capacitor, such film being produced in a glow discharge with a substrate heated to a temperature between 100° and 650° C.
Claim 18
Dependent Claim 19 words
A dielectric film as defined in claim 14 wherein the deposition frequency of the glow discharge is 2.45 GHz.
Claim 19
Dependent Claim 15 words
A dielectric film as defined in claim 14 wherein said silicon compound comprises an organosilicone.
Claim 20
Dependent Claim 16 words
A dielectric film as defined in claim 16 wherein said organosilicone comprises plasma polymerized hexamethyldisiloxane (PPHMDSO).
Claim 21
Dependent Claim 15 words
A dielectric film as defined in claim 16 wherein said organosilicone comprises plasma-polymerized hexamethyldisilazane (PPHMDSN).
Claim 22
Dependent Claim 17 words
A dielectric film as defined in claim 14 wherein said silicon compound comprises an inorganic silicon compound.
Claim 23
Dependent Claim 38 words
A thin film capacitor characterized in that said capacitor comprises a plasma-deposited silicon compound thin film dielectric material, such film being produced in a glow discharge with a substrate heated to a temperature in excess of 50° C.
Claim 24
Dependent Claim 38 words
A thin film capacitor characterized in that said capacitor comprises a plasma-deposited silicon compound thin film dielectric material, such film being produced in a glow discharge with a substrate heated to a temperature in excess of 50° C.
Claim 25
Dependent Claim 16 words
A thin film capacitor as defined in claim 20 wherein said silicon compound comprises an organosilicone.
Claim 26
Dependent Claim 16 words
A thin film capacitor as defined in claim 21 wherein said organosilicone comprises plasma-polymerized hexamethyldisiloxane (PPHMDSO).
Claim 27
Dependent Claim 16 words
A thin film capacitor as defined in claim 21 wherein said organosilicone comprises plasma-polymerized hexamethyldisilazane (PPHMDSN).
Claim 28
Dependent Claim 18 words
A thin film capacitor as defined in claim 20 wherein said silicon compound comprises an inorganic silicon compound.
Claim 29
Dependent Claim 27 words
A thin film capacitor as defined in claim 24 wherein said inorganic silicon compound is selected from the group of silicon nitride, silicon oxide or silicon oxynitride.

References Cited (Backward Citations)

US3333169A Cited
US3619259A Cited
US3806775A Cited
US3814983A Cited
US4156887A Cited
US4072976A Cited
US4431701A Cited
US4543294A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1989-07-07 1990-01-06 1990-07-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1993-07-07 1994-01-06 1994-07-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1997-07-07 1998-01-06 1998-07-08 $7700.00 Window Closed / Lapsed

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