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US4586069A Expired / Lapsed US ⏱️ 0.0 years remaining

Opto-electrical device made of silicon for detecting infrared light

Assignee: Airbus Defence and Space GmbH
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Filing: 1983-09-06
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Granted: 1986-04-29
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Expires: 2003-09-06
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Abstract

Abstract An infrared detector element of the Schottky-barrier type is constructed to have its sensitivity in the range of about 8 to 12 microns. For this purpose a silicon substrate (1) has a highly doped surface layer (3) of p + -silicon with a doping density in the range of 5×10 18 to 5×10 19 (atoms per cm 3 ) and a thickness in the range of 50 to 200 Angstroms. On top of this layer (3) a metal layer (2) for example of platinum is deposited and partially alloyed into layer (3) to form PtSi. Such elements are arranged in arrays and may be combined with other detector elements having their sensitivity in other spectrum ranges, e.g., 3 to 5 microns and/or in the visible spectrum range.

Inventors

  • 👤 Max Koniger
  • 👤 Gerhard Muller

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 11:04
CPC Classifications
H; H10; H10F; H10F39/00; H10F39/10; H10F39/12; H10F39/18; H10F39/184; H10F30/00; H10F30/20; H10F30/21; H10F30/22; H10F30/227

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 127 words
An opto-electrical apparatus for detecting infrared light, comprising a Schottky-barrier device including at least one detector element including a substrate (1) of p-type silicon, a metal layer (2) having a given work function on one surface of said p-type silicon substrate (1), and a p + -silicon doped intermediate barrier (3) between said p-type silicon substrate (1) and said metal layer (2), said intermediate barrier (3) having a doping density or concentration within the range of 5×10 18 to 5×10 19 atoms per cm 3 and a thickness (d) within the range of 50 to 200 Angstroems, said intermediate barrier further having a barrier height φ=0.10 to 0.15 eV, whereby the device is capable of detecting infrared radiation in the range of about 8 to 12 microns.
Claim 2
Dependent Claim 127 words
An opto-electrical apparatus for detecting infrared light, comprising a Schottky-barrier device including at least one detector element including a substrate (1) of p-type silicon, a metal layer (2) having a given work function on one surface of said p-type silicon substrate (1), and a p + -silicon doped intermediate barrier (3) between said p-type silicon substrate (1) and said metal layer (2), said intermediate barrier (3) having a doping density or concentration within the range of 5×10 18 to 5×10 19 atoms per cm 3 and a thickness (d) within the range of 50 to 200 Angstroems, said intermediate barrier further having a barrier height φ=0.10 to 0.15 eV, whereby the device is capable of detecting infrared radiation in the range of about 8 to 12 microns.
Claim 3
Dependent Claim 53 words
The device of claim 1, wherein said metal layer (2) is platinum in the form of PtSi resulting from annealing or tempering the platinum layer in the temperature range of 350° C. to 500° C. for a time sufficient to partially alloy the platinum into the p + -silicon doped intermediate barrier (3).
Claim 4
Dependent Claim 17 words
The device of claim 1, wherein a plurality of said detector elements are arranged in an array.
Claim 5
Dependent Claim 57 words
The device of claim 1, comprising further detector elements sensitive in a radiation range other than said range of 8 to 12 microns of said first mentioned detector elements, said further detector elements and said first mentioned detector elements being arranged on the same Si chip to form at least one array, and being read out separately.
Claim 6
Dependent Claim 22 words
The device of claim 4, wherein said other detector elements have a sensitivity in the infrared range of 3 to 5 microns.
Claim 7
Dependent Claim 18 words
The device of claim 4, wherein said other detector elements have a sensitivity in the visible light range.

References Cited (Backward Citations)

US4040078A Cited
US4524374A Cited
US4496964A Cited
US4544939A Cited
US4518981A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1989-04-28 1989-10-28 1990-04-29 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1993-04-28 1993-10-28 1994-04-29 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1997-04-28 1997-10-28 1998-04-29 $7700.00 Window Closed / Lapsed

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