US4496964A
Expired / Lapsed
US
⏱️ 0.0 years remaining
MOSFET Light detecting device having a Schottky junction
Assignee: Mitsubishi Electric Corp
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Filing: 1981-08-18
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Granted: 1985-01-29
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Expires: 2001-08-18
Abstract
Abstract A device for detecting light having an improved sensitivity and a method for producing the device. N + source and drain regions are formed on a P-type silicon substrate. The substrate is then covered with an oxidation resistant layer of SiO 2 . A layer of Pt-Si is then deposited between the source and drain regions and a P-type polysilicon layer is deposited on the Pt-Si layer. The device is then annealed to form a Schottky junction between the polysilicon layer and the Pt-Si layer following which a gate electrode is formed on the polysilicon layer.
Inventors
- 👤 Natsuro Tsubouchi
- 👤 Masahiko Denda
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 06:22
CPC Classifications
H; H10; H10F; H10F30/00; H10F30/20; H10F30/21; H10F30/22; H10F30/227; H10F30/28; H10F30/282
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
135 words
A device for detecting incident light, comprising: a semiconductor substrate of a first conductivity type having a surface region, and having a source region and a drain region formed therein of a second conductivity type, a light detection current flowing between said source and drain regions in response to incident light absorbed by said device; an oxidation resistant layer formed on said surface region; a metallic layer formed on said oxidation resistant layer between said source region and said drain region for absorbing said incident light; and a polysilicon layer gate electrode formed on said metallic layer and forming a Schottky barrier at the interface between said polysilicon layer and said metallic layer, said absorption of said incident light by said metallic layer causing conduction across said Schottky barrier to control said light detection current.
Claim 2
Independent Claim
135 words
A device for detecting incident light, comprising: a semiconductor substrate of a first conductivity type having a surface region, and having a source region and a drain region formed therein of a second conductivity type, a light detection current flowing between said source and drain regions in response to incident light absorbed by said device; an oxidation resistant layer formed on said surface region; a metallic layer formed on said oxidation resistant layer between said source region and said drain region for absorbing said incident light; and a polysilicon layer gate electrode formed on said metallic layer and forming a Schottky barrier at the interface between said polysilicon layer and said metallic layer, said absorption of said incident light by said metallic layer causing conduction across said Schottky barrier to control said light detection current.
Claim 3
Dependent Claim
27 words
The device for detecting light as claimed in claim 1 wherein said metallic layer comprises a metal selected from the group consisting of gold, platinum and palladium.
Claim 4
Dependent Claim
18 words
The device for detecting light as claimed in claim 1 wherein said metallic layer comprises a platinum silicide.
Claim 5
Dependent Claim
22 words
The device for detecting light as claimed in claim 1 wherein said oxidation resistant layer comprises a layer of SiO 2 .
Claim 6
Dependent Claim
19 words
The device for detecting light as claimed in claim 1 wherein said semiconductor substrate comprises a P-type silicon substrate.
References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1988-01-29 | 1988-07-30 | 1989-01-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-01-29 | 1992-07-30 | 1993-01-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-01-29 | 1996-07-30 | 1997-01-29 | $7700.00 | Window Closed / Lapsed |