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US4565741A Expired / Lapsed US ⏱️ 0.0 years remaining

Boron nitride film and process for preparing same

Assignee: FUTABA DENSHI KOGYO KK 629 OSHIBA MOBARA-SHI CHIBA-KEN JAPAN
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Filing: 1984-02-28
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Granted: 1986-01-21
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Expires: 2004-02-28
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Abstract

Abstract A boron nitride (BN) film is disclosed having excellent electrical insulating and heat conduction characteristics and capable of acting as seeds for epitaxially growing a semiconductor film thereon which has a crystallizability sufficient to incorporate a semiconductor element therein. The BN film is formed by the growth on a substrate in a manner to be preferentially orientated to a predetermined axis thereof. A process for preparing such film is also disclosed.

Inventors

  • 👤 Kiyoshi Morimoto
  • 👤 Toshinori Takagi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 01:34
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/68; C; C23; C23C; C23C14/00; C23C14/0021; H10P14/20; H10P14/22; H10P14/29; H10P14/2901; H10P14/2922; H10P14/32; H10P14/3202; H10P14/3204; H10P14/3211; H10P14/3214; H10P14/3216; H10P14/3242; H10P14/3244; H10P14/3248; H10P14/3251; H10P14/3258; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3414; H10P14/3421; H10P14/63; H10P14/6326; H10P14/6328; H10P14/6332

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 46 words
A boron nitride film grown on the surface of a substrate by an ionized cluster beam deposition process to be orientated to a predetermined axis of said film, wherein said substrate is formed of an amorphous insulating material, said film being C-axis oriented on said substrate.
Claim 2
Dependent Claim 46 words
A boron nitride film grown on the surface of a substrate by an ionized cluster beam deposition process to be orientated to a predetermined axis of said film, wherein said substrate is formed of an amorphous insulating material, said film being C-axis oriented on said substrate.
Claim 3
Dependent Claim 82 words
A boron nitride film as defined in claim 1, wherein ionized beam cluster deposition process comprises: heating boride charged in a closed-type crucible having at least one injection nozzle to form boron vapor; ejecting said boron vapor through said nozzle into a nitrogen atmosphere having a pressure below 10 -2 Torr and ionizing at least a part thereof; and impinging said ionized boron vapor on the surface of said substrate together with nitrogen to form a boron nitride film on said substrate.

References Cited (Backward Citations)

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1989-01-20 1989-07-22 1990-01-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1993-01-20 1993-07-22 1994-01-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1997-01-20 1997-07-22 1998-01-21 $7700.00 Window Closed / Lapsed

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