Claims Analysis
Total Claims: 43
Claim 1
Independent Claim
39 words
A thin film transistor comprising, as a switched semiconductor portion thereof, a thin film of MP x where M is at least one alkali metal, P is at least one pnictide, and x ranges substantively between 15 and infinity.
Claim 2
Dependent Claim
39 words
A thin film transistor comprising, as a switched semiconductor portion thereof, a thin film of MP x where M is at least one alkali metal, P is at least one pnictide, and x ranges substantively between 15 and infinity.
Claim 3
Dependent Claim
15 words
A thin film transistor as defined in claim 1 wherein said transistor is a MESFET.
Claim 4
Dependent Claim
15 words
A thin film transistor as defined in claim 1 wherein said transistor is a MISFET.
Claim 5
Dependent Claim
25 words
A thin film transistor as defined in claim 1 and a thin film insulating layer in contact with said thin film of MP x .
Claim 6
Dependent Claim
19 words
A thin film transistor as defined in claim 4 wherein said insulating layer consists essentially of SiO 2 .
Claim 7
Dependent Claim
21 words
A thin film transistor as defined in claim 4 wherein said insulating layer consists essentially of Al 2 O 3 .
Claim 8
Dependent Claim
21 words
A thin film transistor as defined in claim 4 wherein said insulating layer consists essentially of Si 3 N 4 .
Claim 9
Dependent Claim
19 words
A thin film transistor as defined in claim 4 wherein said insulating layer comprises a compound containing a pnictide.
Claim 10
Dependent Claim
21 words
A thin film transistor as defined in claim 4 wherein said insulating layer consists essentially of a compound containing a pnictide.
Claim 11
Dependent Claim
26 words
A thin film transistor as defined in claim 4 wherein said insulating layer comprises at least one compound comprising nitrogen and at least one other pnictide.
Claim 12
Dependent Claim
30 words
A thin film transistor as defined in claim 4 wherein said insulating layer comprises P 3 N 5 , where N is nitrogen and P is at least one pnictide.
Claim 13
Dependent Claim
20 words
A thin film transistor as defined in claim 11 wherein said P in said P 3 N 5 comprise phosphorus.
Claim 14
Dependent Claim
22 words
A thin film transistor as defined in claim 11 wherein said P in said P 3 N 5 consist essentially of phosphorus.
Claim 15
Dependent Claim
31 words
A thin film transistor as defined in claim 4 wherein said insulating layer consists essentially of P 3 N 5 where N is nitrogen and P is at least one pnictide.
Claim 16
Dependent Claim
20 words
A thin film transistor as defined in claim 14 wherein said P in said P 3 N 5 comprises phosphorus.
Claim 17
Dependent Claim
22 words
A thin film transistor as defined in claim 14 wherein said P in said P 3 N 5 consists essentially of phosphorus.
Claim 18
Dependent Claim
31 words
A thin film transistor as defined in claim 1 wherein said semiconductor portion comprises a minor amount of a metal to reduce the density of defect levels in the band gap.
Claim 19
Dependent Claim
23 words
A thin film transistor as defined in claim 17 wherein said metal is chosen from the group consisting of iron, chromium, and nickel
Claim 20
Dependent Claim
25 words
A thin film transistor as defined in claim 17 wherein the presence of said metal does not substantially reduce the resistivity of said semiconductor portion.
Claim 21
Dependent Claim
24 words
A thin film transistor as defined in claim 19 wherein said metal comprises substantially less than 1/2% of the atoms of said semiconductor portion.
Claim 22
Dependent Claim
23 words
A thin film transistor as defined in claim 20 wherein said metal is chosen from the group consisting of iron, chromium, and nickel.
Claim 23
Dependent Claim
14 words
A thin film transistor as defined in claim 21 wherein said metal is nickel.
Claim 24
Dependent Claim
34 words
A thin film transistor as defined in claim 1 wherein said semiconductor portion comprises a minor amount of a metal to substantially increase the conductivity of at least a part of said semiconductor portion.
Claim 25
Dependent Claim
23 words
A thin film transistor as defined in claim 23 wherein said metal is chosen from the group consisting of iron, chromium, and nickel.
Claim 26
Dependent Claim
27 words
A thin film transistor as defined in claim 23 wherein said metal comprises substantially more than 1/2% of the atoms of said part of said semiconductor portion.
Claim 27
Dependent Claim
27 words
A thin film transistor as defined in claim 25 wherein said metal comprises substantially more than 1% of the atoms of said part of said semiconductor portion.
Claim 28
Dependent Claim
25 words
A thin film transistor as defined in claim 26 wherein said part lies adjacent to, and in contact with, a metal layer of said transistor.
Claim 29
Dependent Claim
21 words
A thin film transistor as defined in claim 1, and a metal layer in contact with said semiconductor layer, comprising titanium.
Claim 30
Dependent Claim
23 words
A thin film transistor as defined in claim 1, and a metal layer in contact with said semiconductor layer, consisting essentially of titanium.
Claim 31
Dependent Claim
24 words
A thin film transistor as defined in any one of claims 1 through 29 wherein said semiconductor portion consists essentially of KP 15 .
Claim 32
Dependent Claim
17 words
A thin film transistor as defined in claim 1 wherein said film of MP x is amorphous.
Claim 33
Dependent Claim
46 words
An insulated semiconductor device comprising as the switched semiconductor portion thereof a layer of MP x , where M is at least one alkali metal, P is at least one pnictide, and x ranges substantially between 15 and infinity, and an insulating layer comprising a pnictide.
Claim 34
Dependent Claim
46 words
An insulated semiconductor device comprising as the switched semiconductor portion thereof a layer of MP x , where M is at least one alkali metal, P is at least one pnictide, and x ranges substantially between 15 and infinity, and an insulating layer comprising a pnictide.
Claim 35
Dependent Claim
14 words
A semiconductor device as defined in claim 32 wherein said insulating layer comprises nitrogen.
Claim 36
Dependent Claim
20 words
A semiconductor device as defined in claim 33 wherein said insulating layer comprises at least one other pnictide besides nitrogen.
Claim 37
Dependent Claim
18 words
A semiconductor device as defined in claim 33 wherein said insulating layer comprises P 3 N 5 .
Claim 38
Dependent Claim
20 words
A semiconductor device as defined in claim 33 wherein said insulating layer consists essentially of P 3 N 5 .
Claim 39
Dependent Claim
18 words
A semiconductor device as defined in any one of claims 32 through 36 wherein said pnictide is phosphorus.
Claim 40
Dependent Claim
12 words
A semiconductor device as defined in claim 37 wherein x is 15.
Claim 41
Dependent Claim
14 words
A semiconductor device as defined in claim 38 wherein said alkali metal is potassium.
Claim 42
Dependent Claim
14 words
A semiconductor device as defined in claim 39 wherein said semiconductor portion is amorphous.
Claim 43
Dependent Claim
19 words
A semiconductor device as defined in any one of claims 32 through 36 wherein said semiconductor portion is amorphous.