Patent US4558340A successfully refreshed from Google Patents.
← Back to Patent Explorer
US4558340A Expired / Lapsed US ⏱️ 0.0 years remaining

Thin film field effect transistors utilizing a polypnictide semiconductor

Assignee: Stauffer Chemical Co
•
Filing: 1984-06-11
•
Granted: 1985-12-10
•
Expires: 2004-06-11
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract Thin film field effect transistors utilize MP x as the active switched semiconductor where M is at least one alkali metal, P is at least one pnictide, and x ranges from 15 to infinity. Phosphorus is preferred as the dominant pnictide and potassium is preferred as the dominant alkali metal. The local order of the semiconductors may vary from an all parallel pentagonal tube-like structure to a layer-like puckered sheet structure. The all parallel pentagonal tube structure is preferred. Metal insulated semiconductor (MISFETS) and metal semiconductor (MESFETS) field effect transistors are disclosed. The semiconductor is preferably doped with up to approximately 1/2% nickel, iron, or chromium, to reduce the density of defect levels in the bandgap without increasing the conductivity. The semiconductors may be doped with 1/2-1% of the same metals to increase conductivity so as to provide normally ON devices. The regions of a semiconductor under the source and drain may be heavily doped with 2-3% of the same metals to provide good contact to the source and drain. Nickel is the preferred metal. The insulating layer may be SiO 2 , Al 2 O 3 , or Si 3 N 4 , but is preferably P 3 N 5 to provide chemical continuity to the polypnictide semiconductor.

Inventors

  • 👤 Rozalie Schachter
  • 👤 Marcello Viscogliosi
  • 👤 Lewis A. Bunz

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 22:13
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/67; H10D30/6704; H10D62/00; H10D62/80; H10D30/01; H10D30/021; H10D30/031; H10D30/6729; H10D30/6737; H10D30/6739; H10D30/6757; H10D30/80; H10D30/87; H10D30/875; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01332; H10D64/01336; H10D64/01342; H10K; H10K10/00; H10K10/40; H10K10/46; H10K10/462; H10K10/464; H10K10/466; H10P; H10P14/00; H10P14/20; H10P14/29; H10P14/2901; H10P14/2922; H10P14/34; H10P14/3402; H10P14/3438; H10P14/3441; H10P14/3446; H10D64/60; H10D64/66; H10D64/68; H10D64/691; H10D64/693; H10K71/00; H10K71/10; H10K71/16; H10K71/164; H10P14/60; H10P14/63; H10P14/6326; H10P14/6328; H10P14/6329; H10P14/6334; H10P14/6336; H10P14/69; H10P14/692; H10P14/6921; H10P14/69215; H10P14/6938; H10P14/6939; H10P14/69391; H10P14/694; H10P14/6943; H10P14/69433

Claims Analysis

Total Claims: 43
Claim 1
Independent Claim 39 words
A thin film transistor comprising, as a switched semiconductor portion thereof, a thin film of MP x where M is at least one alkali metal, P is at least one pnictide, and x ranges substantively between 15 and infinity.
Claim 2
Dependent Claim 39 words
A thin film transistor comprising, as a switched semiconductor portion thereof, a thin film of MP x where M is at least one alkali metal, P is at least one pnictide, and x ranges substantively between 15 and infinity.
Claim 3
Dependent Claim 15 words
A thin film transistor as defined in claim 1 wherein said transistor is a MESFET.
Claim 4
Dependent Claim 15 words
A thin film transistor as defined in claim 1 wherein said transistor is a MISFET.
Claim 5
Dependent Claim 25 words
A thin film transistor as defined in claim 1 and a thin film insulating layer in contact with said thin film of MP x .
Claim 6
Dependent Claim 19 words
A thin film transistor as defined in claim 4 wherein said insulating layer consists essentially of SiO 2 .
Claim 7
Dependent Claim 21 words
A thin film transistor as defined in claim 4 wherein said insulating layer consists essentially of Al 2 O 3 .
Claim 8
Dependent Claim 21 words
A thin film transistor as defined in claim 4 wherein said insulating layer consists essentially of Si 3 N 4 .
Claim 9
Dependent Claim 19 words
A thin film transistor as defined in claim 4 wherein said insulating layer comprises a compound containing a pnictide.
Claim 10
Dependent Claim 21 words
A thin film transistor as defined in claim 4 wherein said insulating layer consists essentially of a compound containing a pnictide.
Claim 11
Dependent Claim 26 words
A thin film transistor as defined in claim 4 wherein said insulating layer comprises at least one compound comprising nitrogen and at least one other pnictide.
Claim 12
Dependent Claim 30 words
A thin film transistor as defined in claim 4 wherein said insulating layer comprises P 3 N 5 , where N is nitrogen and P is at least one pnictide.
Claim 13
Dependent Claim 20 words
A thin film transistor as defined in claim 11 wherein said P in said P 3 N 5 comprise phosphorus.
Claim 14
Dependent Claim 22 words
A thin film transistor as defined in claim 11 wherein said P in said P 3 N 5 consist essentially of phosphorus.
Claim 15
Dependent Claim 31 words
A thin film transistor as defined in claim 4 wherein said insulating layer consists essentially of P 3 N 5 where N is nitrogen and P is at least one pnictide.
Claim 16
Dependent Claim 20 words
A thin film transistor as defined in claim 14 wherein said P in said P 3 N 5 comprises phosphorus.
Claim 17
Dependent Claim 22 words
A thin film transistor as defined in claim 14 wherein said P in said P 3 N 5 consists essentially of phosphorus.
Claim 18
Dependent Claim 31 words
A thin film transistor as defined in claim 1 wherein said semiconductor portion comprises a minor amount of a metal to reduce the density of defect levels in the band gap.
Claim 19
Dependent Claim 23 words
A thin film transistor as defined in claim 17 wherein said metal is chosen from the group consisting of iron, chromium, and nickel
Claim 20
Dependent Claim 25 words
A thin film transistor as defined in claim 17 wherein the presence of said metal does not substantially reduce the resistivity of said semiconductor portion.
Claim 21
Dependent Claim 24 words
A thin film transistor as defined in claim 19 wherein said metal comprises substantially less than 1/2% of the atoms of said semiconductor portion.
Claim 22
Dependent Claim 23 words
A thin film transistor as defined in claim 20 wherein said metal is chosen from the group consisting of iron, chromium, and nickel.
Claim 23
Dependent Claim 14 words
A thin film transistor as defined in claim 21 wherein said metal is nickel.
Claim 24
Dependent Claim 34 words
A thin film transistor as defined in claim 1 wherein said semiconductor portion comprises a minor amount of a metal to substantially increase the conductivity of at least a part of said semiconductor portion.
Claim 25
Dependent Claim 23 words
A thin film transistor as defined in claim 23 wherein said metal is chosen from the group consisting of iron, chromium, and nickel.
Claim 26
Dependent Claim 27 words
A thin film transistor as defined in claim 23 wherein said metal comprises substantially more than 1/2% of the atoms of said part of said semiconductor portion.
Claim 27
Dependent Claim 27 words
A thin film transistor as defined in claim 25 wherein said metal comprises substantially more than 1% of the atoms of said part of said semiconductor portion.
Claim 28
Dependent Claim 25 words
A thin film transistor as defined in claim 26 wherein said part lies adjacent to, and in contact with, a metal layer of said transistor.
Claim 29
Dependent Claim 21 words
A thin film transistor as defined in claim 1, and a metal layer in contact with said semiconductor layer, comprising titanium.
Claim 30
Dependent Claim 23 words
A thin film transistor as defined in claim 1, and a metal layer in contact with said semiconductor layer, consisting essentially of titanium.
Claim 31
Dependent Claim 24 words
A thin film transistor as defined in any one of claims 1 through 29 wherein said semiconductor portion consists essentially of KP 15 .
Claim 32
Dependent Claim 17 words
A thin film transistor as defined in claim 1 wherein said film of MP x is amorphous.
Claim 33
Dependent Claim 46 words
An insulated semiconductor device comprising as the switched semiconductor portion thereof a layer of MP x , where M is at least one alkali metal, P is at least one pnictide, and x ranges substantially between 15 and infinity, and an insulating layer comprising a pnictide.
Claim 34
Dependent Claim 46 words
An insulated semiconductor device comprising as the switched semiconductor portion thereof a layer of MP x , where M is at least one alkali metal, P is at least one pnictide, and x ranges substantially between 15 and infinity, and an insulating layer comprising a pnictide.
Claim 35
Dependent Claim 14 words
A semiconductor device as defined in claim 32 wherein said insulating layer comprises nitrogen.
Claim 36
Dependent Claim 20 words
A semiconductor device as defined in claim 33 wherein said insulating layer comprises at least one other pnictide besides nitrogen.
Claim 37
Dependent Claim 18 words
A semiconductor device as defined in claim 33 wherein said insulating layer comprises P 3 N 5 .
Claim 38
Dependent Claim 20 words
A semiconductor device as defined in claim 33 wherein said insulating layer consists essentially of P 3 N 5 .
Claim 39
Dependent Claim 18 words
A semiconductor device as defined in any one of claims 32 through 36 wherein said pnictide is phosphorus.
Claim 40
Dependent Claim 12 words
A semiconductor device as defined in claim 37 wherein x is 15.
Claim 41
Dependent Claim 14 words
A semiconductor device as defined in claim 38 wherein said alkali metal is potassium.
Claim 42
Dependent Claim 14 words
A semiconductor device as defined in claim 39 wherein said semiconductor portion is amorphous.
Claim 43
Dependent Claim 19 words
A semiconductor device as defined in any one of claims 32 through 36 wherein said semiconductor portion is amorphous.

References Cited (Backward Citations)

US4508931A Cited
US4509066A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-12-09 1989-06-10 1989-12-10 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-12-09 1993-06-10 1993-12-10 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-12-09 1997-06-10 1997-12-10 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag