Patent US4556582A successfully refreshed from Google Patents.
US4556582A
Expired / Lapsed
US
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Method of fabricating magnetic bubble memory device
Assignee: Hitachi Ltd
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Filing: 1982-05-05
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Granted: 1985-12-03
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Expires: 2002-05-05
Abstract
Abstract A method of fabricating a magnetic bubble memory device is disclosed in which ions are implanted in a desired portion of a surface region in a magnetic bubble film for magnetic bubbles to form a strain layer having a strain of about 1% to about 2.5%, a film is provided on the magnetic bubble film so as to cover the magnetic bubble film with the film and then the magnetic bubble film is annealed under predetermined conditions, thereby providing a practical magnetic bubble memory device having a large bias margin.
Inventors
- 👤 Ryo Imura
- 👤 Tadashi Ikeda
- 👤 Teruaki Takeuchi
- 👤 Hiroshi Umezaki
- 👤 Ryo Suzuki
- 👤 Yutaka Sugita
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 01:09
CPC Classifications
H; H01; H01F; H01F41/00; H01F41/14; G; G11; G11C; G11C19/00; G11C19/02; G11C19/08; H01F10/00; H01F10/08; H01F10/10; H01F10/18; H01F10/20; H01F10/24; H01F41/32; H01F41/34
Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
201 words
In a method of fabricating a magnetic bubble memory device comprising the steps of implanting ions in a desired portion of a surface region in a magnetic bubble film for magnetic bubbles and annealing said magnetic bubble film, the improvement comprising: (a) said implanting ions in a desired portion of a surface region being performed to form a strain layer having a strain of about 1% to about 2.5%; (b) providing a film on said magnetic bubble film after the ion implanting step to cover said magnetic bubble film with said film; and (c) said annealing said magnetic bubble film being performed after providing the film on the magnetic bubble film, and is performed at a temperature for a time, said annealing temperature and said annealing time being indicated by a point within a region shown in FIG. 8, whereby, by implanting ions to form a strain layer having a strain of about 1% to about 2.5% and by annealing said magnetic bubble film at an annealing temperature and time within a region A shown in FIG. 8, reduction in propagation margin due to annealing is low and a device having a propagation margin of 7% or more can be provided.
Claim 2
Dependent Claim
201 words
In a method of fabricating a magnetic bubble memory device comprising the steps of implanting ions in a desired portion of a surface region in a magnetic bubble film for magnetic bubbles and annealing said magnetic bubble film, the improvement comprising: (a) said implanting ions in a desired portion of a surface region being performed to form a strain layer having a strain of about 1% to about 2.5%; (b) providing a film on said magnetic bubble film after the ion implanting step to cover said magnetic bubble film with said film; and (c) said annealing said magnetic bubble film being performed after providing the film on the magnetic bubble film, and is performed at a temperature for a time, said annealing temperature and said annealing time being indicated by a point within a region shown in FIG. 8, whereby, by implanting ions to form a strain layer having a strain of about 1% to about 2.5% and by annealing said magnetic bubble film at an annealing temperature and time within a region A shown in FIG. 8, reduction in propagation margin due to annealing is low and a device having a propagation margin of 7% or more can be provided.
Claim 3
Dependent Claim
12 words
A method according to claim 1, wherein said ions are hydrogen ions.
Claim 4
Dependent Claim
37 words
A method according to claim 2, wherein hydrogen ions having an implantation energy of 15 to 400 KeV are implanted in said desired portion with an ion dose of 2×10 16 to 1×10 17 cm -2 .
Claim 5
Dependent Claim
31 words
A method according to claim 1, wherein said ions implanted in said implanting step are hydrogen ions and ions of at least one element having atomic number of 1 to 10.
Claim 6
Dependent Claim
44 words
A method according to claim 2, 3 or 4, wherein said film is made of at least one selected from a group consisting of SiO 2 , Si 3 N 4 , Al 2 O 3 , polycrystalline silicon, aluminum, molybdenum, chromium and nickel.
Claim 7
Dependent Claim
42 words
A method according to claim 1 or 4 wherein said film is selected from an SiO 2 film, an Si 3 N 4 film and an Al 2 O 3 film, each of which has a thickness of 0.005 to 1.0 μm.
Claim 8
Dependent Claim
32 words
A method according to claim 1 or 4 wherein the thickness of said strain layer lies in a range from about one-fifth to about one-half the thickness of said magnetic bubble film.
Claim 9
Dependent Claim
27 words
A method according to claim 4, wherein said ions are ions of hydrogen and of at least one other element having atomic number of 2 to 10.
Claim 10
Dependent Claim
15 words
A method according to claim 5, wherein said implanting step includes three ion implantation substeps.
Claim 11
Dependent Claim
38 words
A method according to claim 9, wherein the three ion implantation substeps include a first implantation of Ne + ions, a second ion implantation of Ne + ions, and a third ion implantation of H 2 + ions.
Claim 12
Dependent Claim
31 words
A method according to claim 9, wherein said ions implanted in the three ion implantation substeps are hydrogen and at least one other element having atomic number of 2 to 10.
Claim 13
Dependent Claim
35 words
A method according to claim 2, 4, 8 or 11, wherein said hydrogen ions are selected from the group consisting of H + , H 2 + , D 2 + and D + .
Claim 14
Dependent Claim
22 words
A method according to claim 7, wherein the magnetic bubble film has a thickness of about 0.3 μm to about 2.5 μm.
Claim 15
Dependent Claim
39 words
A method according to claim 4, wherein said film is selected from SiO 2 film, an Si 3 N 4 film and an Al 2 O 3 film, each of which has a thickness of 0.005 to 1.0 μm.
References Cited (Backward Citations)
US4247781A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1988-12-02 | 1989-06-03 | 1989-12-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-12-02 | 1993-06-03 | 1993-12-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-12-02 | 1997-06-03 | 1997-12-03 | $7700.00 | Window Closed / Lapsed |