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Method of manufacturing a semiconductor device by means of a molecular beam technique

Assignee: JONG TIM DE
•
Filing: 1984-03-02
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Granted: 1985-11-19
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Expires: 2004-03-02
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Abstract

Abstract A monocrystalline layer of one semiconductor material is grown onto a surface of a monocrystalline semiconductor body by means of molecular beam epitaxy. During such growth, the semiconductor body is kept at such a low temperature that a non-monocrystalline layer is obtained. The non-monocrystalline layer is then converted by a heat treatment into a monocrystalline form. Accordingly, an abrupt junction between the two semiconductor materials is obtained.

Inventors

  • 👤 Jan Haisma
  • 👤 Poul K. Larsen
  • 👤 Tim De Jong
  • 👤 Johannes F. Van der Veen
  • 👤 Willem A. S. Douma
  • 👤 Frans W. Saris

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 20:46
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/32; H10P14/3202; H10P14/3214; H10P14/3218; H10P14/22; H10P14/29; H10P14/2901; H10P14/2907; H10P14/2909; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/36; H10P14/3602; Y; Y10; Y10S; Y10S148/00; Y10S148/003; Y10S148/007; Y10S148/025; Y10S148/123; Y10S148/169

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 108 words
A method of manufacturing a semiconductor device comprising the steps of providing a first monocrystalline semiconductor layer of a first material having a surface region, forming a second semiconductor layer of a second material onto said surface region of said first layer by a molecular beam particle deposition technique, said second layer being formed at a first temperature providing a non-monocrystalline semiconductor layer, said molecular beam particle deposition technique forming a particle beam of at least one of atoms and molecules of said second semiconductor layer, and thereafter heating said non-monocrystalline semiconductor layer to a second temperature for converting said non-monocrystalline semiconductor layer into a monocrystalline semiconductor layer.
Claim 2
Independent Claim 108 words
A method of manufacturing a semiconductor device comprising the steps of providing a first monocrystalline semiconductor layer of a first material having a surface region, forming a second semiconductor layer of a second material onto said surface region of said first layer by a molecular beam particle deposition technique, said second layer being formed at a first temperature providing a non-monocrystalline semiconductor layer, said molecular beam particle deposition technique forming a particle beam of at least one of atoms and molecules of said second semiconductor layer, and thereafter heating said non-monocrystalline semiconductor layer to a second temperature for converting said non-monocrystalline semiconductor layer into a monocrystalline semiconductor layer.
Claim 3
Dependent Claim 41 words
A method according to claim 1, wherein said first semiconductor layer is a material of group III-V of the periodic system of elements, and wherein said second semiconductor layer is a material of group IV of the periodic system of elements.
Claim 4
Dependent Claim 21 words
A method according to claim 2, wherein said first semiconductor layer is gallium phosphide and said second semiconductor layer is silicon.
Claim 5
Dependent Claim 36 words
A method according to claim 3, wherein during deposition of said second layer, said first temperature is maintained below 100° C., and wherein said second temperature is provided within a range between 450° to 650° C.

References Cited (Backward Citations)

GB1270550A Cited
US3988172A Cited
US4039357A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-11-18 1989-05-20 1989-11-19 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-11-18 1993-05-20 1993-11-19 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-11-18 1997-05-20 1997-11-19 $7700.00 Window Closed / Lapsed

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