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US4535220A Expired / Lapsed US ⏱️ 0.0 years remaining

Integrated circuits

Assignee: UK Secretary of State for Defence
•
Filing: 1982-09-30
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Granted: 1985-08-13
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Expires: 2002-09-30
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Abstract

Abstract An integrated circuit comprises a substrate having a plurality of components electrically isolated by regions of amorphous material formed by laser irradiation. Typically the laser radiation has a wavelength less than 400 nm a pulse length between 0.1 and 10 μsec, and a power density between 0.1 and 0.8 J/cm 2 . The substrate material may be Si, Ge, GaAs, GaAlAs, InAs, InP, InAlP.

Inventors

  • 👤 Anthony G. Cullis
  • 👤 Hugh C. Webber
  • 👤 Nigel G. Chew

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-06 16:09
CPC Classifications
H; H10; H10P; H10P34/00; H10P34/40; H10P34/42; H10W; H10W10/00; H10W10/01

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 97 words
A method of providing electrical separation between electrical components on a single crystalline silicon substrate, the method comprising the steps of forming amorphous regions in the crystalline silicon substrate by selectively irradiating the silicon substrate with laser radiation of a wavelength less than 400 nanometers and a pulse length less than 10 nanoseconds so that most of the radiation is absorbed in the top 3,000 Å of the irradiated regions of the substrate which rapidly melts and rapidly freezes into an amorphous state, the amorphous regions forming electrically insulating regions adjacent single crystalline silicon regions of substrate.
Claim 2
Independent Claim 97 words
A method of providing electrical separation between electrical components on a single crystalline silicon substrate, the method comprising the steps of forming amorphous regions in the crystalline silicon substrate by selectively irradiating the silicon substrate with laser radiation of a wavelength less than 400 nanometers and a pulse length less than 10 nanoseconds so that most of the radiation is absorbed in the top 3,000 Å of the irradiated regions of the substrate which rapidly melts and rapidly freezes into an amorphous state, the amorphous regions forming electrically insulating regions adjacent single crystalline silicon regions of substrate.
Claim 3
Dependent Claim 15 words
The method of claim 1 wherein the pulse length is between 0.1 and 10 nanoseconds.
Claim 4
Dependent Claim 21 words
The method of claim 1 wherein the energy density of radiation is in the range 0.1 to 0.8 J/cm 2 .

References Cited (Backward Citations)

US3615317A Cited
GB1410896A Cited
GB1520595A Cited
US4058699A Cited
US4240843A Cited
GB2044980A Cited
US4370175A Cited
US4338616A Cited
US4322253A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-08-12 1989-02-11 1989-08-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-08-12 1993-02-11 1993-08-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-08-12 1997-02-11 1997-08-13 $7700.00 Window Closed / Lapsed

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