Coincidence correction in particle analysis system

Claim 2

Apparatus for correcting coincidence error occurring in parametric data obtained from a particle analysis system producing parametric data from particles, the correction being effected substantially at the time that the coincidence error occurs in a parametric datum of said data, the parametric datum representing at least one particle analysis parameter and the error being introduced into the datum at the time of measurement and resulting from coincidence of at least two particles in the length of a measurement aperture as said particles pass through the aperture, the apparatus comprising: A. measurement means producing said parametric datum in response to a measurement made through the lenth of said aperture as at least one particle passes through the length of the aperture, said measurement means being incapable of distinguishing between coincidence and non-coincidence of particles in the aperture; B. detection means producing a detection signal in response to sensing the presence of an individual particle in said aperture, the detection means sensing the presence of individual particles other than through the length of said aperture; and C. correction means for modulating said parametric datum in response to said detection signal after the production of said parametric datum and said detection signal to obtain corrected parametric data free of said coincidence error.

Claim 3

Apparatus for correcting coincidence error occurring in parametric data obtained from a particle analysis system producing parametric data from particles, the system including measurement means producing a parametric datum of said parametric data in response to a measurement made through the length of an aperture as at least one particle passes through the length of the aperture, said measurement means being incapable of distinguishing between coincidence and non-coincidence of particles in the aperture, the correction being effected substantially at the time that the coincidence error occurs in a parametric datum of said data, the parametric datum representing at least one particle analysis parameter and the error being introduced into the datum at the time of measurement and resulting from coincidence of at least two particles in the length of said measurement aperture as said particles pass through the aperture, the apparatus comprising: A. detection means producing a detection signal in response to sensing the presence of an individual particle in said aperture, the detection means sensing the presence of individual particles other than through the length of said aperture; and B. correction means for modulating said parametric datum in response to said detection signal after the production of said parametric datum and said detection signal to obtain corrected parametric data free of said coincidence error.

Claim 4

Apparatus for correcting coincidence error occurring in parametric data obtained from a particle analysis system producing parametric data from particles, the system including measurement means producing a parametric datum of said parametric data in response to a measurement made through the length of an aperture as at least one particle passes through the length of the aperture, said measurement means being incapable of distinguishing between coincidence and non-coincidence of particles in the aperture, the correction being effected substantially at the time that the coincidence error occurs in a parametric datum of said data, the parametric datum representing at least one particle analysis parameter and the error being introduced into the datum at the time of measurement and resulting from coincidence of at least two particles in the length of said measurement aperture as said particles pass through the aperture, the apparatus comprising: A. detection means producing a detection signal in response to sensing the presence of an individual particle in said aperture, the detection means sensing the presence of individual particles other than through the length of said aperture; and B. correction means for modulating said parametric datum in response to said detection signal after the production of said parametric datum and said detection signal to obtain corrected parametric data free of said coincidence error.

Claim 6

The apparatus as claimed in claim 3 in which said beam is flat and further is dimensioned so that all of said particles passing through said aperture must pass through said flat beam.

Claim 7

The apparatus as claimed in claim 4 in which said aperture has a certain width, said particles have at least about one diameter and said flat beam has a height in said first direction of about said at least about one diameter and a width equal to about said certain width.

Claim 8

The apparatus as claimed in claim 3 in which said detection means include optical sensor means receiving the radiant energy from said beam of radiant energy passing through said aperture, said optical sensor means for producing said detection signal in response to a change in the distribution of radiant energy so received effected by said particles passing through said beam of radiant energy.

Claim 9

The apparatus as claimed in claim 6 in which said particles passing through said beam effect a first order beam comprising radiant energy dispersed from said beam and a zero order beam comprising the remainder of the radiant energy of said beam, and said optical sensor means include a beam stop receiving substantially all of said zero order beam and a face receiving substantially all of said first order beam.

Claim 10

The apparatus as claimed in claim 6 in which said detection signal includes pulses produced in response to particles passing through said beam of radiant energy.

Claim 12

The apparatus as claimed in claim 9 in which said detection signal includes pulses representing individual sensed particles, and said correction circuit means include sense and hold means for sensing and holding the value of each parametric datum, and counting means for counting the number of detection signal pulses occurring during each parametric datum, said gating means for gating each parametric datum from said sense and hold means in response to the number of detection signal pulses which are counted by said counting means during the production of that parametric datum.

Claim 13

The apparatus as claimed in claim 10 in which said gating means pass each parametric datum from said sense and hold means in response to one detection signal pulse being counted during the production of that parametric datum.

Claim 18

The method as claimed in claim 12 or 13 in which said particles pass through said aperture in a first direction axial of said aperture and detecting said particles includes passing a beam of radiant energy through said aperture transverse to said first direction.

Claim 19

The method as claimed in claim 14 in which passing a beam of radiant energy through said aperture includes dimensioning said beam to be flat and so that all of said particles passing through said aperture must pass through said beam.

Claim 20

The method as claimed in claim 15 in which said aperture has a certain width, said particles have at least about one diameter and dimensioning said beam includes providing it with a height in said first direction of about said at least about one diameter and a width equal to about said certain width.

Claim 21

The method as claimed in claim 14 in which detecting said particles includes optically sensing the radiant energy received from said beam of radiant energy passing through said aperture, said optically sensing includes producing said detection signal in response to a change in the distribution of radiant energy so received effected by said particles passing through said beam of radiant energy.

Claim 22

The method as claimed in claim 17 in which said particles passing through said beam effects a first order beam comprising radiant energy dispersed from said beam and a zero order beam comprising the remainder of the radiant energy of said beam, and said optically sensing includes providing a beam stop receiving substantially all of said zero order beam and a face receiving substantially all of said first order beam.

Claim 23

The method as claimed in claim 17 in which producing said detection signal includes producing pulses in response to particles passing through said beam of radiant energy.

Claim 25

The method as claimed in claim 20 in which said detection signal includes pulses representing individual sensed particles, and said modulating said parametric data includes sensing and holding the value of each parametric datum, and counting the number of detection signal pulses occurring during the production of each parametric datum, said gating including gating each sensed and held parametric datum in response to the number of detection signal pulses which are counted during the production of that parametric datum.

Claim 26

The apparatus as claimed in claim 10 in which said gating means pass each parametric datum from said sense and hold means in response to said counting means counting one detection signal pulse during the production of that parametric datum.

Claim 27

Apparatus for correcting coincidence errors occurring in parametric data representing at least one particle analysis parameter of a plurality of particles, and obtained from a particle analysis system, the errors being effected by coincidence of the particles in an aperture as said particles pass through the length thereof, the apparatus comprising: A. measurement means for producing said parametric data in response to measurements taken through the length of said aperture as particles pass therethrough, there being one parametric datum produced for at least one particle passing through said aperture; B. detection means producing a detection signal in response to the detection, other than through the length of said aperture, of the presence of individual particles in said aperture; and C. correction circuit means for modulating said parametric data in response to said detection signals, said correction circuit means including gating means for gating each datum of said parametric data in response to said detection signal to pass a corrected parametric datum free of said coincidence errors.

Claim 28

Apparatus for correcting coincidence errors occurring in parametric data representing at least one particle analysis parameter of a plurality of particles, and obtained from a particle analysis system, the errors being effected by coincidence of the particles in an aperture as said particles pass through the length thereof, the apparatus comprising: A. measurement means for producing said parametric data in response to measurements taken through the length of said aperture as particles pass therethrough, there being one parametric datum produced for at least one particle passing through said aperture; B. detection means producing a detection signal in response to the detection, other than through the length of said aperture, of the presence of individual particles in said aperture; and C. correction circuit means for modulating said parametric data in response to said detection signals, said correction circuit means including gating means for gating each datum of said parametric data in response to said detection signal to pass a corrected parametric datum free of said coincidence errors.

Claim 29

Apparatus for correcting coincidence errors occurring in parametric data representing at least one particle analysis parameter of a plurality of particles, and obtained from a measurement means of a particle analysis system, the measurement means producing said parametric data in response to measurements taken through the length of an aperture as the particles pass therethrough, the errors being effected by coincidence of particles in the aperture as said particles pass through the length thereof, the apparatus comprising: A. detection means producing a detection signal in response to the detection, other than through the length of said aperture, of the presence of individual particles in said aperture; and B. correction circuit means for modulating said parametric data in response to said detection signals, said correction circuit means including gating means for gating each datum of said parametric data in response to said detection signal to pass a corrected parametric datum free of said coincidence errors.

Claim 30

Apparatus for correcting coincidence errors occurring in parametric data representing at least one particle analysis parameter of a plurality of particles, and obtained from a measurement means of a particle analysis system, the measurement means producing said parametric data in response to measurements taken through the length of an aperture as the particles pass therethrough, the errors being effected by coincidence of particles in the aperture as said particles pass through the length thereof, the apparatus comprising: A. detection means producing a detection signal in response to the detection, other than through the length of said aperture, of the presence of individual particles in said aperture; and B. correction circuit means for modulating said parametric data in response to said detection signals, said correction circuit means including gating means for gating each datum of said parametric data in response to said detection signal to pass a corrected parametric datum free of said coincidence errors.

Claim 36

The apparatus as claimed in claim 27 in which said gating means pass each parametric datum from said sense and hold means in response to one detection signal pulse being counted during the production of that parametric datum.