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US4502916A Expired / Lapsed US ⏱️ 0.0 years remaining

Process for forming fine patterns

Assignee: Hitachi Ltd
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Filing: 1984-05-03
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Granted: 1985-03-05
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Expires: 2004-05-03
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Abstract

Abstract Fine patterns are formed by a process wherein a workpiece is spin coated with a heat-resistant resin layer, this resin layer is spin coated with an organotitanium or titanium oxide layer, a resist pattern is formed on the organotitanium or titanium oxide layer, the organotitanium or titanium oxide layer is etched by ion etching with the resist pattern as a mask, and finally, the resin layer is etched by using the etched organotitanium or titanium oxide layer as a mask.

Inventors

  • 👤 Hiroshi Umezaki
  • 👤 Naoki Koyama
  • 👤 Yoozi Maruyama
  • 👤 Yutaka Sugita

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 23:52
CPC Classifications
H; H10; H10P; H10P50/00; G; G03; G03F; G03F7/00; G03F7/004; G03F7/09; G03F7/094

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 79 words
A process for forming fine patterns which comprises (a) forming a resin layer on a workpiece; (b) forming on said resin layer a layer of a titanium or tantalum compound; (c) forming on said titanium or tantalum compound layer a resist pattern having a desired configuration; and (d) etching said titanium or tantalum compound layer using said resist pattern as a mask, and (e) etching said resin layer using the resulting titanium or tantalum compound layer as a mask.
Claim 2
Dependent Claim 79 words
A process for forming fine patterns which comprises (a) forming a resin layer on a workpiece; (b) forming on said resin layer a layer of a titanium or tantalum compound; (c) forming on said titanium or tantalum compound layer a resist pattern having a desired configuration; and (d) etching said titanium or tantalum compound layer using said resist pattern as a mask, and (e) etching said resin layer using the resulting titanium or tantalum compound layer as a mask.
Claim 3
Dependent Claim 13 words
A process according to claim 1, wherein said titanium compound is an organotitanium.
Claim 4
Dependent Claim 13 words
A process according to claim 1, wherein said titanium compound is titanium oxide.
Claim 5
Dependent Claim 17 words
A process according to claim 1, wherein said resin layer is a layer of a heat-resistant resin.
Claim 6
Dependent Claim 12 words
A process according to claim 4, wherein the heat-resistant resin is polyimide.
Claim 7
Dependent Claim 28 words
A process according to claim 1, wherein the etching of said titanium or tantalum compound layer is conducted with an ion etching gas containing a CF 4 gas.
Claim 8
Dependent Claim 21 words
A process according to claim 1, wherein the etching of said resin layer is conducted by ion etch using oxygen gas.

References Cited (Backward Citations)

US4132586A Cited
US4288283A Cited
US4390394A Cited
US4362598A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-03-04 1988-09-03 1989-03-05 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-03-04 1992-09-03 1993-03-05 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-03-04 1996-09-03 1997-03-05 $7700.00 Window Closed / Lapsed

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