Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
295 words
A method for manufacturing a three-dimensional semiconductor device comprising the steps of: forming first and second semiconductor elements on the surface of a single-crystalline semiconductor substrate; forming a first insulating film on said substrate; forming a first opening in said first insulating film at a predetermined portion of said first semiconductor element; forming a first polycrystalline or amorphous semiconductor layer on said first insulating film having said first opening; irradiating said first semiconductor layer with an energy beam to grow a single crystal in a predetermined region in said first semiconductor layer using as a seed crystal that part of said semiconductor substrate which contacts said first semiconductor layer and to form a first single-crystalline semiconductor region; forming at least a part of a third semiconductor element in said first single-crystalline semiconductor region; forming an interconnection between said first and third semiconductor elements by using a part of said first single-crystalline semiconductor region from said semiconductor substrate to said third element; forming a second insulating film having a second opening at a predetermined portion of said second semiconductor element so as to elongate on said first single-crystalline semiconductor region; forming a second polycrystalline or amorphous semiconductor layer on said second insulating film having said second opening; irradiating said second semiconductor layer with an energy beam to grow a single crystal at a predetermined region in said second semiconductor layer using as a seed crystal that part of said semiconductor substrate which contacts with the second semiconductor layer and to form a second single-crystalline semiconductor region; and forming a remaining part of said third semiconductor element and forming an interconnection between said second and third semiconductor elements by using a part of said second single-crystalline semiconductor region from said semiconductor substrate to said third semiconductor element.
Claim 2
Independent Claim
295 words
A method for manufacturing a three-dimensional semiconductor device comprising the steps of: forming first and second semiconductor elements on the surface of a single-crystalline semiconductor substrate; forming a first insulating film on said substrate; forming a first opening in said first insulating film at a predetermined portion of said first semiconductor element; forming a first polycrystalline or amorphous semiconductor layer on said first insulating film having said first opening; irradiating said first semiconductor layer with an energy beam to grow a single crystal in a predetermined region in said first semiconductor layer using as a seed crystal that part of said semiconductor substrate which contacts said first semiconductor layer and to form a first single-crystalline semiconductor region; forming at least a part of a third semiconductor element in said first single-crystalline semiconductor region; forming an interconnection between said first and third semiconductor elements by using a part of said first single-crystalline semiconductor region from said semiconductor substrate to said third element; forming a second insulating film having a second opening at a predetermined portion of said second semiconductor element so as to elongate on said first single-crystalline semiconductor region; forming a second polycrystalline or amorphous semiconductor layer on said second insulating film having said second opening; irradiating said second semiconductor layer with an energy beam to grow a single crystal at a predetermined region in said second semiconductor layer using as a seed crystal that part of said semiconductor substrate which contacts with the second semiconductor layer and to form a second single-crystalline semiconductor region; and forming a remaining part of said third semiconductor element and forming an interconnection between said second and third semiconductor elements by using a part of said second single-crystalline semiconductor region from said semiconductor substrate to said third semiconductor element.
Claim 3
Dependent Claim
29 words
The method according to claim 1, further comprising the step of: selecting said energy beam from the group consisting of an electron beam, a laser beam and ion beam.
Claim 4
Dependent Claim
19 words
The method according to claim 1, further comprising the step of: selecting as said semiconductor element a MOS transistor.
Claim 5
Dependent Claim
18 words
The method according to claim 1, further comprising the step of: selecting as said semiconductor element a MOSFET.
Claim 6
Dependent Claim
38 words
The method according to claim 1, further comprising the step of: selecting said insulating film from the group consisting of an SiO 2 , an SiN, an Al 2 O 3 and an SiN-SiO 2 two layer structure.
Claim 7
Dependent Claim
25 words
The method according to claim 1, further comprising the step of: doping an impurity in said single-crystalline semiconductor region so as to form said interconnection.
Claim 8
Dependent Claim
35 words
The method according to claim 1, further comprising the step of: selecting as said third semiconductor element a MOS transistor, connecting a gate electrode to said first semiconductor element via said first single-crystalline semiconductor region.
Claim 9
Dependent Claim
35 words
The method according to claim 1, further comprising the step of: selecting as said third semiconductor element a MOS transistor; connecting a gate electrode to said second semiconductor element via said second single-crystalline semiconductor region.