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US4498226A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for manufacturing three-dimensional semiconductor device by sequential beam epitaxy

Assignee: Toshiba Corp
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Filing: 1982-08-27
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Granted: 1985-02-12
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Expires: 2002-08-27
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Abstract

Abstract A method for manufacturing a three-dimensional semiconductor device which is capable of preventing the stepwise disconnection of an interconnection layer and performing a high integration thereby and which comprises the steps of: forming a polycrystalline or amorphous semiconductor layer on an insulating film having an opening at a predetermined position of a first element covered on a single-crystalline semiconductor substrate having the first element; irradiating an energy beam to said semiconductor layer to grow a single crystal in a predetermined region in said semiconductor layer using as a seed crystal that part of the semiconductor substrate which contacts with semiconductor layer; and forming a second element on the grown single-crystalline semiconductor region and forming an interconnection between the first and second elements by using a part of the single-crystalline semiconductor region from said semiconductor substrate to said second element.

Inventors

  • 👤 Tomoyasu Inoue
  • 👤 Kenji Shibata

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 07:37
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/32; H10P14/3202; H10P14/3238; H10D; H10D30/00; H10D30/60; H10D30/67; H10D30/6704; H10D30/6713; H10D30/674; H10D30/6741; H10D30/6743; H10D30/6744; H10D84/00; H10D84/01; H10D84/02; H10D84/03; H10D84/038; H10D88/00; H10D88/01; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; H10P14/3451; H10P14/3452; H10P14/3458; H10P14/38; H10P14/3802; H10P14/3808; H10P14/3818; H10P14/382; H10W; H10W20/00; H10W20/01; H10W20/021; H10W20/40; H10W20/41; H10W20/435

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 295 words
A method for manufacturing a three-dimensional semiconductor device comprising the steps of: forming first and second semiconductor elements on the surface of a single-crystalline semiconductor substrate; forming a first insulating film on said substrate; forming a first opening in said first insulating film at a predetermined portion of said first semiconductor element; forming a first polycrystalline or amorphous semiconductor layer on said first insulating film having said first opening; irradiating said first semiconductor layer with an energy beam to grow a single crystal in a predetermined region in said first semiconductor layer using as a seed crystal that part of said semiconductor substrate which contacts said first semiconductor layer and to form a first single-crystalline semiconductor region; forming at least a part of a third semiconductor element in said first single-crystalline semiconductor region; forming an interconnection between said first and third semiconductor elements by using a part of said first single-crystalline semiconductor region from said semiconductor substrate to said third element; forming a second insulating film having a second opening at a predetermined portion of said second semiconductor element so as to elongate on said first single-crystalline semiconductor region; forming a second polycrystalline or amorphous semiconductor layer on said second insulating film having said second opening; irradiating said second semiconductor layer with an energy beam to grow a single crystal at a predetermined region in said second semiconductor layer using as a seed crystal that part of said semiconductor substrate which contacts with the second semiconductor layer and to form a second single-crystalline semiconductor region; and forming a remaining part of said third semiconductor element and forming an interconnection between said second and third semiconductor elements by using a part of said second single-crystalline semiconductor region from said semiconductor substrate to said third semiconductor element.
Claim 2
Independent Claim 295 words
A method for manufacturing a three-dimensional semiconductor device comprising the steps of: forming first and second semiconductor elements on the surface of a single-crystalline semiconductor substrate; forming a first insulating film on said substrate; forming a first opening in said first insulating film at a predetermined portion of said first semiconductor element; forming a first polycrystalline or amorphous semiconductor layer on said first insulating film having said first opening; irradiating said first semiconductor layer with an energy beam to grow a single crystal in a predetermined region in said first semiconductor layer using as a seed crystal that part of said semiconductor substrate which contacts said first semiconductor layer and to form a first single-crystalline semiconductor region; forming at least a part of a third semiconductor element in said first single-crystalline semiconductor region; forming an interconnection between said first and third semiconductor elements by using a part of said first single-crystalline semiconductor region from said semiconductor substrate to said third element; forming a second insulating film having a second opening at a predetermined portion of said second semiconductor element so as to elongate on said first single-crystalline semiconductor region; forming a second polycrystalline or amorphous semiconductor layer on said second insulating film having said second opening; irradiating said second semiconductor layer with an energy beam to grow a single crystal at a predetermined region in said second semiconductor layer using as a seed crystal that part of said semiconductor substrate which contacts with the second semiconductor layer and to form a second single-crystalline semiconductor region; and forming a remaining part of said third semiconductor element and forming an interconnection between said second and third semiconductor elements by using a part of said second single-crystalline semiconductor region from said semiconductor substrate to said third semiconductor element.
Claim 3
Dependent Claim 29 words
The method according to claim 1, further comprising the step of: selecting said energy beam from the group consisting of an electron beam, a laser beam and ion beam.
Claim 4
Dependent Claim 19 words
The method according to claim 1, further comprising the step of: selecting as said semiconductor element a MOS transistor.
Claim 5
Dependent Claim 18 words
The method according to claim 1, further comprising the step of: selecting as said semiconductor element a MOSFET.
Claim 6
Dependent Claim 38 words
The method according to claim 1, further comprising the step of: selecting said insulating film from the group consisting of an SiO 2 , an SiN, an Al 2 O 3 and an SiN-SiO 2 two layer structure.
Claim 7
Dependent Claim 25 words
The method according to claim 1, further comprising the step of: doping an impurity in said single-crystalline semiconductor region so as to form said interconnection.
Claim 8
Dependent Claim 35 words
The method according to claim 1, further comprising the step of: selecting as said third semiconductor element a MOS transistor, connecting a gate electrode to said first semiconductor element via said first single-crystalline semiconductor region.
Claim 9
Dependent Claim 35 words
The method according to claim 1, further comprising the step of: selecting as said third semiconductor element a MOS transistor; connecting a gate electrode to said second semiconductor element via said second single-crystalline semiconductor region.

References Cited (Backward Citations)

US4214918A Cited
US4377902A Cited
US4377421A Cited
US4269631A Cited
US4381201A Cited
US4377031A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-02-12 1988-08-13 1989-02-12 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-02-12 1992-08-13 1993-02-12 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-02-12 1996-08-13 1997-02-12 $7700.00 Window Closed / Lapsed

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