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US4494220A Expired / Lapsed US ⏱️ 0.0 years remaining

Folded bit line memory with one decoder per pair of spare rows

Assignee: Nokia Bell Labs
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Filing: 1982-11-24
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Granted: 1985-01-15
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Expires: 2002-11-24
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Abstract

Abstract A folded bit line configured DRAM, with standard even and odd rows of memory cells, also includes spare even and odd rows of memory cells which can be substituted for standard rows found to have defective cells or interconnections. Each of the decoders associated with a standard row includes provision for being disconnected if found to be associated with a defective row. One common spare decoder is associated with one spare even and one spare odd row of memory cells. Each spare decoder is designed normally to be deselected for any address but to be able to assume the address of any disconnected standard row. Disconnection of a standard decoder and substitution of a spare decoder with the appropriate even or odd row are made possible by appropriate inclusion of fusible links which are selectively opened by laser irradiation. The use of one spare decoder with both an even and odd row serves to reduce the number of needed spare decoders and thus reduces overall chip size.

Inventors

  • 👤 Austin C. Dumbri
  • 👤 Frank J. Procyk

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 14:24
CPC Classifications
G; G11; G11C; G11C29/00; G11C29/70; G11C29/78; G11C29/785; G11C29/787; G11C11/00; G11C11/21; G11C11/34; G11C29/838

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 176 words
A semiconductor memory comprising: an array of standard memory cells arranged in a folded bit line configuration of even and odd rows and columns and an array of spare memory cells arranged in a folded bit line configuration of rows; a single separate standard row decoder circuit being coupled to each even and to each odd row of standard memory cells, each standard decoder circuit including means for decoupling same from the associated row of standard memory cells; a single separate spare row decoder circuit being coupled to one even and to one odd row of spare memory cells, each spare decoder circuit includes first means for decoupling same from one or both of the associated rows of spare memory cells; and each spare row decoder circuit includes second means for providing same with the address of a standard row decoder circuit which has been decoupled from the associated row because of a defect of that row or of the memory cells associated therewith such that the spare row is effectively substituted for the standard row.
Claim 2
Dependent Claim 176 words
A semiconductor memory comprising: an array of standard memory cells arranged in a folded bit line configuration of even and odd rows and columns and an array of spare memory cells arranged in a folded bit line configuration of rows; a single separate standard row decoder circuit being coupled to each even and to each odd row of standard memory cells, each standard decoder circuit including means for decoupling same from the associated row of standard memory cells; a single separate spare row decoder circuit being coupled to one even and to one odd row of spare memory cells, each spare decoder circuit includes first means for decoupling same from one or both of the associated rows of spare memory cells; and each spare row decoder circuit includes second means for providing same with the address of a standard row decoder circuit which has been decoupled from the associated row because of a defect of that row or of the memory cells associated therewith such that the spare row is effectively substituted for the standard row.
Claim 3
Dependent Claim 20 words
The memory of claim 1 wherein the spare row decoder circuits are designed to be normally deselected for any address.
Claim 4
Dependent Claim 83 words
The memory of claim 2 where: the means included in each of the standard row decoder circuits is a fusible link which, when opened, disconnects the row decoder from the standard rows; the first means included in each of the spare row decoder circuits is a pair of fusible links which, when both are opened, disconnects the spare decoder from the spare rows, and with one open, leaves the spare row decoder circuit coupled to just an even or an odd spare row.
Claim 5
Dependent Claim 43 words
The memory of claim 3 wherein the second means included in each of the spare row decoders is a plurality of pairs of fusible links, said spare row decoders being given a desired address by the opening of a combination of such links.
Claim 6
Dependent Claim 29 words
The memory of claim 4 wherein each spare row decoder circuit includes a plurality of pairs of decoding transistors, each of which includes a fusible link in its circuit.
Claim 7
Dependent Claim 16 words
The memory of claim 5 wherein all the components thereof are formed on a single chip.

References Cited (Backward Citations)

US4228528A Cited
US4274013A Cited
US4228528B1 Cited
US4228528B2 Cited
US4351034A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-01-15 1988-07-16 1989-01-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-01-15 1992-07-16 1993-01-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-01-15 1996-07-16 1997-01-15 $7700.00 Window Closed / Lapsed

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