US4487652A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Slope etch of polyimide
Assignee: Motorola Solutions Inc
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Filing: 1984-03-30
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Granted: 1984-12-11
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Expires: 2004-03-30
Abstract
Abstract A sloped via through polyimide between metal layers is achieved by first sloping a hard mask which overlies the polyimide. Sloped photoresist overlying the hard mask transfers the slope to the hard mask. The sloped hard mask is used to slope the polyimide. Oxide underlying the polyimide is also etched to expose the metal. The underlying oxide layer can be subsequently slope etched.
Inventors
- 👤 Carl W. Almgren
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 09:35
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/28; H10P50/286; H10P50/287; G; G03; G03F; G03F7/00; G03F7/004; G03F7/09; G03F7/094; G03F7/26; G03F7/40; H10P50/73; H10W; H10W20/00; H10W20/01; H10W20/071; H10W20/081; H10W20/082
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
208 words
In a semiconductor having an insulating layer overlying a metal layer, wherein the insulator comprises an upper oxide layer, an intermediate polyimide layer, and a lower oxide layer in contact with the metal layer, a method for etching a via from an upper surface of the polyimide layer to the metal layer comprising the steps of: applying photoresist; etching an opening from an upper surface of the photoresist layer to the upper oxide layer at a location for forming the via so that an upper surface of the upper oxide layer is exposed at the via location; heating the photoresist to cause a more gradual slope of the photoresist layer from the upper surface of the upper oxide layer at the via location to the upper surface of the photoresist layer; applying reactive ion etchant with a predetermined selectivity between photoresist and oxide to transfer the slope of the photoresist layer to the upper oxide layer at a predetermined ratio; and applying a reactive ion etchant with a predetermined selectivity between oxide and polyimide to transfer the slope of the upper oxide layer to the polyimide layer at a predetermined ratio, whereby the lower oxide layer is simultaneously etched to expose the metal layer at the via location.
Claim 2
Dependent Claim
208 words
In a semiconductor having an insulating layer overlying a metal layer, wherein the insulator comprises an upper oxide layer, an intermediate polyimide layer, and a lower oxide layer in contact with the metal layer, a method for etching a via from an upper surface of the polyimide layer to the metal layer comprising the steps of: applying photoresist; etching an opening from an upper surface of the photoresist layer to the upper oxide layer at a location for forming the via so that an upper surface of the upper oxide layer is exposed at the via location; heating the photoresist to cause a more gradual slope of the photoresist layer from the upper surface of the upper oxide layer at the via location to the upper surface of the photoresist layer; applying reactive ion etchant with a predetermined selectivity between photoresist and oxide to transfer the slope of the photoresist layer to the upper oxide layer at a predetermined ratio; and applying a reactive ion etchant with a predetermined selectivity between oxide and polyimide to transfer the slope of the upper oxide layer to the polyimide layer at a predetermined ratio, whereby the lower oxide layer is simultaneously etched to expose the metal layer at the via location.
Claim 3
Dependent Claim
37 words
The method of claim 1 further comprising the step of: applying a reactive ion etchant which etches oxide at a much greater rate than polyimide to clear the exposed metal and polyimide surface of any residual oxide.
Claim 4
Dependent Claim
16 words
The method of claim 2 wherein all of the etchants are a plasma which contains oxygen.
Claim 5
Dependent Claim
34 words
The method of claim 3 further comprising the step of: applying a reactive ion etchant, after heating the photoresist, to etch the upper oxide layer at the via location through to the polyimide layer.
Claim 6
Dependent Claim
36 words
The method of claim 3 further comprising the step of: applying a reactive ion etchant, after transferring the slope of the photoresist layer to the upper oxide layer, to selectively etch the polyimide in via location.
Claim 7
Dependent Claim
19 words
The method of claim 5 wherein the selective etching of the polyimide is through to the lower oxide layer.
Claim 8
Dependent Claim
52 words
The method of claim 1 further comprising the step of: applying a reactive ion etchant, after transferring the slope of the upper oxide layer to the polyimide layer, with a predetermined selectivity between oxide and polyimide to transfer the slope of the polyimide to the lower oxide layer at a predetermined ratio.
Claim 9
Dependent Claim
111 words
In a semiconductor having a polyimide layer overlying a metal layer, a method for forming a via from an upper surface of the polyimide to the metal comprising the steps of: applying a hard mask layer to the upper surface of the polyimide layer; applying a photoresist layer over the hard mask layer; etching at the via location an opening in the photoresist layer from an upper surface of the photoresist layer to the upper oxide layer; applying an etchant to cause the hard mask to have a predetermined slope at the via location; and applying an etchant to cause the polyimide to have a predetermined slope at the via location.
Claim 10
Dependent Claim
111 words
In a semiconductor having a polyimide layer overlying a metal layer, a method for forming a via from an upper surface of the polyimide to the metal comprising the steps of: applying a hard mask layer to the upper surface of the polyimide layer; applying a photoresist layer over the hard mask layer; etching at the via location an opening in the photoresist layer from an upper surface of the photoresist layer to the upper oxide layer; applying an etchant to cause the hard mask to have a predetermined slope at the via location; and applying an etchant to cause the polyimide to have a predetermined slope at the via location.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-12-11 | 1988-06-11 | 1988-12-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-12-11 | 1992-06-11 | 1992-12-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-12-11 | 1996-06-11 | 1996-12-11 | $7700.00 | Window Closed / Lapsed |