Circuit for coupling signals to or from a circuit under test

Claim 2

A circuit for controlling signals between a signal source at a first terminal, a device test at a second terminal and a metering means at a third terminal where said device under test may be either a source of signals or a load, said circuit comprising: switch means having first and second switch conditions; means coupled to said switch means for coupling signals from said second terminal to said third terminal independent of the switch condition of said switch means, for in said first switch condition coupling signals from said source at said first terminal to said second and third terminals and for in said second switch condition isolating signals at said second and third terminals from signals at said first terminal.

Claim 3

A circuit for controlling signals between a signal source at a first terminal, a device under test at a second terminal and a metering means at a third terminal where said device under test may be either a source of signals or a load, said circuit comprising: switch means having first and second switch conditions; means coupled to said switch means for in said first switch condition coupling signals from said source at said first terminal to said second and third terminals and in said second switch condition for coupling signals at said second terminal to said third terminal in isolation from signals at said first terminal; said means for coupling including a first controllable current coupling device and a second controllable current coupling device having their controlled current paths connected in series between a bias potential source and a point at reference potential; and said switch means including means for controlling said second current coupling device in response to the signals at said first terminal in said first switch condition and for biasing said second current coupling device to cutoff in said second switch condition.

Claim 4

A circuit for controlling signals between a signal source at a first terminal, a device under test at a second terminal and a metering means at a third terminal where said device under test may be either a source of signals or a load, said circuit comprising: switch means having first and second switch conditions; means coupled to said switch means for in said first switch condition coupling signals from said source at said first terminal to said second and third terminals and in said second switch condition for coupling signals at said second terminal to said third terminal in isolation from signals at said first terminal; said means for coupling including a first controllable current coupling device and a second controllable current coupling device having their controlled current paths connected in series between a bias potential source and a point at reference potential; and said switch means including means for controlling said second current coupling device in response to the signals at said first terminal in said first switch condition and for biasing said second current coupling device to cutoff in said second switch condition.

Claim 5

The circuit recited in claim 2 wherein: said first and second current coupling devices are first and second transistors, respectively; and said switch means couples the signal from said signal source to said second transistor in said first switch condition.

Claim 6

The circuit recited in claim 3 wherein: said switch means includes a means for rendering said first transistor responsive to signals from said signal source in said first switch condition and for rendering said first transistor non-responsive to signals from said signal source in said second switch condition to isolate said first terminal from said second and third terminals in said second switch condition.

Claim 7

The circuit recited in claim 2 wherein: said coupling means includes a third current coupling device and an impedance device having their current paths connected in series between a second bias potential source and a second point at a reference potential, said third terminal coupled to the common junction of said third current coupling device and said impedance device, said third current coupling device including means for controlling its current conduction, said means for controlling being coupled to the common junction of said second terminal and said first and second current coupling devices for enabling said third current coupling device to couple signals from said common junction of said second terminal and said first and second current coupling devices to said third terminal.

Claim 8

The circuit recited in claim 5 wherein: said first and third current coupling devices are bipolar transistors of the same conductivity type for providing impedance transformation between said first and second terminals and between said second and third terminals, respectively.

Claim 9

The circuit recited in claim 6 wherein: said second current coupling device is a field effect transistor.

Claim 10

The circuit recited in claim 5 wherein: said first recited bias potential source is at the same potential as said second bias potential source; and said first recited point at a reference potential is at the same potential as said second point at a reference potential.