Apparatus and method for testing circuit boards

Claim 2

A testing apparatus for use with a testing machine in testing circuit boards having a certain number of contacts laid out in a pattern, the testing apparatus comprising a universal series of electrically conductive pads, said series of pads being on a substrate, said series of pads being laid out in matrix form, the density of said pads being far greater than the density of electrically interconnected contacts, there being spaces between said pads, an interchangeable pin board, means to hold said pin board in respect to said substrate and to orient said pin board in respect to said pads, said pin board having holes, said holes being laid out in the pattern of the certain number of electrically interconnected contacts, double ended electrically conductive pins, said pins being expandable and contractable in a longitudinal direction of said pins, one end of each of said pins capable of bridging said spaces between said pads, said pins being in said holes in said pin board with said one end of each of said pins contacting a pad of said series of pads, means to electrically connect the pads being contacted by said one end of said pins, the active pads, with the testing machine, and means to orient the pattern of the contacts on the circuit board having the certain number of electrically interconnected contacts in respect to the pattern of said pinned holes of said pin board such that each contact on the circuit board is able to be contacted by a pin, respectively, when the circuit board is in testing position.

Claim 9

A testing apparatus for use with a testing machine in testing electrical equipment having a plurality of electrically interconnected contacts, the testing apparatus comprising a universal series of electrically conductive pads, the density of said pads being different than the density of the electrically interconnected contacts, said pads being narrowly spaced, means to support said pads, means to orient the certain number of electrically interconnected contacts being tested with respect to said pads and means to electrically connect said contacts to said pads.

Claim 10

A testing apparatus for use with a testing machine in testing electrical equipment having a plurality of electrically interconnected contacts, the testing apparatus comprising a universal series of electrically conductive pads, the density of said pads being different than the density of the electrically interconnected contacts, said pads being narrowly spaced, means to support said pads, means to orient the certain number of electrically interconnected contacts being tested with respect to said pads and means to electrically connect said contacts to said pads.

Claim 11

The testing apparatus of claim 5 characterized in that the electrical connection to the testing machine is by means of digitally addressed gates.

Claim 12

In a testing apparatus for use in testing electrical equipment having a plurality of electrically interconnected contacts, the testing apparatus having a series of mechanically supported electrically conductive pads for connection to a testing machine and means to orient the plurality of electrically interconnected contacts with respect to such pads, the improvement comprising the series of mechanically supported electrically conductive pads being universal for use in testing differing electrical equipment, the density of the electrically conductive pads being different than the density of the electrically interconnected contacts, and means to urge the pads together with the contacts of the electrical equipment.

Claim 13

In a testing apparatus for use in testing electrical equipment having a plurality of electrically interconnected contacts, the testing apparatus having a series of mechanically supported electrically conductive pads for connection to a testing machine and means to orient the plurality of electrically interconnected contacts with respect to such pads, the improvement comprising the series of mechanically supported electrically conductive pads being universal for use in testing differing electrical equipment, the density of the electrically conductive pads being different than the density of the electrically interconnected contacts, and means to urge the pads together with the contacts of the electrical equipment.

Claim 14

In a testing apparatus for use in testing electrical equipment having a plurality of electrically interconnected contacts having a contact size and laid out in a pattern, such testing apparatus including a series of spaced electrically conductive pads for electrical connection to a testing machine, the improvement comprising the electrically conductive pads being universal and different in density than the electrically interconnected contacts, the spaces between the electrically conductive pads being smaller than the general contact size of the electrically interconnected contacts and means to move one of the electrically conductive pads or the electrically interconnected contacts into contacts with the other of the electrically conductive pads or the electrically interconnected contacts, the size of the spaces compensating for the difference in density between the electrically conductive pads and the electrically interconnected contacts.

Claim 15

In a testing apparatus for use in testing electrical equipment having a plurality of electrically interconnected contacts having a contact size and laid out in a pattern, such testing apparatus including a series of spaced electrically conductive pads for electrical connection to a testing machine, the improvement comprising the electrically conductive pads being universal and different in density than the electrically interconnected contacts, the spaces between the electrically conductive pads being smaller than the general contact size of the electrically interconnected contacts and means to move one of the electrically conductive pads or the electrically interconnected contacts into contacts with the other of the electrically conductive pads or the electrically interconnected contacts, the size of the spaces compensating for the difference in density between the electrically conductive pads and the electrically interconnected contacts.

Claim 16

In a testing apparatus for use in testing electrical equipment having a plurality of electrically interconnected contacts laid out in a pattern, such testing apparatus having a series of mechanically supported electrically conductive pads for electrical interconnection to a testing machine, an intermediate member located in respect to such series of conductive pads, electrically conductive pins carried by the intermediate member, the pins laid out in the pattern of plurality of electrically interconnected contacts, the pins electrically bridging the distance between the plurality of electrically interconnected contacts and the series of electrically conductive pads, the improvement comprising the electrically conductive pads for electrical connection to the testing machine being universal and different in density than the electrically connected contacts for use selectively with differing intermediate boards.

Claim 17

In a testing apparatus for use in testing electrical equipment having a plurality of electrically interconnected contacts laid out in a pattern, such testing apparatus having a series of mechanically supported electrically conductive pads for electrical interconnection to a testing machine, an intermediate member located in respect to such series of conductive pads, electrically conductive pins carried by the intermediate member, the pins laid out in the pattern of plurality of electrically interconnected contacts, the pins electrically bridging the distance between the plurality of electrically interconnected contacts and the series of electrically conductive pads, the improvement comprising the electrically conductive pads for electrical connection to the testing machine being universal and different in density than the electrically connected contacts for use selectively with differing intermediate boards.

Claim 18

In a testing apparatus for use in testing electrical equipment having a plurality of electrically interconnected contacts laid out in a pattern, such testing apparatus having a series of spaced mechanically supported electrically conductive pads for electrical connection to a testing machine, an intermediate member located in respect to such series of electrically conductive pads, and electrically conductive pins carried by the intermediate member, the pins laid out in the pattern of plurality of electrically interconnected contacts, each of the pins having an end for contact with the electrically conductive pads, such end of the pin having contact width, the pins electrically bridging the distance between the plurality of electrically interconnected contacts and the series of electrically conductive pads, the improvement comprising the electrically conductive pads for electrical connection to the testing machine being universal for use selectively with differing intermediate boards and the contact width of the ends of the pins being generally greater than the spaces between the electrically conductive pads whereby the ends of the pins are capable of electrically bridging the spaces between the pads.

Claim 19

In a testing apparatus for use in testing electrical equipment having a plurality of electrically interconnected contacts laid out in a pattern, such testing apparatus having a series of spaced mechanically supported electrically conductive pads for electrical connection to a testing machine, an intermediate member located in respect to such series of electrically conductive pads, and electrically conductive pins carried by the intermediate member, the pins laid out in the pattern of plurality of electrically interconnected contacts, each of the pins having an end for contact with the electrically conductive pads, such end of the pin having contact width, the pins electrically bridging the distance between the plurality of electrically interconnected contacts and the series of electrically conductive pads, the improvement comprising the electrically conductive pads for electrical connection to the testing machine being universal for use selectively with differing intermediate boards and the contact width of the ends of the pins being generally greater than the spaces between the electrically conductive pads whereby the ends of the pins are capable of electrically bridging the spaces between the pads.

Claim 20

In a testing apparatus for use in testing electrical equipment having a plurality of electrically interconnected contacts laid out in a pattern, such testing apparatus having a series of mechanically supported electrically conductive pads for electrical interconnection to a testing machine, adjacent pads being effectively spaced by a distance, an intermediate member located in respect to such series of conductive pads, electrically conductive pins carried by the intermediate member, the pins laid out in the pattern of the plurality of electrically interconnected contacts to be tested, the pins electrically bridging the distance between the plurality of electrically interconnected contacts and the series of electrically conductive pads, each of the pins having an end for contact with the electrically conductive pads, such end having a contact width, the improvement comprising the series of mechanically supported electrically conductive pads being universal for use selectively with differing intermediate members, the density of electrically conductive pads for electrical connection to the testing machine being different than the density of electrically connected contacts and the contact width of the of the pins being generally greater than the distance between adjacent electrically conductive pads, whereby the ends of the pins are capable of bridging the spaces between the pads and thus do not have to be in alignment with the electrically conductive pads in order for there to be guaranteed electrical connections between the certain number of electrically interconnected contacts and the testing machine.

Claim 21

In a testing apparatus for use in testing electrical equipment having a plurality of electrically interconnected contacts laid out in a pattern, such testing apparatus having a series of mechanically supported electrically conductive pads for electrical interconnection to a testing machine, adjacent pads being effectively spaced by a distance, an intermediate member located in respect to such series of conductive pads, electrically conductive pins carried by the intermediate member, the pins laid out in the pattern of the plurality of electrically interconnected contacts to be tested, the pins electrically bridging the distance between the plurality of electrically interconnected contacts and the series of electrically conductive pads, each of the pins having an end for contact with the electrically conductive pads, such end having a contact width, the improvement comprising the series of mechanically supported electrically conductive pads being universal for use selectively with differing intermediate members, the density of electrically conductive pads for electrical connection to the testing machine being different than the density of electrically connected contacts and the contact width of the of the pins being generally greater than the distance between adjacent electrically conductive pads, whereby the ends of the pins are capable of bridging the spaces between the pads and thus do not have to be in alignment with the electrically conductive pads in order for there to be guaranteed electrical connections between the certain number of electrically interconnected contacts and the testing machine.

Claim 22

In a testing apparatus for use in testing electrical equipment having a plurality of electrically interconnected contacts laid out in a pattern, such testing apparatus having a series of mechanically supported electrically conductive pads for electrical connection to a testing machine, adjacent pads being effectively spaced by a distance, an intermediate member located in respect to such series of electrically conductive pads, the intermediate member having holes laid out in the pattern of the plurality of electrically interconnected contacts to be tested, and electrically conductive pins in the holes in the intermediate member, the pins electrically bridging the distance between the plurality of electrically interconnected contacts and the series of electrically conductive pads, each of the pins having an end for contact with the electrically conductive pads, such end having a contact width, the pins extending substantially perpendicularly to both the electrically interconnected contacts and the electrically conductive pads, the improvement comprising the electrically conductive pads being universal for use selectively with differing intermediate members, the density of electrically conductive pads being different than the density of electrically interconnected contacts, the electrically conductive pads being laid out substantially in a systematic pattern, and the contact width of the end of each of the electrically conductive pins being generally greater than the distance between adjacent electrically conductive pads, the relationship between the contact width of the ends of the electrically conductive pins and the distance between the adjacent electrically conductive pads allowing the pins to bridge over such spaces if appropriate and thus allowing for use of universal electrically conductive pads with guaranteed electrical connection to the testing apparatus and without substantial regard for the difference between the number or the pattern of electrically interconnected contacts and the electrically conductive pads.

Claim 23

In a testing apparatus for use in testing electrical equipment having a plurality of electrically interconnected contacts laid out in a pattern, such testing apparatus having a series of mechanically supported electrically conductive pads for electrical connection to a testing machine, adjacent pads being effectively spaced by a distance, an intermediate member located in respect to such series of electrically conductive pads, the intermediate member having holes laid out in the pattern of the plurality of electrically interconnected contacts to be tested, and electrically conductive pins in the holes in the intermediate member, the pins electrically bridging the distance between the plurality of electrically interconnected contacts and the series of electrically conductive pads, each of the pins having an end for contact with the electrically conductive pads, such end having a contact width, the pins extending substantially perpendicularly to both the electrically interconnected contacts and the electrically conductive pads, the improvement comprising the electrically conductive pads being universal for use selectively with differing intermediate members, the density of electrically conductive pads being different than the density of electrically interconnected contacts, the electrically conductive pads being laid out substantially in a systematic pattern, and the contact width of the end of each of the electrically conductive pins being generally greater than the distance between adjacent electrically conductive pads, the relationship between the contact width of the ends of the electrically conductive pins and the distance between the adjacent electrically conductive pads allowing the pins to bridge over such spaces if appropriate and thus allowing for use of universal electrically conductive pads with guaranteed electrical connection to the testing apparatus and without substantial regard for the difference between the number or the pattern of electrically interconnected contacts and the electrically conductive pads.

Claim 26

The testing apparatus of claim 1 wherein the circuit boards have orientation holes utilized during the manufacturing process of such boards and characterized in that said means to orient the pattern of contacts on the circuit board in respect to said pattern of said pinned holes of the pin board utilizes the orientation holes of the circuit boards.

Claim 27

The testing apparatus of claim 7 characterized by the addition of means to electrically scan substantially only the pads in contact with the contacts of the electrical equipment.

Claim 28

The testing apparatus of claim 7 characterized by the addition of a series of multi-stage chips, said multistage chips connecting the electrically conductive pads to the testing machine.

Claim 29

The testing apparatus of claim 7 wherein the electrical equipment having a plurality of contacts has orientation holes used during the manufacturing process of such equipment and characterized in that the means to orient the plurality of contacts with respect to the pads utilizes the manufacturing orientation holes.

Claim 30

The testing apparatus of claim 9 characterized by the addition of means to electrically scan substantially only the electrically conductive pads in contact with the electrically conductive pins, the active pads.

Claim 31

The testing apparatus of claim 9 wherein the electrical equipment having contacts laid out in a pattern has orientation holes used in the manufacturing process of such equipment and characterized in that these orientation holes are utilized to align the electrically conductive contacts with the electrically conductive pins.

Claim 32

The testing apparatus of claim 11 wherein the electrical equipment having contacts laid out in a pattern has orientation holes used in the manufacturing process of such equipment and characterized in that these orientation holes are utilized to align the electrically conductive contacts with the electrically conductive pins.

Claim 33

The testing apparatus of claim 11 characterized by the addition of means to electrically scan substantially only the electrically conductive pads in contact with the electrically conductive pins, the active pads.