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US4432008A Expired / Lapsed US ⏱️ 0.0 years remaining

Gold-doped IC resistor region

Assignee: Leland Stanford Junior University
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Filing: 1980-07-21
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Granted: 1984-02-14
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Expires: 2000-07-21
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Abstract

Abstract Resistive elements of semiconductor devices and integrated circuits are reduced in size thereby allowing larger scale integration. Deep level dopants including impurities or crystalline lattice defects, or both, are formed in a low resistance doped region thereby increasing the resistance of a portion of the doped region. Resistive contacts and interconnects require less semiconductor surface area.

Inventors

  • 👤 Ron Maltiel

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 21:20
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/10; H10D62/13; H10D62/149; H10D62/151; H10D1/00; H10D1/40; H10D1/43; H10D1/47; H10D62/50; H10D62/53; H10D62/80; H10D62/83; H10D62/834; H10D84/00; H10D84/80; H10D84/811; H10D84/817; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/064; H10W20/40; H10W44/00; H10W44/401; Y; Y10; Y10S; Y10S148/00; Y10S148/01; Y10S148/024; Y10S257/00; Y10S257/902

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 115 words
An integrated semiconductor field effect transistor and resistor comprising a semiconductor body having a major surface, a first doped source region and a second doped drain region formed in said body and abutting said surface, said first region being spaced from said second region, a gate contact between said first and second regions and insulatively spaced from said surface, a third region formed within one of said first and second regions and abutting said surface, said third region comprising deep level impurities and having a resistance which is higher than the resistance of said one of said first and second regions, and an electrically conductive material on said surface and contacting only said third region.
Claim 2
Dependent Claim 115 words
An integrated semiconductor field effect transistor and resistor comprising a semiconductor body having a major surface, a first doped source region and a second doped drain region formed in said body and abutting said surface, said first region being spaced from said second region, a gate contact between said first and second regions and insulatively spaced from said surface, a third region formed within one of said first and second regions and abutting said surface, said third region comprising deep level impurities and having a resistance which is higher than the resistance of said one of said first and second regions, and an electrically conductive material on said surface and contacting only said third region.

References Cited (Backward Citations)

US3286138A Cited
US3504239A Cited
US3341754A Cited
US3484658A Cited
US3683306A Cited
US3796929A Cited
US4323913A Cited
US4063210A Cited
US4326213A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1987-02-13 1987-08-15 1988-02-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1991-02-13 1991-08-15 1992-02-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1995-02-13 1995-08-15 1996-02-14 $7700.00 Window Closed / Lapsed

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