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US4425196A Expired / Lapsed US ⏱️ 0.0 years remaining

Photoelectrochemical plating of silver

Assignee: AT&T Inc
•
Filing: 1982-09-03
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Granted: 1984-01-10
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Expires: 2002-09-03
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Abstract

Abstract A process is described for plating silver on metallic surfaces electrically attached to a compound semiconductor. This process involves a photoelectrochemically induced oxidation reaction in which the compound semiconductor is oxidized and reduction to metallic silver takes place on the metallic surface electrically connected to the semiconductor. This procedure is particularly valuable where silver is to be plated in small holes or crevices in the semiconductor structure. It is particularly valuable because plating is specific to the metallic surface and does not occur on the semiconductor surface. It is useful in providing low inductance electrical connections to various parts of semiconductor devices such as in the source for gallium arsenide field effect transistors. Silver is particularly valuable in such applications because of its chemical inertness, high electrical conductivity and exceptionally high thermal conductivity which permits high transistor power handling capabilities.

Inventors

  • 👤 Jeffrey R. Bessette
  • 👤 Paul A. Kohl

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 02:49
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/40; H10P14/46; H10P14/47

Claims Analysis

Total Claims: 24
Claim 1
Independent Claim 136 words
A process for fabricating devices comprising at least one n-type or intrinsic compound semiconductor material comprising the step of plating silver on a metallic surface electrically connected to the III-V compound semiconductor by an oxidation-reduction reaction in an electrolytic solution characterized in that a. the oxidation is carried out by illuminating the III-V compound semiconductor so as to create holes that permit oxidation of the semiconductor, b. the electrolytic solution comprises a source of silver which on reduction yields metallic silver in which the reduction potential of the source of silver in the electrolytic solution is between the potential of the valence band maximum in the electrolytic solution and the potential of the conduction band minimum in the electrolytic solution, and c. the source of silver is reduced on the metallic surface to form metallic silver.
Claim 2
Dependent Claim 136 words
A process for fabricating devices comprising at least one n-type or intrinsic compound semiconductor material comprising the step of plating silver on a metallic surface electrically connected to the III-V compound semiconductor by an oxidation-reduction reaction in an electrolytic solution characterized in that a. the oxidation is carried out by illuminating the III-V compound semiconductor so as to create holes that permit oxidation of the semiconductor, b. the electrolytic solution comprises a source of silver which on reduction yields metallic silver in which the reduction potential of the source of silver in the electrolytic solution is between the potential of the valence band maximum in the electrolytic solution and the potential of the conduction band minimum in the electrolytic solution, and c. the source of silver is reduced on the metallic surface to form metallic silver.
Claim 3
Dependent Claim 14 words
The process of claim 1 in which the compound semiconductor is a III-V compound.
Claim 4
Dependent Claim 32 words
The process of claim 2 in which the III-V compound semiconductor is selected from the group consisting of GaP, GaAs, AlAs, AlP, AlSb, InP, InSb, InAs, GaInAs, GaInP, GaInAsP, GaAlP and GaAlAs.
Claim 5
Dependent Claim 25 words
The process of claim 3 in which the III-V compound semiconductor is selected from the group consisting of GaP, GaAs, GaInAs, GaInP, GaInAsP and GaAlAs.
Claim 6
Dependent Claim 13 words
The process of claim 4 in which the III-V semiconductor compound is GaAs.
Claim 7
Dependent Claim 12 words
The process of claim 1 in which the compound semiconductor is undoped.
Claim 8
Dependent Claim 13 words
The process of claim 1 in which the compound semiconductor is semi-insulating GaAs.
Claim 9
Dependent Claim 29 words
The process of claim 7 in which the GaAs is made semi-insulating by doping with chromium in the concentration range from 10 15 to 10 19 Cr/cm 3 .
Claim 10
Dependent Claim 12 words
The process of claim 1 in which the compound semiconductor is n-type.
Claim 11
Dependent Claim 33 words
The process of claim 9 in which the compound semiconductor is made n-type by doping with at least one element selected from the group consisting of Si, Ge, Sn, S, Se and Te.
Claim 12
Dependent Claim 16 words
The process of claim 1 in which the source of silver is Ag(CN) 2 - .
Claim 13
Dependent Claim 19 words
The process of claim 1 in which the electrolytic solution is made by adding AgCN and KCN to water.
Claim 14
Dependent Claim 35 words
The process of claim 12 in which the concentration of silver is between 0.005 and 1 molar and the concentration of excess cyanide ion ranges from 0.1 to 10 times the molar concentration of silver.
Claim 15
Dependent Claim 23 words
The process of claim 1 in which the electrolytic solution comprises at least one aliphatic polyamine compound with up to 20 carbon atoms.
Claim 16
Dependent Claim 13 words
The process of claim 14 in which the aliphatic polyamine compound is 1,3-diaminopropane.
Claim 17
Dependent Claim 17 words
The process of claim 1 in which the pH of the electrolytic solution is less than 4.
Claim 18
Dependent Claim 17 words
The process of claim 1 in which the pH of the electrolytic solution is greater than 8.
Claim 19
Dependent Claim 13 words
The process of claim 1 in which the electrolytic solution contains chloride ion.
Claim 20
Dependent Claim 12 words
The process of claim 1 in which the electrolytic solution is buffered.
Claim 21
Dependent Claim 13 words
The process of claim 1 in which the electrolytic solution comprises conducting salts.
Claim 22
Dependent Claim 46 words
The process of claim 1 in which the compound semiconductor is gallium arsenide, the silver is plated in a via hole and onto a source pad and the electrolytic solution comprises 0.3 molar AgCN, 1.0 molar KCN and 0.1 molar K 2 CO 3 in water.
Claim 23
Dependent Claim 16 words
The process of claim 21 in which the electrolytic solution comprises in addition 0.2 molar 1,3-diaminopropane.
Claim 24
Dependent Claim 56 words
The process of claim 1 in which the compound semiconductor is gallium arsenide, the silver is plated in a via hole and onto a source pad and the electrolytic solution comprises 0.1 molar AgNO 3 , 0.01 molar KCN, 0.2 molar K 2 HPO 4 , 0.1 molar K 3 PO 4 and 0.2, molar 1,3-diaminopropane.

References Cited (Backward Citations)

US3013955A Cited
US4144139A Cited
US4251327A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1987-01-09 1987-07-11 1988-01-10 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1991-01-09 1991-07-11 1992-01-10 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1995-01-09 1995-07-11 1996-01-10 $7700.00 Window Closed / Lapsed

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