US4404733A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of producing semiconductor devices
Assignee: Fujitsu Ltd
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Filing: 1982-01-27
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Granted: 1983-09-20
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Expires: 2002-01-27
Abstract
Abstract An improved contact hole in a method of producing a semiconductor device by forming a silicon dioxide insulating layer by a chemical vapor deposition method on a semiconductor substrate, forming a contact hole in the insulating layer diffusing phosphorus or boron impurities into a portion of the insulating layer around the contact hole, heating the substrate to cause plastic flow of the insulating layer; and forming a conductive layer on the insulating layer, wherein the portion of the insulating layer containing a high concentration of phosphorus or boron plastically flows during the heating step.
Inventors
- 👤 Nobuo Sasaki
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 00:51
CPC Classifications
H; H10; H10P; H10P76/00; H10P76/40; H10P95/00; H10W; H10W20/00; H10W20/01; H10W20/071; H10W20/081; H10W20/082; H10W20/093; H10W20/095; H10W20/096
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
82 words
A method of producing a semiconductor device, comprising the steps of: forming an insulating layer of silicon dioxide on a semiconductor substrate; forming a contact hole in said insulating layer; selectively introducing impurities into a portion of said insulating layer around said contact hole; heating the insulating layer to cause plastic flow of said insulating layer so as to round the edge portion thereof defining said contact hole; and forming a conducting layer within said contact hole and on said insulating layer.
Claim 2
Independent Claim
82 words
A method of producing a semiconductor device, comprising the steps of: forming an insulating layer of silicon dioxide on a semiconductor substrate; forming a contact hole in said insulating layer; selectively introducing impurities into a portion of said insulating layer around said contact hole; heating the insulating layer to cause plastic flow of said insulating layer so as to round the edge portion thereof defining said contact hole; and forming a conducting layer within said contact hole and on said insulating layer.
Claim 3
Dependent Claim
77 words
A method according to claim 1, further comprising the steps of: forming a silicon nitride layer on said insulating layer after the formation of said silicon dioxide insulating layer, selectively etching said silicon nitride layer and insulating layer by a photoetching method to form said contact hole, diffusing said impurities into said portion of said insulating layer through said contact hole by a thermal diffusion method, and removing said silicon nitride layer prior to said heating step.
Claim 4
Dependent Claim
89 words
A method according to claim 1, further comprising the steps of: forming a silicon nitride layer on said insulating layer after the formation of said silicon dioxide insulating layer, selectively etching said silicon nitride layer to form an opening by a photoetching method, diffusing said impurities into said insulating layer through the opening by a thermal diffusion method, etching a portion of said insulating layer through the opening by a plasma etching method to form said contact hole, and removing said silicon nitride layer prior to said heating step.
Claim 5
Dependent Claim
103 words
A method according to claim 1, further comprising the steps of: forming a first patterned photoresist layer on said insulating layer after the formation of said silicon dioxide insulating layer, selectively introducing said impurities into said insulating layer by an ion implantation method using the first photoresist layer as a mask, forming a second patterned photoresist layer on the first photoresist layer, etching a portion of said insulating layer containing said impurities by a plasma etching method using the second photoresist layer as a mask to form said contact hole, and removing the first and second photoresist layers prior to said heating step.
Claim 6
Dependent Claim
86 words
A method according to claim 1, further comprising the steps of: forming a patterned photoresist layer on said insulating layer after the formation of said silicon dioxide insulating layer, selectively introducing said impurities into said insulating layer by an ion implantation method using the photoresist layer as a mask, etching a portion of said insulating layer containing said impurities by a plasma etching method using the photoresist layer as a mask to form said contact hole, and removing the photoresist layer prior to said heating step.
Claim 7
Independent Claim
18 words
A method according to claims 1, 2, 3, 4 or 5, wherein said impurities are phosphorus or boron.
Claim 8
Independent Claim
42 words
A method according to claims 1, 2, 3, 4 or 5, wherein during the formation of said silicon dioxide insulating layer, the concentration of phosphorus contained in said insulating layer is lower than the concentration of the impurities adjacent the contact hole.
Claim 9
Independent Claim
28 words
The method according to claims 1, 2, 3, 4 or 5, wherein the heating step occurs approximately in the temperature range of from 1000° C. to 1050° C.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-09-19 | 1987-03-21 | 1987-09-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-09-19 | 1991-03-21 | 1991-09-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-09-19 | 1995-03-21 | 1995-09-20 | $7700.00 | Window Closed / Lapsed |