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US4386975A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for the manufacture of epitaxial Ga1-x Alx As:Si film

Assignee: Siemens AG
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Filing: 1981-06-16
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Granted: 1983-06-07
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Expires: 2001-06-16
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Abstract

Abstract The invention relates to a method and apparatus for manufacturing epitaxial Ga 1-x Al x As:Si films via liquid-phase epitaxy, using a boat in a quartz tube. The Ga, which is contained in a graphite boat, open at the long side, is baked out first. The Ga-melt is allowed to run onto GaAs substrate wafers, on which Si is deposited, and to be drawn into the gap between the GaAs-substrate wafers and the plane graphite surfaces. The thin Ga-melt formed above the GaAs substrate wafers is then brought into contact with the melted Al and is allowed to cool. According to the method of the invention, luminescence diodes of the (Ga, Al) As type, the emission of which is in the wave range of 650 to 800 nm, can be constructed.

Inventors

  • 👤 Siegfried Leibenzeder
  • 👤 Christine Heindl

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 14:01
CPC Classifications
C; C30; C30B; C30B29/00; C30B29/10; C30B29/40; C30B19/00; C30B19/02; C30B19/04; C30B19/06; C30B19/063; H; H10; H10P; H10P14/00; H10P14/20; H10P14/26; H10P14/263; H10P14/29; H10P14/2901; H10P14/2907; H10P14/2911; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3421; H10P14/3438; H10P14/3441; H10P14/3442

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 170 words
In a method for manufacturing epitaxial Ga 1-x Al x As:Si films by liquid phase epitaxy on GaAs substrate wafers at elevated temperature in an H 2 -stream wherein a graphite push boat arranged in a quartz tube is utilized to receive Ga, Al, As-melts and said GaAs substrate wafers, the improvement comprising: baking out Ga melts contained in a graphite boat open longitudinally in a quartz tube at a temperature below the melting point of Al; permitting said Ga melts to run onto GaAs substrate wafers of non-uniform geometry, on which Si is deposited, at increased temperature by virtue of capillary effects; permitting the thin Ga-melts so formed to be drawn into the gap between the GaAs substrate wafers and the flat graphite surfaces of the boat; whereby the excess Ga then remaining is brought into contact with melted Al; and allowing the Ga melt formed, saturated with As by means of substrate separation and in which Al is dissolved, to cool in contact with the GaAs substrate wafers.
Claim 2
Dependent Claim 170 words
In a method for manufacturing epitaxial Ga 1-x Al x As:Si films by liquid phase epitaxy on GaAs substrate wafers at elevated temperature in an H 2 -stream wherein a graphite push boat arranged in a quartz tube is utilized to receive Ga, Al, As-melts and said GaAs substrate wafers, the improvement comprising: baking out Ga melts contained in a graphite boat open longitudinally in a quartz tube at a temperature below the melting point of Al; permitting said Ga melts to run onto GaAs substrate wafers of non-uniform geometry, on which Si is deposited, at increased temperature by virtue of capillary effects; permitting the thin Ga-melts so formed to be drawn into the gap between the GaAs substrate wafers and the flat graphite surfaces of the boat; whereby the excess Ga then remaining is brought into contact with melted Al; and allowing the Ga melt formed, saturated with As by means of substrate separation and in which Al is dissolved, to cool in contact with the GaAs substrate wafers.
Claim 3
Dependent Claim 20 words
The method according to claim 1, wherein the quartz tube is inclined relative to the horizontal by 1° to 10°.
Claim 4
Dependent Claim 31 words
The method according to claim 1 wherein the aluminum is introduced into the Ga-melt by a dosing unit and the boat is pushed by the quartz carrier onto a stopping tube.
Claim 5
Dependent Claim 26 words
The method according to claim 1, wherein the GaAs-melt is permitted to run onto the GaAs substrate to be coated by rotating the moving tube 180°.
Claim 6
Dependent Claim 22 words
The method according to claim 4, wherein the rotation is accomplished by means of a quartz tube carrier flat on one side.

References Cited (Backward Citations)

US3533856A Cited
US3631836A Cited
US3783825A Cited
US3933123A Cited
US3897281A Cited
US3889635A Cited
US3997377A Cited
US4123302A Cited
US4287848A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1986-06-06 1986-12-06 1987-06-07 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1990-06-06 1990-12-06 1991-06-07 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1994-06-06 1994-12-06 1995-06-07 $7700.00 Window Closed / Lapsed

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