High power MOSFET with low on-resistance and high breakdown voltage

Claim 2

A high power metal oxide silicon field effect transistor device exhibiting relatively low on-resistance and relatively high breakdown voltage; said device comprising: a wafer of semiconductor material having first and second opposing semiconductor surfaces; said wafer of semiconductor material having a relatively lightly doped major body portion for receiving junctions and being doped with impurities of one conductivity type; at least first and second spaced base regions of the opposite conductivity type to said one conductivity type formed in said wafer and extending from said first semiconductor surface to a first depth beneath said first semiconductor surface; the space between said at least first and second base regions defining a common conduction region of one conductivity type at a given first semiconductor surface location; first and second source regions of said one conductivity type formed in each pair of said at least first and second base regions respectively at first and second first surface locations and extending from said first and second first surface locations to a depth less than said first depth; said first and second source regions being laterally spaced along said first semiconductor surface from the facing respective edges of said common conduction region thereby to define first and second channel regions along said first semiconductor surface between each pair of said first and second source regions, respectively and said common conduction region; source electrode means connected to said source regions; gate insulation layer means on said first surface, disposed at least on said first and second channel regions; gate electrode means on said gate insulation layer means and overlying said first and second channel regions; a drain conductive region remote from said common region and separated therefrom by said relatively lightly doped major body portion; a drain electrode coupled to said drain conductive region; said common region being relatively highly doped, compared to said relatively lightly doped major body portion and extending from said given first semiconductor surface location to a depth greater than the depth of said source region, whereby resistance to current flow at the junctures between said first and second surface channel regions and said common region and between said common region and said relatively lightly doped major body portion is reduced.

Claim 3

A high power metal oxide silicon field effect transistor device exhibiting relatively low on-resistance and relatively high breakdown voltage; said device comprising: a wafer of semiconductor material having first and second opposing semiconductor surfaces; said wafer of semiconductor material having a relatively lightly doped major body portion for receiving junctions and being doped with impurities of one conductivity type; at least first and second spaced base regions of the opposite conductivity type to said one conductivity type formed in said wafer and extending from said first semiconductor surface to a first depth beneath said first semiconductor surface; the space between said at least first and second base regions defining a common conduction region of one conductivity type at a given first semiconductor surface location; first and second source regions of said one conductivity type formed in each pair of said at least first and second base regions respectively at first and second first surface locations and extending from said first and second first surface locations to a depth less than said first depth; said first and second source regions being laterally spaced along said first semiconductor surface from the facing respective edges of said common conduction region thereby to define first and second channel regions along said first semiconductor surface between each pair of said first and second source regions, respectively and said common conduction region; source electrode means connected to said source regions; gate insulation layer means on said first surface, disposed at least on said first and second channel regions; gate electrode means on said gate insulation layer means and overlying said first and second channel regions; a drain conductive region remote from said common region and separated therefrom by said relatively lightly doped major body portion; a drain electrode coupled to said drain conductive region; said common region being relatively highly doped, compared to said relatively lightly doped major body portion and extending from said given first semiconductor surface location to a depth greater than the depth of said source region but less than said first depth of said first and second spaced base regions, whereby resistance to current flow at the junctures between said first and second surface channel regions and said common region and between said common region and said relatively lightly doped major body portion is reduced.

Claim 4

A high power metal oxide silicon field effect transistor device exhibiting relatively low on-resistance and relatively high breakdown voltage; said device comprising: a wafer of semiconductor material having first and second opposing semiconductor surfaces; said wafer of semiconductor material having a relatively lightly doped major body portion for receiving junctions and being doped with impurities of one conductivity type; at least first and second spaced base regions of the opposite conductivity type to said one conductivity type formed in said wafer and extending from said first semiconductor surface to a first depth beneath said first semiconductor surface; the space between said at least first and second base regions defining a common conduction region of one conductivity type at a given first semiconductor surface location; first and second source regions of said one conductivity type formed in each pair of said at least first and second base regions respectively at first and second first surface locations and extending from said first and second first surface locations to a depth less than said first depth; said first and second source regions being laterally spaced along said first semiconductor surface from the facing respective edges of said common conduction region thereby to define first and second channel regions along said first semiconductor surface between each pair of said first and second source regions, respectively and said common conduction region; source electrode means connected to said source regions; gate insulation layer means on said first surface, disposed at least on said first and second channel regions; gate electrode means on said gate insulation layer means and overlying said first and second channel regions; a drain conductive region remote from said common region and separated therefrom by said relatively lightly doped major body portion; a drain electrode coupled to said drain conductive region; said common region being relatively highly doped, compared to said relatively lightly doped major body portion and extending from said given first semiconductor surface location to a depth greater than the depth of said source region but less than said first depth of said first and second spaced base regions, whereby resistance to current flow at the junctures between said first and second surface channel regions and said common region and between said common region and said relatively lightly doped major body portion is reduced.

Claim 5

The high power metal oxide silicon field effect transistor device of claim 1 or 2 wherein said device is formed by D-MOS manufacturing techniques.

Claim 6

The high power metal oxide silicon field effect transistor device of claim 1 or 2; said at least first and second spaced base regions being diffused regions and being diffused from said first and second first surface locations to said common region.

Claim 7

The device of claim 1 or 2 wherein said drain electrode is on said second semiconductor surface.

Claim 8

The device of claim 1 or 2 wherein said drain electrode is on said first surface.

Claim 9

The device of claim 6 wherein a high conductivity diffused region is disposed beneath said drain electrode.

Claim 10

The device of claim 7 which further includes electrode means fixed to said second surface.

Claim 11

The device of claim 6 wherein said drain conductive region contacts a second conductivity-type region which extends from said drain conductive region to said second surface.

Claim 12

The device of claim 9 wherein there is at least one additional highly doped second conductivity-type isolation region extending into said wafer from said first surface and surrounding said device.

Claim 13

The device of claim 1 or 2 wherein said relatively lightly doped major body portion of said wafer is an epitaxially formed layer.

Claim 14

The device of claim 11 wherein said epitaxial layer has a thickness of about 20 microns and is dependent upon the desired reverse voltage of the device.

Claim 15

The device of claim 1 or 2 wherein said gate insulation layer means is silicon dioxide.

Claim 16

The device of claim 1 or 2 wherein said first and second channel regions and said gate electrode means are elongated along a closed serpentine path.

Claim 17

The device of claim 1 or 2 wherein said first and second channel regions are elongated around closed parallel paths.

Claim 18

The device of claim 15 wherein one of said first and second source regions surrounds the other.

Claim 19

The device of claim 1 or 2 wherein said one conductivity type is the n-type and wherein said opposite conductivity type is the p-type.

Claim 20

The device of claim 1 or 2 wherein each of said at least first and second spaced base regions of said opposite conductivity type have respective profiles which include relatively shallow depth regions extending from said common region and underlying their said respective first and second source regions, and respective relatively deep, relatively large radius regions extending from said shallow depth regions which are laterally spaced from beneath said respective source regions on the side of said source regions which is away from said common region.

Claim 21

The device of claim 18 wherein said relatively deep regions have a depth of about 4 microns.

Claim 22

The device of claim 1 or 2 wherein said depth to which said common region is relatively highly doped is greater than about 1 micron.

Claim 23

The device of claim 1 or 2 wherein said depth to which said common region is highly doped is about 3 to 6 microns.

Claim 24

The device of claim 1 or 2 wherein said gate electrode means is formed of polysilicon.

Claim 25

The device of claim 1 or 2 wherein said relatively lightly doped body portion has a resistivity greater than about 2.5 ohm centimeters.

Claim 26

The device of claim 1 or 2 wherein said relatively highly doped portion of said common region is doped to a conductivity which is of the order of magnitude which would be produced by a total ion implanted dose of about 1×10 12 to 1×10 14 phosphorus atoms/cm 2 at 50 kv.

Claim 27

The device of claim 6, further comprising a generally annular, low-resistivity region of said first conductivity type surrounding said drain electrode; said generally annular region extending deep enough into said crystal to isolate said device electrically from other components that may be on said wafer.

Claim 28

The device of claim 6, wherein said first conductivity type is N-type and said second type is P-type.