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US4355457A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of forming a mesa in a semiconductor device with subsequent separation into individual devices

Assignee: Intersil Corp
•
Filing: 1980-10-29
•
Granted: 1982-10-26
•
Expires: 2000-10-29
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Abstract

Abstract A method of forming a mesa in a semiconductor device comprises forming a plurality of such devices on a wafer, mechanically cutting relatively wide channels to a predetermined depth in said wafer at positions around individual ones of the devices to partially separate the devices from each other. The mechanical cutting technique defines mesa walls and plain surfaces between individual devices. These channels are then etched to repair scars caused by the cutting technique and, thereafter, the wafer is broken along the center line of the channels to separate the devices from each other.

Inventors

  • 👤 Salvadore P. Barlett
  • 👤 Daniel J. Dougherty
  • 👤 Frederick P. Lokuta

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-25 18:41
CPC Classifications
H; H10; H10P; H10P54/00; H10P50/00; H10P50/60; H10P50/64; H10P50/642; H10P50/644; H10P52/00; Y; Y10; Y10T; Y10T225/00; Y10T225/10; Y10T225/12; Y10T225/30; Y10T225/307; Y10T225/321; Y10T225/325; Y10T29/00; Y10T29/49; Y10T29/49789; Y10T29/4979; Y10T29/49792

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 155 words
A method of forming a mesa in a semiconductor device, said method comprising: forming a plurality of semiconductor devices each having at least one PN junction on a wafer; mechanically cutting a first set of relatively wide generally U-shaped channels extending in a first direction on opposite sides of each of said devices and cutting a second set of relatively wide generally U-shaped channels extending in a second direction generally perpendicular to the first direction on opposite other sides of each of said devices, said channels having a bottom generally planar surface located below said PN junction and a pair of generally planar mesa walls at which said junctions terminate; etching said channels for a short time in a dilute etchant to smooth the channel surfaces and to provide a slight arcuate contour to each said mesa wall; and, separating said devices from each other by breaking the wafer along the midline of said channels.
Claim 2
Independent Claim 155 words
A method of forming a mesa in a semiconductor device, said method comprising: forming a plurality of semiconductor devices each having at least one PN junction on a wafer; mechanically cutting a first set of relatively wide generally U-shaped channels extending in a first direction on opposite sides of each of said devices and cutting a second set of relatively wide generally U-shaped channels extending in a second direction generally perpendicular to the first direction on opposite other sides of each of said devices, said channels having a bottom generally planar surface located below said PN junction and a pair of generally planar mesa walls at which said junctions terminate; etching said channels for a short time in a dilute etchant to smooth the channel surfaces and to provide a slight arcuate contour to each said mesa wall; and, separating said devices from each other by breaking the wafer along the midline of said channels.
Claim 3
Dependent Claim 38 words
A method in accordance with claim 1 including the step of scribing the bottom surfaces of each of said channels to define grooves extending along the midlines thereof after etching and then separating said devices along said grooves.
Claim 4
Independent Claim 17 words
A method in accordance with claims 1 or 2 wherein said cutting is done by saw means.
Claim 5
Independent Claim 30 words
A method in accordance with claims 1 or 2 wherein said channels are etched in a dilute solution of boiling sodium hydroxide (NaOH) for a period of about 90 seconds.
Claim 6
Independent Claim 21 words
A method in accordance with claims 1 or 2 wherein said channels are passivated before separating the devices from each other.
Claim 7
Independent Claim 24 words
A method in accordance with claims 1 or 2 wherein said wafer is solder dipped to form terminals thereon before said channels are formed.

References Cited (Backward Citations)

US2911773A Cited
US3081586A Cited
US3852876A Cited
US4019248A Cited
US3991296A Cited
US3970819A Cited
US4135291A Cited
US4217689A Cited
GB2009499B Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1985-10-25 1986-04-26 1986-10-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1989-10-25 1990-04-26 1990-10-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1993-10-25 1994-04-26 1994-10-26 $7700.00 Window Closed / Lapsed

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