Patent US4352725A successfully refreshed from Google Patents.
US4352725A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Dry etching device comprising an electrode for controlling etch rate
Assignee: Canon Anelva Corp
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Filing: 1980-12-12
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Granted: 1982-10-05
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Expires: 2000-12-12
Abstract
Abstract In a dry etching device comprising a first electrically grounded electrode plate and a second electrode plate opposite to the first electrode plate in a hollow space and supplied with a voltage of a predetermined frequency, a control electrode member is placed in the hollow space between the first and the second electrode plates and is connected to a d.c. voltage source for a controllable d.c. voltage. The etch rate is electrically adjustable to a desired rate by the d.c. voltage. The control electrode member may be a conductive rod projected into the hollow space or a conductive flat mesh substantially parallel to the first and the second electrode plates. Alternatively, the member may be an annular ring-shaped conductor surrounding the gas plasma developed between the first and the second electrode plates. Specimens to be etched may be placed on both of the electrode plates when the etch rate is adjusted to the desired rate by the use of the member.
Inventors
- 👤 Tsutomu Tsukada
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 17:00
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/32; H01J37/32431; H01J37/32623; H01J37/32697
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
181 words
A method of equalizing the etch rates in a device for dry etching a specimen by a use of a gas plasma, said method comprising the steps of: (a) exhausting a chamber having spaced parallel electrodes contained in an enclosed hollow space within said chamber; (b) placing at least one specimen to be etched on each of said electrodes, the etch rate of a specimen on one electrode differing considerably from the etch rate of a specimen on the other electrode; (c) filling said space with a preselected reactive gas; (d) applying an a.c. electric voltage of a predetermined frequency across said electrodes to develop said gas plasma in said gas-filled space, said gas plasma having a plasma potential dependent on the electric voltage applied across it and on said reactive gas; and (e) controlling said plasma potential by applying an adjustable d.c. voltage to a control electrode member position in said hollow space between said first and said second electrodes, said control electrode being out of contact with said specimen, thereby equalizing the etch rates of specimens on both electrodes.
Claim 2
Independent Claim
181 words
A method of equalizing the etch rates in a device for dry etching a specimen by a use of a gas plasma, said method comprising the steps of: (a) exhausting a chamber having spaced parallel electrodes contained in an enclosed hollow space within said chamber; (b) placing at least one specimen to be etched on each of said electrodes, the etch rate of a specimen on one electrode differing considerably from the etch rate of a specimen on the other electrode; (c) filling said space with a preselected reactive gas; (d) applying an a.c. electric voltage of a predetermined frequency across said electrodes to develop said gas plasma in said gas-filled space, said gas plasma having a plasma potential dependent on the electric voltage applied across it and on said reactive gas; and (e) controlling said plasma potential by applying an adjustable d.c. voltage to a control electrode member position in said hollow space between said first and said second electrodes, said control electrode being out of contact with said specimen, thereby equalizing the etch rates of specimens on both electrodes.
Claim 3
Dependent Claim
156 words
A dry etching device for etching at least one specimen by the use of a gas plasma, said device comprising a chamber defining therein a hollow space to be exhausted and then filled with a preselected reactive gas; a first flat electrode in said gas-filled space; a second flat electrode opposite said first electrode; each of said first and said second flat electrodes having accompanying means for holding said at least one specimen thereon; first means for applying an electric voltage of a predetermined frequency to develop said gas plasma in said gas-filled space between said first and said second electrodes; said gas plasma having a plasma potential dependent on said electric voltage and said reactive gas, wherein the device further comprises a control electrode member in said hollow space between said first and said second electrodes and second means for applying a controllable d.c. voltage to said control electrode member to control said plasma potential.
Claim 4
Dependent Claim
156 words
A dry etching device for etching at least one specimen by the use of a gas plasma, said device comprising a chamber defining therein a hollow space to be exhausted and then filled with a preselected reactive gas; a first flat electrode in said gas-filled space; a second flat electrode opposite said first electrode; each of said first and said second flat electrodes having accompanying means for holding said at least one specimen thereon; first means for applying an electric voltage of a predetermined frequency to develop said gas plasma in said gas-filled space between said first and said second electrodes; said gas plasma having a plasma potential dependent on said electric voltage and said reactive gas, wherein the device further comprises a control electrode member in said hollow space between said first and said second electrodes and second means for applying a controllable d.c. voltage to said control electrode member to control said plasma potential.
Claim 5
Dependent Claim
26 words
A dry etching device as claimed in claim 2, wherein said second electrode is placed in said hollow space substantially in parallel to said first electrode.
Claim 6
Dependent Claim
44 words
A dry etching device as claimed in claim 2, wherein said first and second electrodes are spaced parallel plates, and said control electrode member comprises a conductive rod projecting into said gas-filled space substantially in parallel with said first and said second flat electrodes.
Claim 7
Dependent Claim
45 words
A dry etching device as claimed in claim 2, wherein said first and second electrodes are spaced parallel plates, and said control electrode member comprises a conductive flat mesh held in said gas-filled space between said first and said second flat electrodes substantially parallel thereto.
Claim 8
Dependent Claim
47 words
A dry etching device as claimed in claim 2, wherein said first and second electrodes are spaced parallel plates, and said control electrode member comprises a ring-shaped conductor arranged in said gas-filled space to surround said gas plasma developed between said first and said second flat electrodes.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1985-10-04 | 1986-04-05 | 1986-10-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1989-10-04 | 1990-04-05 | 1990-10-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1993-10-04 | 1994-04-05 | 1994-10-05 | $7700.00 | Window Closed / Lapsed |