Interferometric method and system

Claim 2

Interferometer for measuring optical properties of a test object definable as local optical path length differences, such as the surface contour of a test mirror or the homogeneities of medium, comprising: means for producing a beam of monochromatic radiation having two components, having perpendicular polarizations; means disposed for receiving the beam and separating the two components or portions thereof, and having an orientation to direct one of the separated components into a test branch which includes the test object, the other one to a reference mirror, the test branch and the reference mirror reflecting the respective components, the means for receiving also recombining the reflected components into a composite beam; means disposed in a path of the composite beam for extracting from each component thereof a portion of similar polarization so that these portions, as leaving the means for extracting, are permitted to, and do, interfere; first detection means disposed for intercepting the interfering beam portions for photoelectrically detecting a distribution of radiation intensities of the two interfering beam portions, separately at different points in a plane; second detection means disposed for bypassing the means for extracting, for detecting the intensity of each component of said composite beam and as it would be effective in each of said points but for the interference; and means connected to the first and second detection means, for deriving therefrom a distribution of optical path length differences of the two interfering beams.

Claim 3

Interferometer for measuring optical properties of a test object definable as local optical path length differences, such as the surface contour of a test mirror or the homogeneities of a medium, comprising: means for producing a beam of monochromatic radiation having two components, having perpendicular polarization; shutter means disposed for permitting only one or the other, or both, of the two components to pass; means disposed for receiving the beam and separating the two components, or portions thereof, and having an orientation to direct one of the separated components into a test branch which includes the test object, the other one to a reference mirror, the test branch and the reference mirror reflecting the respective components, the means for receiving also recombining the reflected components into a composite beam and separately for each operational state of the shutter means; means disposed in a path of the composite beam for extracting from each component thereof a portion of similar polarization so that these portions, as leaving the means for extracting, are permitted to, and do, interfere as long as the shutter means permits both components to pass; means disposed in a plane, intercepting the composite beam for photoelectrically detecting a distribution of radiation intensities of the two beam portions, separately at different points in said plane and separately for each operational state of the shutter means; and means connected to the means for detecting, for deriving therefrom a distribution of optical path length differences of the two interfering beams.

Claim 4

Interferometer for measuring optical properties of a test object definable as local optical path length differences, such as the surface contour of a test mirror or the homogeneities of a medium, comprising: means for producing a beam of monochromatic radiation having two components, having perpendicular polarization; shutter means disposed for permitting only one or the other, or both, of the two components to pass; means disposed for receiving the beam and separating the two components, or portions thereof, and having an orientation to direct one of the separated components into a test branch which includes the test object, the other one to a reference mirror, the test branch and the reference mirror reflecting the respective components, the means for receiving also recombining the reflected components into a composite beam and separately for each operational state of the shutter means; means disposed in a path of the composite beam for extracting from each component thereof a portion of similar polarization so that these portions, as leaving the means for extracting, are permitted to, and do, interfere as long as the shutter means permits both components to pass; means disposed in a plane, intercepting the composite beam for photoelectrically detecting a distribution of radiation intensities of the two beam portions, separately at different points in said plane and separately for each operational state of the shutter means; and means connected to the means for detecting, for deriving therefrom a distribution of optical path length differences of the two interfering beams.

Claim 5

Interferometer for measuring optical properties of a test object definable as local path length differences, such as the surface contour of a test mirror or the homogeneities of a medium, comprising: means for producing a beam of monochomatic radiation having parallel rays, further having two components, having perpendicular polarization; means disposed for receiving the beam of parallel rays and separating the two components, or portions thereof, and having an orientation to direct one of the separated components into a test branch which includes the test object, the other components into the reference branch which includes the reference object, and the means for receiving also recombining the retro reflected components into a composite beam; means disposed in a path of the composite beam for extracting from each component thereof a portion of similar polarization so that these portions, as leaving the means for extracting, are permitted to, and do, interfere; first detection means disposed in a plane, intercepting the interfering beam portions for photoelectrically detecting a distribution of radiation intensities of the two interfering beam portions, separately in different points in said plane; second detection means disposed for detecting the intensities of the components of the composite beam individually and on a corresponding point-by-point basis to obtain two amplitude values for each such point, in addition to the intensity as detected by the first detector means for such point; and means connected to the first and second detection means for deriving therefrom a point-by-point distribution of opotical path length differences of the two interfering beams.

Claim 6

Interferometer for measuring optical properties of a test object definable as local path length differences, such as the surface contour of a test mirror or the homogeneities of a medium, comprising: means for producing a beam of monochomatic radiation having parallel rays, further having two components, having perpendicular polarization; means disposed for receiving the beam of parallel rays and separating the two components, or portions thereof, and having an orientation to direct one of the separated components into a test branch which includes the test object, the other components into the reference branch which includes the reference object, and the means for receiving also recombining the retro reflected components into a composite beam; means disposed in a path of the composite beam for extracting from each component thereof a portion of similar polarization so that these portions, as leaving the means for extracting, are permitted to, and do, interfere; first detection means disposed in a plane, intercepting the interfering beam portions for photoelectrically detecting a distribution of radiation intensities of the two interfering beam portions, separately in different points in said plane; second detection means disposed for detecting the intensities of the components of the composite beam individually and on a corresponding point-by-point basis to obtain two amplitude values for each such point, in addition to the intensity as detected by the first detector means for such point; and means connected to the first and second detection means for deriving therefrom a point-by-point distribution of opotical path length differences of the two interfering beams.

Claim 7

Interferometer as in claim 3, the means included in the second detection means being disposed to intercept branched-off components of the composite beam.