Claims Analysis
Total Claims: 3
Claim 1
Independent Claim
254 words
Interferometric apparatus for generating an analog voltage output signal corresponding to the optical quality of a test surface, said apparatus comprising: light source means for providing a test surface illuminating interrogation beam and a reference beam capable of producing interference patterns as a function of the optical phase difference between wavefronts in said beams; frequency shifter means, mounted in the path of one of said beams, for introducing a predetermined frequency shift in said one of said beams; image dissector means, mounted so as to be responsive to interference between said reference beam and said interrogation beam, for providing a frequency modulated electrical signal characterized by a carrier frequency equal to said predetermined frequency shift and frequency modulated in accordance with said optical phase difference, said image dissector means comprising signal generator means, for generating electrical sweep signals that vary as a predetermined function of time and a scanning photo-electric detector means, responsive to said sweep signals, for effecting predetermined scans of said interference patterns; and phase detector means, responsive to said frequency modulated electrical signal, for providing an analog output signal which varies with changes in said optical phase difference, said phase detector means comprising phase lock loop means, responsive to said frequency modulated electrical signal, for demodulation thereof to provide an intermediate analog signal corresponding to rate of change of said phase difference, and integrator means, connected to said phase lock loop means, for integration of said intermediate analog signal with respect to time so as to provide said analog output signal.
Claim 2
Dependent Claim
254 words
Interferometric apparatus for generating an analog voltage output signal corresponding to the optical quality of a test surface, said apparatus comprising: light source means for providing a test surface illuminating interrogation beam and a reference beam capable of producing interference patterns as a function of the optical phase difference between wavefronts in said beams; frequency shifter means, mounted in the path of one of said beams, for introducing a predetermined frequency shift in said one of said beams; image dissector means, mounted so as to be responsive to interference between said reference beam and said interrogation beam, for providing a frequency modulated electrical signal characterized by a carrier frequency equal to said predetermined frequency shift and frequency modulated in accordance with said optical phase difference, said image dissector means comprising signal generator means, for generating electrical sweep signals that vary as a predetermined function of time and a scanning photo-electric detector means, responsive to said sweep signals, for effecting predetermined scans of said interference patterns; and phase detector means, responsive to said frequency modulated electrical signal, for providing an analog output signal which varies with changes in said optical phase difference, said phase detector means comprising phase lock loop means, responsive to said frequency modulated electrical signal, for demodulation thereof to provide an intermediate analog signal corresponding to rate of change of said phase difference, and integrator means, connected to said phase lock loop means, for integration of said intermediate analog signal with respect to time so as to provide said analog output signal.
Claim 3
Dependent Claim
40 words
Interferometric apparatus as defined in claim 1, and wherein: said signal generator means further generates clearing signals; and said phase detector means further comprises means, responsive to said clearing signals, for clearing said integrator means between each of said sweeps.