US4326331A
Expired / Lapsed
US
⏱️ 0.0 years remaining
High coupling ratio electrically programmable ROM
Assignee: Texas Instruments Inc
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Filing: 1979-09-17
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Granted: 1982-04-27
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Expires: 1999-09-17
Abstract
Abstract An electrically programmable memory array of the floating gate type with a high coupling ratio is made by a process which allows the edges of the floating gates to be self-aligned with the edges of the control gates. The source and drain regions are formed prior to applying the first level polysilicon by a process which leaves these regions covered with thick oxide, rather than using the polysilicon as a mask to define the gate areas. The ratio of the capacitance between the floating gate and control gate to the total capacitance at the floating gate is increased by extending the floating gate out over the source and drain since the thick oxide reduces coupling from the floating gate to the source and drain.
Inventors
- 👤 Daniel C. Guterman
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-25 08:48
CPC Classifications
H; H10; H10B; H10B41/00; H10B41/10; H10B69/00; H10D; H10D30/00; H10D30/60; H10D30/68; H10D30/681; H10D30/684; H10D30/685
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
179 words
A method of making an electrically programmable semiconductor memory cell of the floating gate type comprising the steps of: forming a first field oxide coating on a face of a body of semiconductor material, the first field oxide surrounding areas to later have transistors formed therein on said face, forming heavily doped source and drain regions on opposite sides of a channel region in said areas, the source and drain regions being covered with a second field oxide at said face, applying a first layer of conductive material on said face separated from the channel region by thin gate oxide, patterning the first layer to partially define a floating gate which is much larger in area than said channel and extends out over said first field oxide by a substantial amount, applying a second layer of conductive material on said face overlying the first layer separated therefrom by a thin insulator coating, and thereafter patterning the second layer to define a control gate while at the same time patterning the first layer to define edges of the floating gate.
Claim 2
Independent Claim
179 words
A method of making an electrically programmable semiconductor memory cell of the floating gate type comprising the steps of: forming a first field oxide coating on a face of a body of semiconductor material, the first field oxide surrounding areas to later have transistors formed therein on said face, forming heavily doped source and drain regions on opposite sides of a channel region in said areas, the source and drain regions being covered with a second field oxide at said face, applying a first layer of conductive material on said face separated from the channel region by thin gate oxide, patterning the first layer to partially define a floating gate which is much larger in area than said channel and extends out over said first field oxide by a substantial amount, applying a second layer of conductive material on said face overlying the first layer separated therefrom by a thin insulator coating, and thereafter patterning the second layer to define a control gate while at the same time patterning the first layer to define edges of the floating gate.
Claim 3
Dependent Claim
26 words
A method according to claim 1 wherein the semiconductor body is P-type silicon, the heavily doped regions are N+, and the conductive material is polycrystalline silicon.
Claim 4
Dependent Claim
35 words
A method according to claim 2 wherein the first layer is patterned to define a first elongated strip including a plurality of said floating gates for a plurality of said memory cells in said face.
Claim 5
Dependent Claim
42 words
A method according to claim 3 wherein the second layer is patterned to define a second elongated strip perpendicular to the first elongated strip, the second elongated strip forming the control gates of a plurality of said memory cells on said face.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1985-04-26 | 1985-10-26 | 1986-04-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1989-04-26 | 1989-10-26 | 1990-04-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1993-04-26 | 1993-10-26 | 1994-04-27 | $7700.00 | Window Closed / Lapsed |