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Negative-working polymers useful as electron beam resists

Assignee: Eastman Kodak Co
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Filing: 1980-06-27
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Granted: 1981-09-15
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Expires: 2000-06-27
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Abstract

Abstract Novel acrylate copolymer materials function as electron-beam resists with enhanced sensitivity and enhanced plasma etch resistance. The method of using such materials as an electron-beam resist is also described.

Inventors

  • 👤 Zoilo C. H. Tan
  • 👤 Constantine C. Petropoulos
  • 👤 Frederick J. Rauner

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 06:21
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/038; G03F7/0388; C; C08; C08F; C08F220/00; C08F220/02; C08F220/10; C08F220/12; C08F220/16; C08F220/18; C08F220/1803; C08F220/1804; C08F220/1807; C08F220/40

Claims Analysis

Total Claims: 22
Claim 1
Independent Claim 80 words
A polymer having a negative-working electron sensitivity of at least 2×10 -7 coulombs/cm 2 when exposed to a 10 keV electron beam, said polymer having recurring units with the sructure ##STR7## wherein R and R 1 are each independently hydrogen or methyl, R 2 is ##STR8## n is 1, 2, or 3; R 3 is alkylene of from 1 to 3 carbon atoms; T is --O-- or --NH--; and x and y are mole percents such that 5≦ x≦95 5≦y≦50.
Claim 2
Dependent Claim 80 words
A polymer having a negative-working electron sensitivity of at least 2×10 -7 coulombs/cm 2 when exposed to a 10 keV electron beam, said polymer having recurring units with the sructure ##STR7## wherein R and R 1 are each independently hydrogen or methyl, R 2 is ##STR8## n is 1, 2, or 3; R 3 is alkylene of from 1 to 3 carbon atoms; T is --O-- or --NH--; and x and y are mole percents such that 5≦ x≦95 5≦y≦50.
Claim 3
Dependent Claim 75 words
A polymer having a negative-working electron sensitivity of at least 2×10 -7 coulombs/cm 2 when exposed to a 10 keV electron beam, said polymer having recurring units with the structure ##STR9## wherein R and R 1 are each independently hydrogen or methyl, R 3 and R 4 are each independently alkylene of from 1 to 3 carbon atoms; T is --O-- or --NH--; and x and y are mole percents such that 5≦ x≦95 5≦y≦50.
Claim 4
Dependent Claim 75 words
A polymer having a negative-working electron sensitivity of at least 2×10 -7 coulombs/cm 2 when exposed to a 10 keV electron beam, said polymer having recurring units with the structure ##STR9## wherein R and R 1 are each independently hydrogen or methyl, R 3 and R 4 are each independently alkylene of from 1 to 3 carbon atoms; T is --O-- or --NH--; and x and y are mole percents such that 5≦ x≦95 5≦y≦50.
Claim 5
Dependent Claim 16 words
Poly[allyl methacrylate-co-(2-hydroxyethyl methacrylate)] x: (100-x) wherein x is between about 50 and about 95 mole percent.
Claim 6
Dependent Claim 16 words
Poly[allyl methacrylate-co-(2-hydroxyethyl methacrylate)] x: (100-x) wherein x is between about 50 and about 95 mole percent.
Claim 7
Dependent Claim 16 words
Poly[4-but-1-enyl methacrylate-co-(2-hydroxyethyl methacrylate)] x: (100-x) wherein x is between about 50 and about 95 mole percent.
Claim 8
Dependent Claim 16 words
Poly[4-but-1-enyl methacrylate-co-(2-hydroxyethyl methacrylate)] x: (100-x) wherein x is between about 50 and about 95 mole percent.
Claim 9
Dependent Claim 15 words
Poly(allyl methacrylate-co-2-hydroxypropylmethacrylamide) x: (100-x) wherein x is between about 50 and about 95 mole percent.
Claim 10
Dependent Claim 15 words
Poly(allyl methacrylate-co-2-hydroxypropylmethacrylamide) x: (100-x) wherein x is between about 50 and about 95 mole percent.
Claim 11
Dependent Claim 16 words
Poly[3-norbornenyl methacrylate-co-(2-hydroxyethyl methacrylate)] x: (100-x) wherein x is between about 50 and about 95 mole percent.
Claim 12
Dependent Claim 16 words
Poly[3-norbornenyl methacrylate-co-(2-hydroxyethyl methacrylate)] x: (100-x) wherein x is between about 50 and about 95 mole percent.
Claim 13
Dependent Claim 20 words
A polymer as defined in any one of claims 1 through 6, and further including a substrate bearing said polymer.
Claim 14
Dependent Claim 16 words
Poly[allyl methacrylate-co-(2-hydroxyethyl methacrylate)] x: (100-x) wherein x is between about 70 and about 75 mole percent.
Claim 15
Dependent Claim 16 words
Poly[allyl methacrylate-co-(2-hydroxyethyl methacrylate)] x: (100-x) wherein x is between about 70 and about 75 mole percent.
Claim 16
Dependent Claim 16 words
Poly[but-1-enyl methacrylate-co-(2-hydroxyethyl methacrylate)] x: (100-x) wherein x is between about 70 and about 75 mole percent.
Claim 17
Dependent Claim 16 words
Poly[but-1-enyl methacrylate-co-(2-hydroxyethyl methacrylate)] x: (100-x) wherein x is between about 70 and about 75 mole percent.
Claim 18
Dependent Claim 15 words
Poly(allyl methacrylate-co-2-hydroxypropylmethacrylamide) x: (100-x) wherein x is between about 70 and about 75 mole percent.
Claim 19
Dependent Claim 15 words
Poly(allyl methacrylate-co-2-hydroxypropylmethacrylamide) x: (100-x) wherein x is between about 70 and about 75 mole percent.
Claim 20
Dependent Claim 16 words
Poly[3-norbornenyl methacrylate-co-(2-hydroxyethyl methacrylate)] x: (100-x) wherein x is between about 70 and about 75 mole percent.
Claim 21
Dependent Claim 16 words
Poly[3-norbornenyl methacrylate-co-(2-hydroxyethyl methacrylate)] x: (100-x) wherein x is between about 70 and about 75 mole percent.
Claim 22
Independent Claim 65 words
A method of imagewise hardening, on a substrate, a layer of a resist comprising a polymer as defined in any one of claims 1 through 11, said method comprising the steps of (a) imagewise exposing said layer to electron beam radiation of an energy no greater than about 10 keV; and (b) developing the layer by washing it with a solvent for the unexposed polymer.

References Cited (Backward Citations)

US2202846A Cited
US3376138A Cited
US3617279A Cited
US3554886A Cited
US3501445A Cited
US3556792A Cited
US3556793A Cited
GB1407312A Cited
GB1459563A Cited
US4133907A Cited
US4123276A Cited
US4054233A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1984-09-14 1985-03-16 1985-09-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1988-09-14 1989-03-16 1989-09-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1992-09-14 1993-03-16 1993-09-15 $7700.00 Window Closed / Lapsed

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