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US4279986A Expired / Lapsed US ⏱️ 0.0 years remaining

Negative resist and radical scavenger composition with capability of preventing post-irradiation polymerization

Assignee: NEC Corp
•
Filing: 1979-07-23
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Granted: 1981-07-21
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Expires: 1999-07-23
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Abstract

Abstract A lithographic resist for use in microfabrication comprising a negative-type resist containing a radical scavenger capable of preventing post-irradiation reaction.

Inventors

  • 👤 Yoshitake Ohnishi
  • 👤 Masaki Itoh
  • 👤 Kenji Mizuno
  • 👤 Hiroshi Gokan

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 11:57
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/038; Y; Y10; Y10S; Y10S430/00; Y10S430/1053; Y10S430/1055; Y10S430/114; Y10S430/118

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 23 words
A radiation sensitive composition comprising a negative resist material having epoxy groups and from about 2.5 to about 10 weight percent of 1,1-diphenyl-2-picrylhydrazyl.
Claim 2
Dependent Claim 23 words
A radiation sensitive composition comprising a negative resist material having epoxy groups and from about 2.5 to about 10 weight percent of 1,1-diphenyl-2-picrylhydrazyl.
Claim 3
Dependent Claim 19 words
A composition as defined in claim 1, wherein said negative resist material contains glycidyl methacrylate as a monomer unit.
Claim 4
Dependent Claim 20 words
A composition as defined in claim 2, wherein said netative resist is a copolymer of glycidyl methacrylate and ethyl acrylate.
Claim 5
Independent Claim 32 words
A method of reducing post-irradiation reaction of a negative resist material having epoxy groups comprising adding to said material prior to irradiation from about 2.5 to about 10 weight percent of 1,1-diphenyl-2-picrylhydrazyl.
Claim 6
Independent Claim 32 words
A method of reducing post-irradiation reaction of a negative resist material having epoxy groups comprising adding to said material prior to irradiation from about 2.5 to about 10 weight percent of 1,1-diphenyl-2-picrylhydrazyl.
Claim 7
Dependent Claim 28 words
A lithographic resist comprising a support having thereon a layer of negative resist material having epoxy groups and from about 2.5 to about 10 weight percent of 1,1-diphenyl-2-picrylhydrazyl.
Claim 8
Dependent Claim 28 words
A lithographic resist comprising a support having thereon a layer of negative resist material having epoxy groups and from about 2.5 to about 10 weight percent of 1,1-diphenyl-2-picrylhydrazyl.

References Cited (Backward Citations)

US3864133A Cited
US3989610A Cited
US4025348A Cited
US4097283A Cited
US4130424A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1984-07-20 1985-01-19 1985-07-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1988-07-20 1989-01-19 1989-07-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1992-07-20 1993-01-19 1993-07-21 $7700.00 Window Closed / Lapsed

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