Patent EP0040573B1 successfully refreshed from Google Patents.
← Back to Patent Explorer
US4228201A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for rendering a non-platable semiconductor substrate platable

Assignee: Individual
•
Filing: 1978-08-07
•
Granted: 1980-10-14
•
Expires: 1998-08-07
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A process is described for the reception of electrolytic or electroless plating onto a non-platable semiconductor substrate. The process comprises contacting of the semiconductor substrate with a promoter composition containing metal ions, preferably primary type, selected from the group consisting of nickel, cobalt, iron, and copper, and mixtures thereof, and a reducing agent selected from the group consisting of amine boranes, borohydrides, hydrazine, and derivatives thereof, and thereafter immersion of the substrate in conventional electrolytic or electroless plating baths, e.g., nickel or cobalt-hypophosphite type baths or copper-formaldehyde type baths, for the metallic build-up.

Inventors

  • 👤 Nathan Feldstein

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 18:58
CPC Classifications
C; C23; C23C; C23C18/00; C23C18/16; C23C18/18; C23C18/1851; C23C18/1872; C23C18/1886; C23C18/1893; C23C18/1889; H; H05; H05K; H05K1/00; H05K1/02; H05K1/03; H05K1/0306; H05K3/00; H05K3/10; H05K3/18; H05K3/181; H05K3/22; H05K3/24; H05K3/244; H05K3/245; Y; Y10; Y10S; Y10S438/00; Y10S438/974

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 133 words
A process for rendering a non-platable semiconductor substrate platable comprising the step of contacting said semiconductor substrate with a promoter composition comprising metal ions selected from the group consisting of nickel, cobalt, iron, copper, and mixtures thereof, and a reducing agent selected from the group consisting of amine boranes, borohydrides, hydrazine, and derivatives thereof, wherein said reducing agent is capable of chemically reacting with said semiconductor substrate and said metal ions, and further wherein the concentration of said reducing agent relative to said metal ions is so adjusted as to form sufficient metallic sites on the substrate for a subsequent plating step and to permit the initial chemical interaction of the reducing agent with the semiconductor substrate and then the heterogeneous reduction of some of the metal ions present in the promoter composition.
Claim 2
Dependent Claim 133 words
A process for rendering a non-platable semiconductor substrate platable comprising the step of contacting said semiconductor substrate with a promoter composition comprising metal ions selected from the group consisting of nickel, cobalt, iron, copper, and mixtures thereof, and a reducing agent selected from the group consisting of amine boranes, borohydrides, hydrazine, and derivatives thereof, wherein said reducing agent is capable of chemically reacting with said semiconductor substrate and said metal ions, and further wherein the concentration of said reducing agent relative to said metal ions is so adjusted as to form sufficient metallic sites on the substrate for a subsequent plating step and to permit the initial chemical interaction of the reducing agent with the semiconductor substrate and then the heterogeneous reduction of some of the metal ions present in the promoter composition.
Claim 3
Dependent Claim 22 words
The process according to claim 1 wherein said semiconductor substrate is selected from the group consisting of silicon, germanium, and III-V compounds.
Claim 4
Dependent Claim 12 words
The process according to claim 1 wherein said semiconductor substrate is silicon.
Claim 5
Dependent Claim 21 words
The process according to claim 1 wherein the concentration of said reducing agent is in molar excess to said metal ions.
Claim 6
Dependent Claim 12 words
The process according to claim 1 wherein said metal ions are nickel.
Claim 7
Dependent Claim 15 words
The process according to claim 1 wherein said promoter composition is used above room temperature.
Claim 8
Dependent Claim 13 words
The process according to claim 1 wherein said reducing agent is dimethylamine borane.
Claim 9
Dependent Claim 13 words
The process according to claim 1 wherein said reducing agent is a borohydride.
Claim 10
Dependent Claim 12 words
The process according to claim 1 wherein said reducing agent is hydrazine.
Claim 11
Dependent Claim 17 words
The process according to claim 1 further containing the step of heat treating the metallized semiconductor substrate.
Claim 12
Dependent Claim 25 words
The process according to claim 1 further containing the step of depositing metal on the semiconductor substrate containing metallic sites by a chemical plating process.

References Cited (Backward Citations)

US3096182A Cited
US3666529A Cited
US3853590A Cited
SU429483A1 Cited
US3772056A Cited
US3962494A Cited
US4002778A Cited
US3870526A Cited
US3958048A Cited
US3993801A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1983-10-14 1984-04-14 1984-10-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1987-10-14 1988-04-14 1988-10-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1991-10-14 1992-04-14 1992-10-14 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag