Testing macros embedded in LSI chips

Claim 2

In a testable LSI chip having embedded PLAs and linear logic function devices mounted thereon, the improvement comprising: a plurality of PLAs connected by means of selectively switchable gates, in alternate parallel paths with their inputs not connected together when their outputs are connected together; a linear logic function device connected in series with at least one of said PLAs; and whereby the PLAs are testable for faults in a macro mode.

Claim 3

In a testable LSI chip with embedded PLAs and linear logic function devices mounted thereon, the improvement comprising: a plurality of PLAs connected by means of selectively switchable gates, in alternate parallel paths with their outputs not connected together when their inputs are connected together; a linear logic function device connected in series to at least one of said PLAs; and the PLAs being testable for faults in a macro mode.

Claim 4

In a testable LSI chip with embedded PLAs and linear logic function devices mounted thereon, the improvement comprising: a plurality of PLAs connected by means of selectively switchable gates, in alternate parallel paths with their outputs not connected together when their inputs are connected together; a linear logic function device connected in series to at least one of said PLAs; and the PLAs being testable for faults in a macro mode.

Claim 5

In an LSI chip having a plurality of PLAs, at least a first PLA having inputs connected to the output of a shift register and the output of the PLA connected to the input of the shift register, the output of the shift register being connected to a testing apparatus external to the chip, the improvement comprising: at least a second PLA in alternate parallel path relation to said first PLA and having its output connected to at least a first bus, the output of the bus being connected to the testing apparatus; at least a second bus connected to the output of the shift register; the outputs of the busses being connectable to one another; control means connected to both said first and second busses for disabling the output of one of the busses to permit the output of the other bus to propagate through to the testing apparatus, and whereby the PLAs, shift register, and busses are testable in a macro mode.

Claim 6

In an LSI chip having a plurality of PLAs, at least a first PLA having inputs connected to the output of a shift register and the output of the PLA connected to the input of the shift register, the output of the shift register being connected to a testing apparatus external to the chip, the improvement comprising: at least a second PLA in alternate parallel path relation to said first PLA and having its output connected to at least a first bus, the output of the bus being connected to the testing apparatus; at least a second bus connected to the output of the shift register; the outputs of the busses being connectable to one another; control means connected to both said first and second busses for disabling the output of one of the busses to permit the output of the other bus to propagate through to the testing apparatus, and whereby the PLAs, shift register, and busses are testable in a macro mode.

Claim 7

In an LSI chip having a plurality of PLAs, the improvement comprising: a first shift register; at least a first embedded PLA having inputs connected to parallel outputs of the shift register; a second shift register; at least a second embedded PLA, connected in alternate parallel path relation with the first PLA, having inputs connected to the parallel outputs of said second shift register; a gated bus having inputs connected to the outputs of both the first and second PLAs; an external test apparatus connected to the inputs of said first and second shift registers for inputting a test pattern into said shift registers; control means connected to the bus to simultaneously enable testing the PLAs and bus by propagating said test pattern through the PLAs and bus; and said test apparatus receiving the output of said gated bus for comparison with the expected output.

Claim 8

In an LSI chip having a plurality of PLAs, the improvement comprising: a first shift register; at least a first embedded PLA having inputs connected to parallel outputs of the shift register; a second shift register; at least a second embedded PLA, connected in alternate parallel path relation with the first PLA, having inputs connected to the parallel outputs of said second shift register; a gated bus having inputs connected to the outputs of both the first and second PLAs; an external test apparatus connected to the inputs of said first and second shift registers for inputting a test pattern into said shift registers; control means connected to the bus to simultaneously enable testing the PLAs and bus by propagating said test pattern through the PLAs and bus; and said test apparatus receiving the output of said gated bus for comparison with the expected output.

Claim 9

In a macro testable LSI chip having a combinatorial logic structure arrangement embedded in the LSI chip including: an LSSD shift register for receiving a test pattern from an external test apparatus output; a first PLA connected to the output of the shift register for receiving the test pattern; the output of the first PLA connected to the input of the shift register to feed back the test pattern to the output of the shift register; linear logic function means connected to the output of the shift register for receiving and propagating the test pattern therethrough; at least a second PLA connected in an alternate parallel path with the first PLA without reconverging fan-outs for receiving a test pattern simultaneously with the first PLA; the linear logic function means including a first bus connected in series with one of said PLAs between said test apparatus output and a chip output node, and a second bus connected in parallel with the other of said PLAs between said test apparatus output and a chip output node; control means for disabling one of said bus means to permit propagation of the test pattern therethrough; and said test apparatus including an input for receiving the test patterns from said chip output node for comparison purposes.

Claim 10

In a macro testable LSI chip having a combinatorial logic structure arrangement embedded in the LSI chip including: an LSSD shift register for receiving a test pattern from an external test apparatus output; a first PLA connected to the output of the shift register for receiving the test pattern; the output of the first PLA connected to the input of the shift register to feed back the test pattern to the output of the shift register; linear logic function means connected to the output of the shift register for receiving and propagating the test pattern therethrough; at least a second PLA connected in an alternate parallel path with the first PLA without reconverging fan-outs for receiving a test pattern simultaneously with the first PLA; the linear logic function means including a first bus connected in series with one of said PLAs between said test apparatus output and a chip output node, and a second bus connected in parallel with the other of said PLAs between said test apparatus output and a chip output node; control means for disabling one of said bus means to permit propagation of the test pattern therethrough; and said test apparatus including an input for receiving the test patterns from said chip output node for comparison purposes.

Claim 11

In an efficiently testable LSI chip, the improvement comprising: a first PLA for receiving a test pattern from an external test pattern generator connected thereto; an LSSD latch register connected to the input and output of said first PLA to feed the test pattern to said first PLA for propagation therethrough and to receive the resultant output from said first PLA for scan-out to said external test apparatus; a second PLA having its inputs connected in common with the inputs of said first PLA to receive a test pattern for propagating therethrough simultaneously with said first PLA; and linear logic function means connected in series to the output of each of said PLAs for providing the output test pattern to said external test apparatus for comparison with the expected output.

Claim 12

In an efficiently testable LSI chip, the improvement comprising: a first PLA for receiving a test pattern from an external test pattern generator connected thereto; an LSSD latch register connected to the input and output of said first PLA to feed the test pattern to said first PLA for propagation therethrough and to receive the resultant output from said first PLA for scan-out to said external test apparatus; a second PLA having its inputs connected in common with the inputs of said first PLA to receive a test pattern for propagating therethrough simultaneously with said first PLA; and linear logic function means connected in series to the output of each of said PLAs for providing the output test pattern to said external test apparatus for comparison with the expected output.

Claim 13

In an efficiently testable LSI chip, the improvement comprising: a first PLA for receiving a test pattern from an external test pattern generator connected thereto; an LSSD latch register connected to the input and output of said first PLA to feed the test pattern to said first PLA for propagation therethrough and to receive the resultant output from said first PLA for scan-out to said external test apparatus; a second PLA having its inputs connected in common with the inputs of said first PLA to receive a test pattern for propagating therethrough simultaneously with said first PLA; and linear logic function means connected in series to the output of each of said PLAs for providing the output test pattern to said external test apparatus for comparison with the expected output.

Claim 14

In an efficiently testable LSI chip, the improvement comprising: a first PLA for receiving a test pattern from an external test pattern generator connected thereto; an LSSD latch register connected to the input and output of said first PLA to feed the test pattern to said first PLA for propagation therethrough and to receive the resultant output from said first PLA for scan-out to said external test apparatus; a second PLA having its inputs connected in common with the inputs of said first PLA to receive a test pattern for propagating therethrough simultaneously with said first PLA; and linear logic function means connected in series to the output of each of said PLAs for providing the output test pattern to said external test apparatus for comparison with the expected output.