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US4217154A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for control of an open gallium diffusion

Assignee: BBC Brown Boveri AG Switzerland
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Filing: 1978-10-30
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Granted: 1980-08-12
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Expires: 1998-10-30
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Abstract

Abstract A method for controlling a gallium diffusion with at least one silicon wafer, wherein precisely dosed amounts of hydrogen, oxygen, and optionally nitrogen are mixed in a combustion chamber where the hydrogen and oxygen is converted into water vapor and hydrogen. The combustion chamber is connected to a source portion of the diffusion oven, wherein is contained a gallium oxide containing crucible. The water vapor, hydrogen (and nitrogen) mixture is then passed from the combustion chamber to the source over where the volatile sub-oxide (Ga 2 O), is produced and then carried in a gas stream to the silicon wafer contained in a main portion of the diffusion oven for diffusion therein.

Inventors

  • 👤 Gerhard Popp
  • 👤 Gerhard Held

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 22:44
CPC Classifications
C; C30; C30B; C30B31/00; C30B31/06; C30B31/08; C30B31/18; Y; Y10; Y10S; Y10S438/00; Y10S438/935

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 170 words
In a method of controlling a gallium diffusion with at least one silicon wafer in an open tube of a diffusion oven including a source oven and a main oven, wherein a gas mixture of water vapor and mainly hydrogen is passed over gallium trioxide (Ga 2 O 3 ) and the volatile sub-oxide (Ga 2 O) produced by reduction is then carried in a gas stream to the silicon wafer, with additional control of the gallium concentration in the silicon by dilution of the gas mixture with nitrogen, the improvement comprising: introducing dry hydrogen into said open tube; mixing precisely dosed additions of relatively small quantities of dry oxygen with said dry hydrogen in said open tube; and combusting the resulting mixture of said dry hydrogen and said dry oxygen prior to said mixture encountering said gallium trioxide; whereby the admixture of water vapor required for controlling the gallium concentration is obtained through combustion of the additions of small quantities of said dry oxygen before encountering said gallium trioxide.
Claim 2
Dependent Claim 170 words
In a method of controlling a gallium diffusion with at least one silicon wafer in an open tube of a diffusion oven including a source oven and a main oven, wherein a gas mixture of water vapor and mainly hydrogen is passed over gallium trioxide (Ga 2 O 3 ) and the volatile sub-oxide (Ga 2 O) produced by reduction is then carried in a gas stream to the silicon wafer, with additional control of the gallium concentration in the silicon by dilution of the gas mixture with nitrogen, the improvement comprising: introducing dry hydrogen into said open tube; mixing precisely dosed additions of relatively small quantities of dry oxygen with said dry hydrogen in said open tube; and combusting the resulting mixture of said dry hydrogen and said dry oxygen prior to said mixture encountering said gallium trioxide; whereby the admixture of water vapor required for controlling the gallium concentration is obtained through combustion of the additions of small quantities of said dry oxygen before encountering said gallium trioxide.
Claim 3
Dependent Claim 74 words
A method according to claim 1, further comprising: regulating gallium concentration Co in accordance with the following formula through control of the strengths (J) of the gas flows (ml/min) forming the gas mixture. ##EQU3## where K is a constant of (0.5-2.0)×10 16 atoms/cm 3 and n is a constant between 1 and 2, when temperature in the source oven is approximately 950° C. and the temperature of the main oven is approximately 1250° C.
Claim 4
Independent Claim 23 words
A method according to claims 1 and 2, further comprising: varying said precisely dosed additions of dry oxygen while maintaining constant hydrogen content.

References Cited (Backward Citations)

US3492175A Cited
US3689330A Cited
US3770521A Cited
US3806382A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1983-08-12 1984-02-11 1984-08-12 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1987-08-12 1988-02-11 1988-08-12 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1991-08-12 1992-02-11 1992-08-12 $7700.00 Window Closed / Lapsed

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