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US4213808A Expired / Lapsed US ⏱️ 0.0 years remaining

Fabrication of injection lasers utilizing epitaxial growth and selective diffusion

Assignee: ITT Inc
•
Filing: 1978-03-30
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Granted: 1980-07-22
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Expires: 1998-03-30
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Abstract

Abstract Porous silica doped with zinc is used as a p-type dopant source in the construction of rib lasers. This is preferable to the method used in the parent case of growing a zinc doped layer because epitaxial growth is liable to be accompanied by zinc diffusion into regions where it is not required. Other modifications include allowing the zinc diffusion to go right through the active layer and to dimension the device so that lateral optical guidance is unaffected by the rib.

Inventors

  • 👤 George H. B. Thompson
  • 👤 David F. Lovelace

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 00:20
CPC Classifications
H; H10; H10H; H10H20/00; H10H20/80; H10H20/81; H10H20/811; H10H20/822; H10H20/824

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 193 words
A method of making a double heterostructure injection laser of III-V material, the method including the steps of: forming by epitaxial growth a double heterostructure wherein an active layer of semiconductor material is sandwiched between upper and lower layers of higher band-gap semiconductor material, and wherein the upper layer is provided with a p-n junction dividing a lower part having the same conductivity type as that of the active layer and the lower layer from an upper part having the opposite conductivity type; growing a layer of semiconductor material of the opposite conductivity than that of the upper part on upper layer, thereby producing a p-n junction which restricts current flow upon being reverse biased during the operation of the laser; delineating a stripe on the upper surface of the semiconductive material; and diffusing through said stripe a conductivity type determining dopant of the type opposite that of the active layer and of greater mobility than that used in the provision of the three layers of the heterostructure until the region of the p-n junction underlying the stripe is translated downwardly halting at the heterojunction between the active layer and the lower layer.
Claim 2
Independent Claim 193 words
A method of making a double heterostructure injection laser of III-V material, the method including the steps of: forming by epitaxial growth a double heterostructure wherein an active layer of semiconductor material is sandwiched between upper and lower layers of higher band-gap semiconductor material, and wherein the upper layer is provided with a p-n junction dividing a lower part having the same conductivity type as that of the active layer and the lower layer from an upper part having the opposite conductivity type; growing a layer of semiconductor material of the opposite conductivity than that of the upper part on upper layer, thereby producing a p-n junction which restricts current flow upon being reverse biased during the operation of the laser; delineating a stripe on the upper surface of the semiconductive material; and diffusing through said stripe a conductivity type determining dopant of the type opposite that of the active layer and of greater mobility than that used in the provision of the three layers of the heterostructure until the region of the p-n junction underlying the stripe is translated downwardly halting at the heterojunction between the active layer and the lower layer.
Claim 3
Dependent Claim 19 words
A method as claimed in claim 1 wherein the laser material is Ga 1-x Al x As, where x≧0.
Claim 4
Dependent Claim 19 words
A method as claimed in claim 1 wherein the laser material is Ga 1-x In x As, where x≧0.
Claim 5
Dependent Claim 26 words
A method as claimed in claim 1 wherein the laser material is Ga 1-x In x As 1-y P y , where x24 0 and y≧0.
Claim 6
Dependent Claim 15 words
A method as claimed in claim 1 wherein the dopant diffused through strips is zinc.
Claim 7
Dependent Claim 99 words
A method as claimed in claim 1, 2, 3, 4 or 5 wherein the stripe is delineated by depositing a porous layer of silicon dioxide on the surface of the semiconductive material and by selectively removing portions of said layer to leave a residual strip of the porous material, and wherein diffusion through said stripe on the surface of the semiconductive material is from a source of the dopant contained in the pores of the strip, said dopant having been deposited in the pores of the layer prior to the removal of the portions thereof to form said strip.

References Cited (Backward Citations)

US3352725A Cited
US3783351A Cited
US3911376A Cited
US3728784A Cited
US3733561A Cited
US3982261A Cited
US3982261B1 Cited
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US4011113A Cited
US4105955A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1983-07-22 1984-01-21 1984-07-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1987-07-22 1988-01-21 1988-07-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1991-07-22 1992-01-21 1992-07-22 $7700.00 Window Closed / Lapsed

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