Integrator with dielectric absorption correction

Claim 2

In an electronic integrating circuit, including an amplifier with input and output terminals, and an integrating capacitor, connected between said terminals, having dielectric absorption, the dielectric absorption causing an error voltage build-up on said integrating capacitor following an integration interval, wherein the improvement comprises: a second amplifier having respective input and output terminals; a second capacitor having one terminal connected to the second amplifier output terminal; and switch means for selectively coupling, in sequence, (1) immediately following an integration interval, the first amplifier output terminal to the second amplifier input terminal for sampling said error voltage and charging said second capacitor to a sampled voltage representing said error voltage, and (2) during the next integration interval, the other terminal of said second capacitor to the first amplifier input terminal for transferring said sampled voltage to said integrating capacitor to substantially counteract said error voltage during the next integration interval.

Claim 3

The improvement of claim 1, wherein said switch means includes means for coupling said other terminal of said second capacitor to ground immediately following an integration interval for charging said second capacitor to said sampled voltage representing said error voltage.

Claim 4

The improvement of claim 1, wherein said second amplifier includes a signal inverting input terminal and said switch means includes means for coupling said second amplifier signal inverting input terminal to said integrating circuit for sampling said error voltage after integration.

Claim 5

The improvement of claim 3, wherein said second amplifier includes a signal non-inverting input terminal and said switch means includes means for coupling said second amplifier signal non-inverting input terminal to ground and decoupling said second amplifier signal inverting input terminal from said integrating capacitor during an integration interval.

Claim 6

In an electronic integrating circuit, including an integrating amplifier with input and output terminals, and an integrating capacitor, connected between said terminals, having dielectric absorption, the dielectric absorption causing an error voltage upon integration, wherein the improvement comprises: sample means for sampling the error voltage immediately after integration and prior to the next integration interval to develop a sampled voltage representative of said error voltage; said sample means including, a sampling capacitor for accumulating a charging level proportional to said error voltage, sampling amplifier means including a sampling amplifier having an output connected to the sampling capacitor input, first gate means connected immediately the sampling amplifier input and the integrating amplifier output terminal, and second gate means connected intermediate the sampling capacitor output and said integrating amplifier input terminal; and transfer means for transferring said sampled voltage to said integrating capacitor during the next integration interval to compensate for said error voltage.

Claim 7

In an electronic integrating circuit, including an integrating amplifier with input and output terminals, and an integrating capacitor, connected between said terminals, having dielectric absorption, the dielectric absorption causing an error voltage upon integration, wherein the improvement comprises: sample means for sampling the error voltage immediately after integration and prior to the next integration interval to develop a sampled voltage representative of said error voltage; said sample means including, a sampling capacitor for accumulating a charging level proportional to said error voltage, sampling amplifier means including a sampling amplifier having an output connected to the sampling capacitor input, first gate means connected immediately the sampling amplifier input and the integrating amplifier output terminal, and second gate means connected intermediate the sampling capacitor output and said integrating amplifier input terminal; and transfer means for transferring said sampled voltage to said integrating capacitor during the next integration interval to compensate for said error voltage.

Claim 8

The improvement of claim 5, wherein said sample means and said transfer means includes timed control means for sequentially operating said first gate means after integration to enable said sampling capacitor to accumulate said charging level proportional to said error voltage, and thereafter operating said second gate means during the next integration interval to transfer said accumulated charging level from said sampling capacitor to said integrating capacitor to substantially eliminate said error voltage.

Claim 9

In an electronic integrating circuit, including an integrating amplifier with input and output terminals, and an integrating capacitor, connected between said terminals, having dielectric absorption, the dielectric absorption causing an error voltage upon integration, wherein the improvement comprises: sample means for sampling the error voltage immediately after integration and prior to the next integration interval to develop a sampled voltage representative of said error voltage; transfer means for transferring said sampled voltage to said integrating capacitor during the next integration interval to compensate for said error voltage; and timed control means defining a sampling interval and an integrating interval, said timed control means coupled to said sample means and said transfer means for controlling said sampling of said error voltage during the sampling interval, and the transfer of said sampled voltage to said integrating capacitor during the integrating interval.

Claim 10

In an electronic integrating circuit, including an integrating amplifier with input and output terminals, and an integrating capacitor, connected between said terminals, having dielectric absorption, the dielectric absorption causing an error voltage upon integration, wherein the improvement comprises: sample means for sampling the error voltage immediately after integration and prior to the next integration interval to develop a sampled voltage representative of said error voltage; transfer means for transferring said sampled voltage to said integrating capacitor during the next integration interval to compensate for said error voltage; and timed control means defining a sampling interval and an integrating interval, said timed control means coupled to said sample means and said transfer means for controlling said sampling of said error voltage during the sampling interval, and the transfer of said sampled voltage to said integrating capacitor during the integrating interval.

Claim 11

In an electronic integrating circuit, including an integrating amplifier with input and output terminals, and an integrating capacitor, connected between said terminals, having dielectric absorption, the dielectric absorption causing an error voltage upon integration, wherein the improvement comprises: sample means for sampling the error voltage immediately after integration and prior to the next integration interval to develop a sampled voltage representative of said error voltage, said sample means including; a sampling capacitor having an input terminal coupled to said integrating amplifier and said integrating capacitor at said integrating amplifier output terminal, and an output terminal selectively coupled to said integrating capacitor at said integrating amplifier input terminal, said sampling capacitor selectively coupled to said integrating amplifier output terminal immediately after an integration interval for accumulating a charging level proportional to said error voltage; transfer means for transferring said sampled voltage from said sampled capacitor to said integrating capacitor during the next integration interval to compensate for said error voltage; said transfer means including gate means actuable immediately upon initiation of said next integration interval to immediately transfer said charging level on said sampling capacitor to said integration capacitor, resulting in a voltage step at said integration amplifier output terminal opposite in polarity to the voltage present immediately prior to the initiation of said next integration interval.

Claim 12

In an electronic integrating circuit, including an integrating amplifier with input and output terminals, and an integrating capacitor, connected between said terminals, having dielectric absorption, the dielectric absorption causing an error voltage upon integration, wherein the improvement comprises: sample means for sampling the error voltage immediately after integration and prior to the next integration interval to develop a sampled voltage representative of said error voltage, said sample means including; a sampling capacitor having an input terminal coupled to said integrating amplifier and said integrating capacitor at said integrating amplifier output terminal, and an output terminal selectively coupled to said integrating capacitor at said integrating amplifier input terminal, said sampling capacitor selectively coupled to said integrating amplifier output terminal immediately after an integration interval for accumulating a charging level proportional to said error voltage; transfer means for transferring said sampled voltage from said sampled capacitor to said integrating capacitor during the next integration interval to compensate for said error voltage; said transfer means including gate means actuable immediately upon initiation of said next integration interval to immediately transfer said charging level on said sampling capacitor to said integration capacitor, resulting in a voltage step at said integration amplifier output terminal opposite in polarity to the voltage present immediately prior to the initiation of said next integration interval.

Claim 13

The improvement of claim 8, wherein said transfer means further includes a first resistor (R 34 ) having one end connected to the input of said sampling capacitor (C 28 ), a second resistor (R 32 ) having one end connected to said integrating capacitor (C 18 ) output, and means connecting said other ends of said first and second resistors, wherein the magnitude of said voltage step is a product ratio, R 34 C 28 /R 32 C 18 .