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US4183035A Expired / Lapsed US ⏱️ 0.0 years remaining

Inverted heterojunction photodiode

Assignee: Boeing North American Inc
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Filing: 1978-06-26
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Granted: 1980-01-08
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Expires: 1998-06-26
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Abstract

Abstract A low-leakage, heterojunction photodiode for use as a detector sensitive to infrared radiation is provided. The diode structure comprises a PbTe substrate of n-type conductivity with an n-type epitaxial buffer layer on the substrate and an epitaxial active layer on the buffer layer. The buffer layer is either Pb(1-x)SxTe or Pb1-xSexTe with the atomic fraction of S or Se, x, being greater than 0 but less than 0.1. The active layer is Pb1-ySnyTe with the atomic fraction of Sn, y, being greater than 0 but less than 0.3. There is a p-n junction created in the active layer with the n side of the junction being adjacent the buffer layer. Metal is deposited on the substrate and on the active layer to provide electrical contact to the diode.

Inventors

  • 👤 Cheng-Chi Wang
  • 👤 John G. Pasko
  • 👤 Joseph T. Longo
  • 👤 John E. Clarke

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 08:00
CPC Classifications
H; H04; H04B; H04B10/00; H04B10/40; H04B10/43; H10; H10F; H10F30/00; H10F30/20; H10F30/21; H10F30/22; H10F30/222; H10F30/24; H10F39/00; H10F39/10; H10F39/12; H10F39/18; H10F39/184; H10F77/00; H10F77/10; H10F77/12; H10F77/127; Y; Y10; Y10S; Y10S438/00; Y10S438/912

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 138 words
A semiconducting device comprising: a substrate comprising a PbTe crystal of n-type conductivity; an epitaxial buffer layer of Pb.sub.(1-x) X x Te of n-type conductivity on said substrate, wherein X is a Group VI element selected from the group consisting of S and Se and wherein x is a value greater than 0 but less than 0.1; an epitaxial active layer of Pb.sub.(1-y) Sn y Te on said buffer layer, wherein y is a value greater than 0 but less than 0.3, said active layer forming a heterojunction between said active layer and said buffer layer; a p-n junction located outside said buffer layer in either said active layer or in said heterojunction, the n side of said p-n junction being adjacent said buffer layer; and electrical contact means coupled to said substrate and to said active layer.
Claim 2
Dependent Claim 138 words
A semiconducting device comprising: a substrate comprising a PbTe crystal of n-type conductivity; an epitaxial buffer layer of Pb.sub.(1-x) X x Te of n-type conductivity on said substrate, wherein X is a Group VI element selected from the group consisting of S and Se and wherein x is a value greater than 0 but less than 0.1; an epitaxial active layer of Pb.sub.(1-y) Sn y Te on said buffer layer, wherein y is a value greater than 0 but less than 0.3, said active layer forming a heterojunction between said active layer and said buffer layer; a p-n junction located outside said buffer layer in either said active layer or in said heterojunction, the n side of said p-n junction being adjacent said buffer layer; and electrical contact means coupled to said substrate and to said active layer.
Claim 3
Dependent Claim 149 words
A focal plane comprising: a plurality of mesa photodiodes on a PbTe substrate of n-type conductivity, and wherein each of said mesa diodes comprises: an epitaxial buffer layer of Pb.sub.(1-x) X x Te of n-type conductivity on said substrate, wherein X is a Group VI element selected from the group consisting of S and Se and wherein x is a value greater than 0 but less than 0.1; an epitaxial active layer of Pb.sub.(1-y) Sn y Te on said buffer layer, wheren y is a value greater than 0 but less than 0.3, said active layer forming a heterojunction between said active layer and said buffer layer; a p-n junction located outside said buffer layer in either said active layer or in said heterojunction, the n side of said p-n junction being adjacent said buffer layer; and electrical contact means coupled to said substrate and to said active layer.
Claim 4
Dependent Claim 149 words
A focal plane comprising: a plurality of mesa photodiodes on a PbTe substrate of n-type conductivity, and wherein each of said mesa diodes comprises: an epitaxial buffer layer of Pb.sub.(1-x) X x Te of n-type conductivity on said substrate, wherein X is a Group VI element selected from the group consisting of S and Se and wherein x is a value greater than 0 but less than 0.1; an epitaxial active layer of Pb.sub.(1-y) Sn y Te on said buffer layer, wheren y is a value greater than 0 but less than 0.3, said active layer forming a heterojunction between said active layer and said buffer layer; a p-n junction located outside said buffer layer in either said active layer or in said heterojunction, the n side of said p-n junction being adjacent said buffer layer; and electrical contact means coupled to said substrate and to said active layer.
Claim 5
Dependent Claim 120 words
A photodiode comprising: a substrate comprising a PbTe crystal of n-type conductivity; an epitaxial buffer layer of Pb.sub.(1-x) S x Te of n-type conductivity on said substrate, wherein x is a value greater than 0 but less than 0.1; an epitaxial active layer of Pb.sub.(1-y) Sn y Te on said buffer layer, wherein y is a value greater than 0 but less than 0.3, said active layer forming a heterojunction between said active layer and said buffer layer; a p-n junction located outside said buffer layer in either said active layer or in said heterojunction, the n side of said p-n junction being adjacent said buffer layer; and electrical contact means coupled to said substrate and to said active layer.
Claim 6
Dependent Claim 120 words
A photodiode comprising: a substrate comprising a PbTe crystal of n-type conductivity; an epitaxial buffer layer of Pb.sub.(1-x) S x Te of n-type conductivity on said substrate, wherein x is a value greater than 0 but less than 0.1; an epitaxial active layer of Pb.sub.(1-y) Sn y Te on said buffer layer, wherein y is a value greater than 0 but less than 0.3, said active layer forming a heterojunction between said active layer and said buffer layer; a p-n junction located outside said buffer layer in either said active layer or in said heterojunction, the n side of said p-n junction being adjacent said buffer layer; and electrical contact means coupled to said substrate and to said active layer.
Claim 7
Dependent Claim 120 words
A photodiode comprising: a substrate comprising a PbTe crystal of n-type conductivity; an epitaxial buffer layer of Pb.sub.(1-x) Se x Te on n-type conductivity on said substrate, wherein x is a value greater than 0 but less than 0.1; an epitaxial active layer of Pb.sub.(1-y) Sn y Te on said buffer layer, wherein y is a value greater than 0 but less than 0.3, said active layer forming a heterojunction between said active layer and said buffer layer; a p-n junction located outside said buffer layer in either said active layer or in said heterojunction, the n side of said p-n junction being adjacent said buffer layer; and electrical contact means coupled to said substrate and to said active layer.
Claim 8
Dependent Claim 120 words
A photodiode comprising: a substrate comprising a PbTe crystal of n-type conductivity; an epitaxial buffer layer of Pb.sub.(1-x) Se x Te on n-type conductivity on said substrate, wherein x is a value greater than 0 but less than 0.1; an epitaxial active layer of Pb.sub.(1-y) Sn y Te on said buffer layer, wherein y is a value greater than 0 but less than 0.3, said active layer forming a heterojunction between said active layer and said buffer layer; a p-n junction located outside said buffer layer in either said active layer or in said heterojunction, the n side of said p-n junction being adjacent said buffer layer; and electrical contact means coupled to said substrate and to said active layer.
Claim 9
Independent Claim 165 words
A method of fabricating a semiconducting device comprising the steps of: providing a substrate comprising PbTe crystal of n-type conductivity; epitaxially growing a buffer layer of Pb.sub.(1-x) X x Te n-type conductivity on said substrate, wherein X is a Group VI element selected from the group consisting of S and Se and wherein x is a value greater than 0 but less than 0.1; epitaxially growing an active layer of Pb.sub.(1-y) Sn y Te on said buffer layer, wherein y is a value greater than 0 but less than 0.3, said active layer forming a heterojunction between said active layer and said buffer layer; annealing said substrate, buffer layer, and active layer at approximately 450° C. for approximately 20 hours to form a p-n junction located outside said buffer layer in either said active layer or in said heterojunction, the n side of said p-n junction being adjacent said buffer layer; and depositing electrical contact means coupled to said substrate and to said active layer.
Claim 10
Independent Claim 165 words
A method of fabricating a semiconducting device comprising the steps of: providing a substrate comprising PbTe crystal of n-type conductivity; epitaxially growing a buffer layer of Pb.sub.(1-x) X x Te n-type conductivity on said substrate, wherein X is a Group VI element selected from the group consisting of S and Se and wherein x is a value greater than 0 but less than 0.1; epitaxially growing an active layer of Pb.sub.(1-y) Sn y Te on said buffer layer, wherein y is a value greater than 0 but less than 0.3, said active layer forming a heterojunction between said active layer and said buffer layer; annealing said substrate, buffer layer, and active layer at approximately 450° C. for approximately 20 hours to form a p-n junction located outside said buffer layer in either said active layer or in said heterojunction, the n side of said p-n junction being adjacent said buffer layer; and depositing electrical contact means coupled to said substrate and to said active layer.

References Cited (Backward Citations)

US4021836A Cited
US4048535A Cited
US4053919A Cited
US4075043A Cited
US4064621A Cited
US4080723A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1983-01-07 1983-07-09 1984-01-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1987-01-07 1987-07-09 1988-01-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1991-01-07 1991-07-09 1992-01-08 $7700.00 Window Closed / Lapsed

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