US4177093A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of fabricating conducting oxide-silicon solar cells utilizing electron beam sublimation and deposition of the oxide
Assignee: BP Solar International LLC
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Filing: 1978-11-22
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Granted: 1979-12-04
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Expires: 1998-11-22
Abstract
Abstract In preparing tin oxide and indium tin oxide-silicon heterojunction solar cells by electron beam sublimation of the oxide and subsequent deposition thereof on the silicon, the engineering efficiency of the resultant cell is enhanced by depositing the oxide at a predetermined favorable angle of incidence. Typically the angle of incidence is between 40° and 70° and preferably between 55° and 65° when the oxide is tin oxide and between 40° and 70° when the oxide deposited is indium tin oxide. gi The Government of the United States of America has rights in this invention pursuant to Department of Energy Contract No. EY-76-C-03-1283.
Inventors
- 👤 Tom Feng
- 👤 Amal K. Ghosh
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 23:34
CPC Classifications
C; C23; C23C; C23C14/00; C23C14/22; C23C14/225; C23C14/24; H; H10; H10P; H10P14/00; H10P14/20; H10P14/22; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/34; H10P14/3402; H10P14/3434; H10P14/3438; H10P14/3441; H10P14/3442
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
89 words
In the process of preparing a heterojunction device having an N-type oxide selected from tin oxide and indium tin oxide coating on N-type silicon substrate by directing an electron beam generated vapor stream of said oxide to impinge on said silicon substrate whereby the oxide is deposited thereon, the improvement comprising directing said vapor stream to impinge on said substrate such that the angle of incidence is sufficient to provide a maximum in the engineering efficiency of the cell wherein said angle of incidence is between 40 and 70.
Claim 2
Dependent Claim
89 words
In the process of preparing a heterojunction device having an N-type oxide selected from tin oxide and indium tin oxide coating on N-type silicon substrate by directing an electron beam generated vapor stream of said oxide to impinge on said silicon substrate whereby the oxide is deposited thereon, the improvement comprising directing said vapor stream to impinge on said substrate such that the angle of incidence is sufficient to provide a maximum in the engineering efficiency of the cell wherein said angle of incidence is between 40 and 70.
Claim 3
Dependent Claim
21 words
The improvement of claim 1 wherein the oxide is tin oxide and the angle of incidence is between 55° and 65°.
Claim 4
Dependent Claim
33 words
The improvement of claim 1 wherein the oxide is indium tin oxide having an indium oxide to tin oxide molar ratio of 9:1 and the angle of incidence is between 40° and 70°.
Claim 5
Independent Claim
118 words
A method of fabricating a heterojunction device having a N-type conducting oxide layer on an N-type silicon substrate comprising: (a) providing an N-type silicon semiconductor body in a vacuum chamber; (b) providing an oxide powder in said vacuum chamber selected from tin oxide and a mixture of indium oxide and tin oxide having a molar ratio of 9:1; (c) evacuating said chamber; (d) directing an electron beam onto said oxide powder whereby a stream of oxide vapor is generated; (e) directing said stream of oxide vapor to impinge on said silicon body at an angle of incidence ranging from about 40° to about 70° whereby an oxide coating is deposited on said silicon thereby forming a heterojunction device.
Claim 6
Independent Claim
118 words
A method of fabricating a heterojunction device having a N-type conducting oxide layer on an N-type silicon substrate comprising: (a) providing an N-type silicon semiconductor body in a vacuum chamber; (b) providing an oxide powder in said vacuum chamber selected from tin oxide and a mixture of indium oxide and tin oxide having a molar ratio of 9:1; (c) evacuating said chamber; (d) directing an electron beam onto said oxide powder whereby a stream of oxide vapor is generated; (e) directing said stream of oxide vapor to impinge on said silicon body at an angle of incidence ranging from about 40° to about 70° whereby an oxide coating is deposited on said silicon thereby forming a heterojunction device.
Claim 7
Dependent Claim
32 words
The method of claim 4 wherein said electron beam is swept across the surface of said oxide whereby the angle of incidence is maintained substantially constant during said deposition of said oxide.
Claim 8
Dependent Claim
41 words
The method of claim 5 wherein said stream of oxide vapor is directed to impinge on said substrate for a time sufficient to deposit a layer of said oxide on said substrate ranging from about 300 to about 2000 Angstroms thick.
Claim 9
Dependent Claim
32 words
The method of claim 6 wherein said coated substrate is heated in air at from about 250° C. to about 400° C. for a time sufficient to render the oxide coating conductive.
Claim 10
Dependent Claim
16 words
The method of claim 7 including deposition of metal electrodes on said coated and heated substrate.
Claim 11
Dependent Claim
22 words
The method of claim 8 wherein said oxide is tin oxide and wherein said angle of incidence is between 55° and 65°.
Claim 12
Dependent Claim
35 words
The method of claim 8 wherein said oxide powder is a mixture of indium oxide and tin oxide in the molar ratio of 9:1 and wherein the angle of incidence is between 50° and 70°.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1982-12-03 | 1983-06-04 | 1983-12-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1986-12-03 | 1987-06-04 | 1987-12-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1990-12-03 | 1991-06-04 | 1991-12-04 | $7700.00 | Window Closed / Lapsed |