MNOS BORAM sense amplifier/latch

Claim 2

A sense latch circuit selectively operable in a read or write mode for reading and writing binary information out of or into a block oriented random access memory comprising: a bistable latch, comprised of a plurality of cross coupled transistors and having two output nodes for providing first and second stable latch outputs corresponding to binary information; a shift register coupled to one of the nodes; a dummy load coupled to the other of the nodes; a plurality of associative memory cells coupled to the nodes, each cell comprised of first and second field effect memory transistors, each memory transistor having a plurality of threshold voltages, a source terminal, a drain terminal and a gate terminal, coupled together at their respective drain terminals and to a separate one of the nodes at their respective source terminals; means for decoding a binary address and selectively addressing an individual cell to cause a row address voltage to be applied to the gate terminal of each of the memory transistors of the selected cell, the conduction of each memory transistor being dependent on its respective threshold voltage and the row address voltage; amplifying means coupled to the nodes for causing the latch to switch faster in response to the differential conduction between the memory transistors of the selected cell; write means coupled to the latch nodes for shorting the source and drain terminals of the memory transistors of a selected memory cell during the write mode; precharge means coupled to the latch nodes for precharging the latch nodes.

Claim 3

The sense amplifier/latch of claim 1 including analog test means for operating the sense amplifier/latch in a memory test mode, wherein the analog test means comprises: a first voltage source of sufficient magnitude to cause the latch to assume one of its stable outputs; first and second transistor means, each coupled to a separate one of the nodes, for selectively coupling the first voltage source to a separate one of the nodes; means for controlling the first and second transistor means and incrementing or decrementing the row address voltage over successive memory test operations until the latch output switches from the output induced by the first voltage source, the voltage at which the latch switches corresponding to the analog threshold of the selected memory transistor.

Claim 4

The sense amplifier/latch as set forth in claim 2 wherein the amplifying means comprises: first and second field effect transistors, each having a source terminal, a drain terminal and a gate terminal, series connected at their drain terminals, the source terminal of each of said first and second field effect transistors connected to a separate one of the nodes; a second voltage source connected to the common connected drain terminals of the first and second field effect transistors; means connected to the gate terminals of said first and second field effect transistor for causing the transistors to conduct and couple the second voltage source to the latch nodes.

Claim 5

The sense amplifier/latch circuit as set forth in claim 1 wherein each of the memory transistors comprises an MNOS field effect transistor.

Claim 6

The sense amplifier/latch as set forth in claim 3 fabricated as an integrated circuit.

Claim 7

A sense amplifier/latch circuit selectively operable in a read, write or memory test mode for reading and writing binary information out of or into a block oriented random access memory or for testing the respective analog threshold voltages of each memory transistor in the memory array comprising: a bistable latch comprised of a plurality of cross coupled transistors and having two output nodes for providing first and second stable latch outputs corresponding to binary information; a shift register coupled to one of the nodes; a dummy load coupled to the other of the nodes; a plurality of associative memory cells coupled to the nodes, each cell comprised of first and second field effect memory transistors, each memory transistor having a plurality of theshold voltages, a source terminal, a drain terminal and a gate terminal, coupled together at their respective drain terminals and to a separate one of the nodes at their respective source terminals; means for decoding a binary address and selectively addressing an individual cell to cause a row address voltage to be applied to the gate terminal of each of the memory transistors of the selected cell, the conduction of each memory transistor being dependent on its respective threshold voltage and the row address voltage; amplifying means coupled to the nodes for causing the latch to switch faster in response to the differential conduction between the memory transistors of the selected cell comprising: first and second field effect transistors, each having a source terminal, a drain terminal and a gate terminal, series connected at their drain terminals, the source terminal of each of said first and second field effect transistors connected to a separate one of the nodes; a second voltage source connected to the common connected drain terminals of the first and second field effect transistors; means connected to the gate terminals of said first and second field effect transistors for causing the transistors to conduct and couple the second voltage source to the latch nodes; write means coupled to the latch nodes for shorting the source and drain terminals of the memory transistors of a selected memory cell during the write mode; precharge means coupled to the latch nodes for precharging the latch nodes; analog test means for operating the latch in a memory test mode comprising: a first voltage source of sufficient magnitude to cause the latch to assume one of its stable outputs; first and second transistor means, each coupled to a separate one of the nodes, for selectively coupling the first voltage source to a separate one of the nodes; means for controlling the first and second transistor means and incrementing or decrementing th row address voltage over successive memory test operations until the latch output switches from the output induced by the first voltage source, the voltage at which the latch switches corresponding to the analog threshold of the selected memory transistor.

Claim 8

A sense amplifier/latch circuit selectively operable in a read, write or memory test mode for reading and writing binary information out of or into a block oriented random access memory or for testing the respective analog threshold voltages of each memory transistor in the memory array comprising: a bistable latch comprised of a plurality of cross coupled transistors and having two output nodes for providing first and second stable latch outputs corresponding to binary information; a shift register coupled to one of the nodes; a dummy load coupled to the other of the nodes; a plurality of associative memory cells coupled to the nodes, each cell comprised of first and second field effect memory transistors, each memory transistor having a plurality of theshold voltages, a source terminal, a drain terminal and a gate terminal, coupled together at their respective drain terminals and to a separate one of the nodes at their respective source terminals; means for decoding a binary address and selectively addressing an individual cell to cause a row address voltage to be applied to the gate terminal of each of the memory transistors of the selected cell, the conduction of each memory transistor being dependent on its respective threshold voltage and the row address voltage; amplifying means coupled to the nodes for causing the latch to switch faster in response to the differential conduction between the memory transistors of the selected cell comprising: first and second field effect transistors, each having a source terminal, a drain terminal and a gate terminal, series connected at their drain terminals, the source terminal of each of said first and second field effect transistors connected to a separate one of the nodes; a second voltage source connected to the common connected drain terminals of the first and second field effect transistors; means connected to the gate terminals of said first and second field effect transistors for causing the transistors to conduct and couple the second voltage source to the latch nodes; write means coupled to the latch nodes for shorting the source and drain terminals of the memory transistors of a selected memory cell during the write mode; precharge means coupled to the latch nodes for precharging the latch nodes; analog test means for operating the latch in a memory test mode comprising: a first voltage source of sufficient magnitude to cause the latch to assume one of its stable outputs; first and second transistor means, each coupled to a separate one of the nodes, for selectively coupling the first voltage source to a separate one of the nodes; means for controlling the first and second transistor means and incrementing or decrementing th row address voltage over successive memory test operations until the latch output switches from the output induced by the first voltage source, the voltage at which the latch switches corresponding to the analog threshold of the selected memory transistor.

Claim 9

The sense amplifier/latch as set forth in claim 6 wherein each of the memory transistors is an MNOS field effect transistor.