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US4135952A Expired / Lapsed US ⏱️ 0.0 years remaining

Process for annealing semiconductor materials

Assignee: Raytheon Co
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Filing: 1977-10-03
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Granted: 1979-01-23
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Expires: 1997-10-03
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Abstract

Abstract The specification describes a process for annealing electronic material, and particularly semiconductor crystals, wherein the material is submerged in a molten solution which contains the element or elements which comprise the material as solute. The solution is maintained at a temperature near the point at which the melt is saturated with solute. However, the material being annealed is physically isolated from actual contact with the solution by a gas-porous and liquid-tight container in a manner that exposes the material only to equilibriating gases from the molten solution during the annealing process. Thus, dissociation and decomposition of a semiconductor material during annealing is prevented by these equilibriating gases while using this extremely simple, unique and novel procedure which insures that no solid (other than the material holder) or liquid makes actual contact with the semiconductor material being annealed. Such procedure eliminates both cleaning problems and precise vapor pressure control problems which are characteristic of the known prior art.

Inventors

  • 👤 C. Lawrence Anderson
  • 👤 Howard L. Dunlap

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 14:37
CPC Classifications
H; H10; H10P; H10P95/00; H10P95/90; H10P95/904

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 85 words
A process for annealing semiconductor materials and simultaneously preventing their crystal dissociation and decomposition comprising: (a) enclosing a semiconductor crystal in a liquid-tight and gas-porous container; (b) immersing said container in a solution containing the elemental component or components of said semiconductor crystal; and (c) maintaining said solution at a predetermined elevated anneal temperature, whereby said semiconductor crystal is brought into intimate contact with equilibriating elemental gases from said solution while being completely isolated from any direct physical contact with the source of said gases.
Claim 2
Dependent Claim 85 words
A process for annealing semiconductor materials and simultaneously preventing their crystal dissociation and decomposition comprising: (a) enclosing a semiconductor crystal in a liquid-tight and gas-porous container; (b) immersing said container in a solution containing the elemental component or components of said semiconductor crystal; and (c) maintaining said solution at a predetermined elevated anneal temperature, whereby said semiconductor crystal is brought into intimate contact with equilibriating elemental gases from said solution while being completely isolated from any direct physical contact with the source of said gases.
Claim 3
Dependent Claim 103 words
A process for annealing a solid body which comprises: (a) inserting said solid body into a material containing the element or elements of said body and creating a predefined isolation space surrounding said body, without allowing said material to physically contact said body, (b) passing gases from said material to said body whereby said solid body is exposed to chosen equilibriating ambient gases which tend to prevent dissociation or decomposition of said body, and (c) heating said solid body at a chosen anneal temperature and for a time sufficient to electrically activate said solid body or remove damage in the crystallographic structure thereof.
Claim 4
Dependent Claim 103 words
A process for annealing a solid body which comprises: (a) inserting said solid body into a material containing the element or elements of said body and creating a predefined isolation space surrounding said body, without allowing said material to physically contact said body, (b) passing gases from said material to said body whereby said solid body is exposed to chosen equilibriating ambient gases which tend to prevent dissociation or decomposition of said body, and (c) heating said solid body at a chosen anneal temperature and for a time sufficient to electrically activate said solid body or remove damage in the crystallographic structure thereof.

References Cited (Backward Citations)

US4026735A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1982-01-22 1982-07-24 1983-01-23 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1986-01-22 1986-07-24 1987-01-23 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1990-01-22 1990-07-24 1991-01-23 $7700.00 Window Closed / Lapsed

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