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US4096821A Expired / Lapsed US ⏱️ 0.0 years remaining

System for fabricating thin-film electronic components

Assignee: Townsend and Townsend Khourie and Crew
•
Filing: 1976-12-13
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Granted: 1978-06-27
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Expires: 1996-12-13
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Abstract

Abstract A system is disclosed for fabricating thin-film electronic components upon a substrate. A unitary metal aperture mask is utilized which includes a plurality of linearly aligned aperture patterns formed in the unitary mask. The mask is coupled with a linear motion assembly, and an electro-optic sensor which reads position indicating alignment marks upon the mask to provide precise and accurate mask alignment during subsequent fabrication steps in the vacuum deposition process. This system avoids the use of individual deposition masks which must be successively aligned.

Inventors

  • 👤 Edwin W. Greeneich
  • 👤 William S. Escott

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 23:48
CPC Classifications
C; C23; C23C; C23C14/00; C23C14/04; C23C14/042; H; H10; H10P; H10P72/00; H10P72/50; H10P72/57

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 213 words
A system for fabricating thin-film electronic components upon a substrate comprising: (a) an evacuable chamber connectable to a vacuum system; and within the chamber are disposed, (b) at least one evaporant material source; (c) a substrate holder alignable with the evaporant source; (d) movable aperture mask means comprising guide means on which is movably mounted a mask holder, a unitary elongated aperture mask supported by the mask holder between the substrate holder and the aligned evaporant source, which aperture mask has discrete spaced apart aperture patterns in a linear array, which guide means are linear parallel rails extending in the direction of the linear array of aperture patterns, with the mask holder slidably mounted on said rails so that the aperture mask is constrained to movement in the direction of the linear array, and wherein the aperture mask has light reflective or absorptive alignment position indicia disposed thereon aligned with each of the discrete spaced apart aperture patterns; and (e) position indicia sensing and indicating means including fiber optic means, aligned with the substrate holder and the evaporant source, for directing light onto the aperture mask position indicia and for collecting light from the position indicia to permit determining when a desired aperture pattern is aligned between the evaporant source and the substrate.
Claim 2
Independent Claim 213 words
A system for fabricating thin-film electronic components upon a substrate comprising: (a) an evacuable chamber connectable to a vacuum system; and within the chamber are disposed, (b) at least one evaporant material source; (c) a substrate holder alignable with the evaporant source; (d) movable aperture mask means comprising guide means on which is movably mounted a mask holder, a unitary elongated aperture mask supported by the mask holder between the substrate holder and the aligned evaporant source, which aperture mask has discrete spaced apart aperture patterns in a linear array, which guide means are linear parallel rails extending in the direction of the linear array of aperture patterns, with the mask holder slidably mounted on said rails so that the aperture mask is constrained to movement in the direction of the linear array, and wherein the aperture mask has light reflective or absorptive alignment position indicia disposed thereon aligned with each of the discrete spaced apart aperture patterns; and (e) position indicia sensing and indicating means including fiber optic means, aligned with the substrate holder and the evaporant source, for directing light onto the aperture mask position indicia and for collecting light from the position indicia to permit determining when a desired aperture pattern is aligned between the evaporant source and the substrate.

References Cited (Backward Citations)

US2614524A Cited
US3205855A Cited
US3117025A Cited
US3230109A Cited
FR1597032A Cited
US3636917A Cited
US3669060A Cited
US3747558A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1981-06-26 1981-12-26 1982-06-27 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1985-06-26 1985-12-26 1986-06-27 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1989-06-26 1989-12-26 1990-06-27 $7700.00 Window Closed / Lapsed

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