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US4091460A Expired / Lapsed US ⏱️ 0.0 years remaining

Quasi static, virtually nonvolatile random access memory cell

Assignee: United States Department of the Air Force
•
Filing: 1976-10-05
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Granted: 1978-05-23
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Expires: 1996-10-05
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Abstract

Abstract A nonvolatile Charge Injection Device (NOVCID) of Metal-Nitride-Oxide-Semiconductor (MNOS) material is operated in a novel manner in combination with a flip-flop to provide a charge pumped volatile memory storage system that can be continuously nondestructively read and on command, by applying a high positive potential to the field plate of the NOVCID, the information stored in the volatile mode is transferred to the nonvolatile state. To recover the stored information an alternating current signal is applied to the field plate.

Inventors

  • 👤 Fritz L. Schuermeyer
  • 👤 Charles R. Young

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 23:00
CPC Classifications
G; G11; G11C; G11C11/00; G11C11/21; G11C11/34; G11C11/40; G11C11/401; G11C11/402; G11C14/00; G11C16/00; G11C16/02; G11C16/04; G11C16/0466; H; H03; H03K; H03K3/00; H03K3/02; H03K3/353; H03K3/356; H03K3/356008

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 215 words
A nonvolatile information storage cell for a storage system having a charge pump line, a bit line, a bit line, and a word line, said cell comprising: a. a flip-flop including a first and a second metal oxide semiconductor field effect transistors having a respective first load line and a respective second load line; b. a first metal-nitride-oxide-semiconductor nonvolatile charge injection device having a field plate and a diffusion connection, the said diffusion connection connected to the said first load line; c. a second metal-nitride-oxide-semiconductor nonvolatile charge injection device having a field plate and a diffusion connection, the said diffusion connection connected to the said second load line; d. means for connecting the said field plate of the said first nonvolatile charge injection device and the said field plate of the said second nonvolatile charge injection device to the said charge pump line; e. a first access metal oxide semiconductor field effect transistor cooperating with the said word line, the said bit line, and the said first load line; f. a second access metal oxide semiconductor field effect transistor, cooperating with the said word line, the said bit line, and the said second load line; and g. means including the said first and second access transistors to provide an input/output to the said storage cell.
Claim 2
Dependent Claim 215 words
A nonvolatile information storage cell for a storage system having a charge pump line, a bit line, a bit line, and a word line, said cell comprising: a. a flip-flop including a first and a second metal oxide semiconductor field effect transistors having a respective first load line and a respective second load line; b. a first metal-nitride-oxide-semiconductor nonvolatile charge injection device having a field plate and a diffusion connection, the said diffusion connection connected to the said first load line; c. a second metal-nitride-oxide-semiconductor nonvolatile charge injection device having a field plate and a diffusion connection, the said diffusion connection connected to the said second load line; d. means for connecting the said field plate of the said first nonvolatile charge injection device and the said field plate of the said second nonvolatile charge injection device to the said charge pump line; e. a first access metal oxide semiconductor field effect transistor cooperating with the said word line, the said bit line, and the said first load line; f. a second access metal oxide semiconductor field effect transistor, cooperating with the said word line, the said bit line, and the said second load line; and g. means including the said first and second access transistors to provide an input/output to the said storage cell.

References Cited (Backward Citations)

US3662351A Cited
US3662356A Cited
US3916390A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1981-05-22 1981-11-21 1982-05-23 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1985-05-22 1985-11-21 1986-05-23 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1989-05-22 1989-11-21 1990-05-23 $7700.00 Window Closed / Lapsed

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