Patent US4081674A successfully refreshed from Google Patents.
US4081674A
Expired / Lapsed
US
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Ion microprobe analyzer
Assignee: Hitachi Ltd
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Filing: 1976-12-20
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Granted: 1978-03-28
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Expires: 1996-12-20
Abstract
Abstract An ion microprobe analyzer capable of high-precision analyses, and which provides a beam made up of both ions and neutral particles includes an ion beam deflecting means made up of an aperture which is movable between a position on the ion beam optical axis and a position deviating from the optical axis. At least one first deflector is provided which deflects the ion beam towards the point to be occupied by the aperture situated at the deviating position while leaving the path of the neutral particles unaffected, and at least two second deflectors are provided which deflect the ion beam back towards the ion beam optical axis, so that in the vertical direction the ion beam which has passed through the aperture situated at the deviating position is returned to the optical axis. In this way either the ions or the neutral particles may be selected in accordance with the position of the aperture.
Inventors
- 👤 Hifumi Tamura
- 👤 Tohru Ishitani
- 👤 Tokuro Hirano
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 21:46
CPC Classifications
G; G01; G01N; G01N23/00; G01N23/22; G01N23/225; H; H01; H01J; H01J2237/00; H01J2237/244; H01J2237/25; H01J2237/2505; H01J2237/2555; H01J2237/2566
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
130 words
In an ion microprobe analyzer wherein a specimen is irradiated by a primary ion beam derived from an ion source and projected along an optical axis by a primary ion focusing system, and wherein secondary ions generated from the specimen are analyzed, the improvement comprising ion beam deflecting means disposed between said ion source and said specimen, including: a. an aperture which is movable between a position on the ion beam optical axis and a position deviating from said optical axis; b. first deflector means for deflecting said ion beam towards the point where the aperture is situated when at the deviating position; and c. second deflector means for deflecting forwards along said ion beam optical axis the ion beam which passes through said aperture situated at said deviating position.
Claim 2
Dependent Claim
130 words
In an ion microprobe analyzer wherein a specimen is irradiated by a primary ion beam derived from an ion source and projected along an optical axis by a primary ion focusing system, and wherein secondary ions generated from the specimen are analyzed, the improvement comprising ion beam deflecting means disposed between said ion source and said specimen, including: a. an aperture which is movable between a position on the ion beam optical axis and a position deviating from said optical axis; b. first deflector means for deflecting said ion beam towards the point where the aperture is situated when at the deviating position; and c. second deflector means for deflecting forwards along said ion beam optical axis the ion beam which passes through said aperture situated at said deviating position.
Claim 3
Dependent Claim
26 words
The ion microprobe analyzer according to claim 1, wherein said ion beam deflecting means is disposed between said ion source and said primary ion focusing system.
Claim 4
Dependent Claim
24 words
The ion microprobe analyzer according to claim 2, wherein a further aperture is disposed between said ion source and said ion beam deflecting means.
Claim 5
Dependent Claim
45 words
The ion microprobe analyzer according to claim 1, wherein said first deflector means is composed of two pairs of electrodes of the same size, and said second deflector means is composed of two pairs of electrodes of the same size as said first deflector electrodes.
Claim 6
Dependent Claim
36 words
The ion microprobe analyzer according to claim 4, wherein each of the four pairs of deflector electrodes consists of a pair of plate electrodes which are disposed on respective sides of said ion beam optical axis.
Claim 7
Dependent Claim
88 words
The ion microprobe analyzer according to claim 1, wherein said first deflector means is composed of one pair of deflector electrodes, said second deflector means is composed of one pair of deflector electrodes having the same size as that of the first pair of deflector electrodes and a second pair of deflector electrodes having a length double that of the first pair of deflector electrodes, said second pair of deflector electrodes being disposed so as to be closer to the movable aperture than the former pair of electrodes.
Claim 8
Dependent Claim
33 words
The ion microprobe analyzer according to claim 6, wherein each of said pairs of deflector electrodes consists of a pair of plate electrodes disposed on respective sides of said ion beam optical axis.
Claim 9
Dependent Claim
43 words
The ion microprobe analyzer according to claim 1, wherein said first and second deflector means have their positions fixed with respect to said ion beam optical axis, and said aperture is movable within a horizontal plane perpendicular to said ion beam optical axis.
Claim 10
Dependent Claim
27 words
The ion microprobe analyzer according to claim 1, wherein said ion beam deflecting means is movable within a horizontal plane perpendicular to said ion beam optical axis.
Claim 11
Dependent Claim
133 words
In an ion microprobe analyzer wherein a primary ion irradiation system is disposed on a rectilinear axis, a specimen is irradiated by a primary ion beam projected from an ion source by a primary ion focusing system and secondary ions generated from the specimen are analyzed, the improvement comprising ion beam deflecting means disposed between said ion source and said specimen, and including: a. an aperture which is movable between a position on said rectilinear axis and a position deviating from said axis, b. first deflector means which deflects said ion beam towards the position of the aperture when situated at the deviating position thereof, and c. second deflector means which deflect the ion beam forwards along said axis, the ion beam which has passed through said aperture situated at said deviating position.
Claim 12
Dependent Claim
133 words
In an ion microprobe analyzer wherein a primary ion irradiation system is disposed on a rectilinear axis, a specimen is irradiated by a primary ion beam projected from an ion source by a primary ion focusing system and secondary ions generated from the specimen are analyzed, the improvement comprising ion beam deflecting means disposed between said ion source and said specimen, and including: a. an aperture which is movable between a position on said rectilinear axis and a position deviating from said axis, b. first deflector means which deflects said ion beam towards the position of the aperture when situated at the deviating position thereof, and c. second deflector means which deflect the ion beam forwards along said axis, the ion beam which has passed through said aperture situated at said deviating position.
Claim 13
Dependent Claim
26 words
The ion microprobe analyzer according to claim 10, wherein said ion beam deflecting means is disposed between said ion source and said primary ion focusing system.
Claim 14
Dependent Claim
24 words
The ion microprobe analyzer according to claim 11, wherein a further aperture is disposed between said ion source and said ion beam deflecting means.
Claim 15
Dependent Claim
47 words
The ion microprobe analyzer according to claim 10, wherein said first deflector means is composed of two pairs of electrodes of the same size, and said second deflector means is composed of two pairs of electrodes of the same size as that of said first deflector means.
Claim 16
Dependent Claim
33 words
The ion microprobe analyzer according to claim 13, wherein each of the four pairs of deflector electrodes consists of a pair of plate electrodes which are disposed on respective sides of said axis.
Claim 17
Dependent Claim
110 words
In an ion microprobe analyzer wherein a specimen is irradiated by a particle beam projected along an optical axis from an ion source which produces a beam consisting of both ions and neutral particles, and wherein secondary ions generated from the specimen are analyzed, the improvement comprising ion beam deflecting means disposed between said ion source and said specimen, including: a. an aperture plate having an aperture which is positioned on said optical axis; and b. first deflector means positioned upstream of said aperture plate for deflecting the ions projected from said ion source away from said optical axis so as to allow only said neutral particles to pass therethrough.
Claim 18
Dependent Claim
110 words
In an ion microprobe analyzer wherein a specimen is irradiated by a particle beam projected along an optical axis from an ion source which produces a beam consisting of both ions and neutral particles, and wherein secondary ions generated from the specimen are analyzed, the improvement comprising ion beam deflecting means disposed between said ion source and said specimen, including: a. an aperture plate having an aperture which is positioned on said optical axis; and b. first deflector means positioned upstream of said aperture plate for deflecting the ions projected from said ion source away from said optical axis so as to allow only said neutral particles to pass therethrough.
Claim 19
Dependent Claim
73 words
The ion microprobe analyzer according to claim 15, further including positioning means for selectively moving at least said aperture plate to a position where the aperture thereof is aligned with the path of the ions deflected by said first deflector means so as to pass said ions while blocking said neutral particles, and second deflector means for deflecting the ions passing said aperture plate back to a path coincident with said optical axis.
Claim 20
Dependent Claim
32 words
The ion microprobe analyzer according to claim 16, wherein said positioning means effects movement of said aperture plate with respect to said first and second deflector means transversely to said optical axis.
Claim 21
Dependent Claim
34 words
The ion microprobe analyzer according to claim 16, wherein said positioning means effects movement of said aperture plate as well as said first and second deflector means transversely with respect to said optical axis.
Claim 22
Dependent Claim
37 words
The ion microprobe analyzer according to claim 16, further including a primary ion focusing system for focusing said ion beam, said ion beam deflecting means being disposed between said ion source and said primary ion focusing system.
Claim 23
Dependent Claim
88 words
The ion microprobe analyzer according to claim 16, wherein said first deflector means is composed of one pair of deflector electrodes, said second deflector means is composed of one pair of deflector electrodes having the same size as that of the first pair of deflector electrodes and a second pair of deflector electrodes having a length double that of the first pair of deflector electrodes, said second pair of deflector electrodes being disposed so as to be closer to the movable aperture than the former pair of electrodes.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1981-03-27 | 1981-09-26 | 1982-03-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1985-03-27 | 1985-09-26 | 1986-03-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1989-03-27 | 1989-09-26 | 1990-03-28 | $7700.00 | Window Closed / Lapsed |