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US4078980A
Expired / Lapsed
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Electrolytic chromium etching of chromium-layered semiconductor
Assignee: National Semiconductor Corp
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Filing: 1976-10-01
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Granted: 1978-03-14
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Expires: 1996-10-01
Abstract
Abstract A layer of chromium is removed from the metalization system on a silicon integrated circuit wafer that also includes copper and aluminum. By electrolytic etching in a sulfuric acid solution containing about 10% by volume water saturated with chromium sulfate, chromium can be removed without excessive removal of copper or aluminum.
Inventors
- 👤 James M. Harris
- 👤 William M. Gouin
- 👤 Bruce Gray
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 17:30
CPC Classifications
C; C25; C25F; C25F5/00; C25F3/00; C25F3/02; C25F3/08; H; H10; H10P; H10P50/00; H10P50/60; H10P50/66; H10P50/663; H10P50/667; H10W; H10W72/00; H10W72/01; H10W72/012; H10W72/20; H10W72/251; H10W72/252; H10W72/90; H10W72/921; H10W72/923; H10W72/951; H10W72/952
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
72 words
An electrolytic etching solution for removing chromium in the presence of at least one other metal that in normally attacked by chromium etching solutions, said solution comprising sulfuric acid and an amount of trivalent chromium salt effective to reduce removal of said other metal, said salt being introduced into said solution by the addition thereto of a compound selected from the group consisting of chromium sulfate, chromium chloride, and chromium potassium sulfate.
Claim 2
Dependent Claim
72 words
An electrolytic etching solution for removing chromium in the presence of at least one other metal that in normally attacked by chromium etching solutions, said solution comprising sulfuric acid and an amount of trivalent chromium salt effective to reduce removal of said other metal, said salt being introduced into said solution by the addition thereto of a compound selected from the group consisting of chromium sulfate, chromium chloride, and chromium potassium sulfate.
Claim 3
Dependent Claim
24 words
The solution of claim 1 wherein said salt comprises chromium sulfate in a concentration of at least about 5 grams per liter of acid.
Claim 4
Dependent Claim
18 words
The solution of claim 1 wherein said solution further includes up to about 20 percent by volume water.
Claim 5
Dependent Claim
42 words
The solution of claim 1 wherein electronic grade sulfuric acid is combined with about 10% by volume of water approximately saturated at about 25° centigrade with a salt selected from the group consisting of chromium sulfate, chromium chloride, and chromium potassium sulfate.
Claim 6
Dependent Claim
23 words
The solution of claim 4 wherein between about 5% and about 15% of said salt saturated water is combined with said sulfuric acid.
Claim 7
Dependent Claim
19 words
The solution of claim 1 wherein etching is achieved using a constant voltage source operating at about 5 volts.
Claim 8
Dependent Claim
109 words
The process of removing chromium from a metal system including at least one other metal selected from the group consisting of copper and aluminum on a silicon semiconductor wafer, said process characterized as removing said chromium without excessive removal of said one other metal and comprising the steps of: immersing said wafer in a solution of sulfuric acid containing trivalent chromium, said chromium being provided by including as a bath component a compound selected from the group consisting of chromium sulfate, chromium chloride, and chromium potassium sulfate, electrolytically etching said wafer, and continuing said etching until said chromium in contact with said solution is substantially removed from said wafer.
Claim 9
Dependent Claim
109 words
The process of removing chromium from a metal system including at least one other metal selected from the group consisting of copper and aluminum on a silicon semiconductor wafer, said process characterized as removing said chromium without excessive removal of said one other metal and comprising the steps of: immersing said wafer in a solution of sulfuric acid containing trivalent chromium, said chromium being provided by including as a bath component a compound selected from the group consisting of chromium sulfate, chromium chloride, and chromium potassium sulfate, electrolytically etching said wafer, and continuing said etching until said chromium in contact with said solution is substantially removed from said wafer.
Claim 10
Dependent Claim
24 words
The process of claim 7 wherein from 5 to 15% by volume of water approximately saturated with chromium sulfate is combined with sulfuric acid.
Claim 11
Dependent Claim
35 words
The process of claim 7 wherein said solution comprises sulfuric acid, up to about 20% by volume water and a salt selected from the group consisting of chromium sulfate, chromium chloride and chromium potassium sulfate.
Claim 12
Dependent Claim
20 words
The process of claim 6 wherein said electrolytic etching step employs a constant voltage source operating at about 5 volts.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1981-03-13 | 1981-09-12 | 1982-03-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1985-03-13 | 1985-09-12 | 1986-03-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1989-03-13 | 1989-09-12 | 1990-03-14 | $7700.00 | Window Closed / Lapsed |