US4051354A
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Fault-tolerant cell addressable array
Assignee: Texas Instruments Inc
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Filing: 1975-07-03
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Granted: 1977-09-27
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Expires: 1995-07-03
Abstract
Abstract A small programmable memory means such as an electrically programmable logic array is incorporated on the chip of a conventional bit addressable random access memory or other cell addressable array circuit. The array has one or more superfluous rows and/or columns of cells held in reserve. Processing and testing of the chip is conducted in a conventional manner. Chips with faulty cells are corrected by programming the memory means with the cell addresses of the faulty cell locations. Subsequently, the memory means will respond to any of these addresses and, through interaction with either the address decoding logic or input/output logic, cause a reserve cell or the contents thereof to be selected instead of the faulty cell.
Inventors
- 👤 William Clay Choate
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 00:20
CPC Classifications
G; G11; G11C; G11C29/00; G11C29/70; G11C29/78; G11C29/80; G11C29/808; H; H03; H03K; H03K19/00; H03K19/003; H03K19/02; H03K19/173; H03K19/177; H03K19/17704; H03K19/17724; H03K19/17728; H03K19/17748; H03K19/17764; H03K19/1778
Claims Analysis
Total Claims: 57
Claim 1
Independent Claim
142 words
A defect-tolerant cell addressable array comprising: a. an array of functional cells arranged in rows and columns; b. cell selection means responsive to cell address code signals for selectively addressing an individual functional cell in a respective row and column; c. a plurality of redundant functional cells; d. memory means in which cell address codes of defective functional cells indicative of row and column locations are selectively storable, said memory means being responsive to said cell address code signals for detecting when the cell address code signals correspond to the address codes of defective ones of said functional cells and for generating a signal indicative thereof; and e. logic means responsive to the signal generated by said memory means for selecting a corresponding one of said redundant functional cells and for inhibiting the selection of the respective defective cell of said array.
Claim 2
Dependent Claim
142 words
A defect-tolerant cell addressable array comprising: a. an array of functional cells arranged in rows and columns; b. cell selection means responsive to cell address code signals for selectively addressing an individual functional cell in a respective row and column; c. a plurality of redundant functional cells; d. memory means in which cell address codes of defective functional cells indicative of row and column locations are selectively storable, said memory means being responsive to said cell address code signals for detecting when the cell address code signals correspond to the address codes of defective ones of said functional cells and for generating a signal indicative thereof; and e. logic means responsive to the signal generated by said memory means for selecting a corresponding one of said redundant functional cells and for inhibiting the selection of the respective defective cell of said array.
Claim 3
Dependent Claim
20 words
The defect-tolerant cell addressable array according to claim 1 wherein a redundant row and/or column of functional cells is provided.
Claim 4
Dependent Claim
18 words
The defect-tolerant cell addressable array according to claim 1 wherein said cell selection means selectively enables addressed cells.
Claim 5
Dependent Claim
24 words
The defect-tolerant cell addressable array according to claim 1 wherein said cell selection means includes a row address decoder and a column address decoder.
Claim 6
Dependent Claim
30 words
The defect-tolerant cell addressable array according to claim 1 wherein said array, cell selection means, redundant functional cells, memory means and logic means are integrated as a monolithic semiconductor structure.
Claim 7
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 5 wherein said memory means is programmable after said integrated monolithic semiconductor structure is fabricated.
Claim 8
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 6 wherein said memory means is a field programmable logic array or read-only memory array.
Claim 9
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 7 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.
Claim 10
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 67 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.
Claim 11
Dependent Claim
19 words
The defect-tolerant cell addressable array according to claim 1 wherein said memory means is a field programmable memory means.
Claim 12
Dependent Claim
16 words
The defect-tolerant cell addressable array according to claim 10 wherein said memory means is electrically programmable.
Claim 13
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 11 wherein said memory means is a field programmable logic array or read-only memory array.
Claim 14
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 12 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.
Claim 15
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 12 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.
Claim 16
Dependent Claim
22 words
The defect-tolerant cell addressable array according to claim 12 wherein said field programmable memory means is comprised of MNOS or FAMOS devices.
Claim 17
Dependent Claim
16 words
The defect-tolerant cell addressable array according to claim 10 wherein said memory means is mechanically programmable.
Claim 18
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 16 wherein said memory means is programmable by the mechanical open-circuiting of selected bonded wires.
Claim 19
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 16 wherein said memory means is programmed by the bonding of wires to selected terminals of said memory means.
Claim 20
Dependent Claim
18 words
The defect-tolerant cell addressable array according to claim 1 wherein said memory means is a constant addressable memory.
Claim 21
Dependent Claim
18 words
The defect-tolerant cell addressable array according to claim 1 wherein said array is a random access memory array.
Claim 22
Dependent Claim
160 words
A defect-tolerant cell addressable array comprising: a. an array of functional cells arranged in rows and columns; b. cell selection means responsive to row and column address code signals for selectively addressing an individual functional cell in a respective row and column; c. at least one redundant row or column of functional cells; d. programmable or programmed memory means coupled to receive said row and column address code signals for detecting the address codes of defective ones of said functional cells and generating a signal indicative thereof, said memory means including means for storing the row and column address codes of one or more defective cells of said array of functional cells; and e. logic means coupled to said memory means and responsive to the generated signal for selecting a corresponding functional cell in said redundant row or column each time a defective cell is detected by said memory means and for inhibiting the selection of the addressed defective cell.
Claim 23
Dependent Claim
160 words
A defect-tolerant cell addressable array comprising: a. an array of functional cells arranged in rows and columns; b. cell selection means responsive to row and column address code signals for selectively addressing an individual functional cell in a respective row and column; c. at least one redundant row or column of functional cells; d. programmable or programmed memory means coupled to receive said row and column address code signals for detecting the address codes of defective ones of said functional cells and generating a signal indicative thereof, said memory means including means for storing the row and column address codes of one or more defective cells of said array of functional cells; and e. logic means coupled to said memory means and responsive to the generated signal for selecting a corresponding functional cell in said redundant row or column each time a defective cell is detected by said memory means and for inhibiting the selection of the addressed defective cell.
Claim 24
Dependent Claim
42 words
The defective-tolerant cell addressable array according to claim 21 wherein a redundant row of cells is provided and wherein the functional cell in such redundant row in the same column as the addressed defective cell is selected by said cell selection means.
Claim 25
Dependent Claim
42 words
The defect-tolerant cell addressable array according to claim 21 wherein a redundant column of cells is provided and wherein the functional cell in such redundant column in the same row as the addressed defective cell is selected by said cell selection means.
Claim 26
Dependent Claim
51 words
The defect-tolerant cell addressable array according to claim 21 wherein a plurality of redundant rows or columns of cells are provided and wherein said memory means generates a signal for selecting one of said redundant rows or columns from which a corresponding redundant functional cell is to replace said defective cell.
Claim 27
Dependent Claim
45 words
The defect-tolerant cell addressable array according to claim 24 wherein a plurality of redundant rows of cells is provided and wherein the functional cell in a selected redundant row in the same column as the addressed defective cell is selected by said cell selection means.
Claim 28
Dependent Claim
45 words
The defect-tolerant cell addressable array according to claim 24 wherein a plurality of redundant columns of cells is provided and wherein the functional cell in a selected redundant column in the same row as the addressed defective cell is selected by said cell selection means.
Claim 29
Dependent Claim
56 words
The defect-tolerant cell addressable array according to claim 21 wherein at least one redundant row and one redundant column of cells are provided and wherein said memory means generates a signal for selecting the one of said redundant rows or said redundant columns from which a corresponding redundant functional cell is to replace said defective cell.
Claim 30
Dependent Claim
51 words
The defect-tolerant cell addressable array according to claim 27 wherein said memory means generates a signal for selecting a cell that is both in a redundant row and a redundant column to replace a defective cell in said array or a defective cell in one of said redundant rows or columns.
Claim 31
Dependent Claim
86 words
The defect-tolerant cell addressable array according to claim 27 wherein the functional cell in said at least one redundant row in the same column as an addressed defective cell is selected by said cell selection means when said at least one redundant row is selected by said memory means and wherein said at least one redundant column in the same row as an addressed defective cell is selected by said cell selection means when said at least one redundant column is selected by said memory means.
Claim 32
Dependent Claim
65 words
The defect-tolerant cell addressable array according to claim 21 wherein a plurality of redundant rows and at least one redundant column or a plurality of redundant columns and at least one redundant row are provided and wherein said memory means generates a signal for selecting the one of said redundant columns or rows from which a corresponding redundant cell is to replace a defective cell.
Claim 33
Dependent Claim
48 words
The defect-tolerant cell addressable array according to claim 30 wherein said memory means generates a signal which selects a cell that is both in a redundant row and a redundant column to replace a defective cell in said array or in one of said redundant rows or columns.
Claim 34
Dependent Claim
18 words
The defect-tolerant cell addressable array according to claim 21 wherein said cell selection means selectively enables addressed cells.
Claim 35
Dependent Claim
24 words
The defect-tolerant cell addressable array according to claim 21 wherein said cell selection means includes a row address decoder and a column address decoder.
Claim 36
Dependent Claim
30 words
The defect-tolerant cell addressable array according to claim 21 wherein said array, cell selection means, redundant functional cells, memory means and logic means are integrated as a monolithic semiconductor structure.
Claim 37
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 34 wherein said memory means is programmable after said integrated monolithic semiconductor structure is fabricated.
Claim 38
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 35 wherein said memory means is a field programmable logic array or read-only memory array.
Claim 39
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 36 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.
Claim 40
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 36 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.
Claim 41
Dependent Claim
19 words
The defect-tolerant cell addressable array according to claim 21 wherein said memory means is a field programmable memory means.
Claim 42
Dependent Claim
16 words
The defect-tolerant cell addressable array according to claim 39 wherein said memory means is electrically programmable.
Claim 43
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 40 wherein said memory means is a field programmable logic array or read-only memory array.
Claim 44
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 41 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.
Claim 45
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 41 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.
Claim 46
Dependent Claim
22 words
The defect-tolerant cell addressable array according to claim 41 wherein said field programmable memory means is comprised of MNOS or FAMOS devices.
Claim 47
Dependent Claim
16 words
The defect-tolerant cell addressable array according to claim 39 wherein said memory means is mechanically programmable.
Claim 48
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 45 wherein said memory means if programmable by the mechanical open-circuiting of selected bonded wires.
Claim 49
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 45 wherein said memory means is programmed by the bonding of wires to selected terminals of said memory means.
Claim 50
Dependent Claim
18 words
The detect-tolerant cell addressable array according to claim 21 wherein said memory means is a content addressable memory.
Claim 51
Dependent Claim
18 words
The defect-tolerant cell addressable array according to claim 21 wherein said array is a random access memory array.
Claim 52
Independent Claim
179 words
A system of defect-tolerant cell addressable arrays comprising: a. a plurality of arrays of functional cells each being arranged in rows and columns; b. at least one redundant row or column of functional cells associated with each of said arrays; c. cell selection means responsive to row, column and array address code signals for selectively addressing an individual cell in a respective row, column and array; d. programmable or programmed memory means coupled to receive said row, column and array address code signals for detecting the address codes of defective ones of said functional cells and generating a signal indicative thereof, said memory means including means for storing the row, column and array address codes of one or more defective cells of said arrays of functional cells; and e. logic means coupled to said memory means and responsive to the generated signal for selecting a corresponding functional cell in the redundant row or column of said addressed array each time a defective cell is detected by said memory means and for inhibiting the selection of the addressed defective cell.
Claim 53
Independent Claim
179 words
A system of defect-tolerant cell addressable arrays comprising: a. a plurality of arrays of functional cells each being arranged in rows and columns; b. at least one redundant row or column of functional cells associated with each of said arrays; c. cell selection means responsive to row, column and array address code signals for selectively addressing an individual cell in a respective row, column and array; d. programmable or programmed memory means coupled to receive said row, column and array address code signals for detecting the address codes of defective ones of said functional cells and generating a signal indicative thereof, said memory means including means for storing the row, column and array address codes of one or more defective cells of said arrays of functional cells; and e. logic means coupled to said memory means and responsive to the generated signal for selecting a corresponding functional cell in the redundant row or column of said addressed array each time a defective cell is detected by said memory means and for inhibiting the selection of the addressed defective cell.
Claim 54
Dependent Claim
44 words
The system according to claim 50 including a redundant array of cells within said logic means selects a functional cell in said redundant array instead of the redundant row or column of the addressed array according to the signal generated by said memory means.
Claim 55
Dependent Claim
15 words
The system according to claim 50 wherein each of said arrays are integrated circuit modules.
Claim 56
Dependent Claim
18 words
The system according to claim 50 wherein said plurality of arrays are integrated as a monolithic semiconductor structure.
Claim 57
Dependent Claim
22 words
The system according to claim 53 wherein said cell selection means, memory means and logic means are integrated on the same structure.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-09-26 | 1981-03-28 | 1981-09-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-09-26 | 1985-03-28 | 1985-09-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-09-26 | 1989-03-28 | 1989-09-27 | $7700.00 | Window Closed / Lapsed |