US4047163A
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US
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Fault-tolerant cell addressable array
Assignee: Texas Instruments Inc
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Filing: 1975-07-03
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Granted: 1977-09-06
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Expires: 1995-07-03
Abstract
Abstract A small programmable memory means such as an electrically programmable logic array is incorporated on the chip of a conventional bit addressable random access memory or other cell addressable array circuit. The array has one or more superfluous rows and/or columns of cells held in reserve. Processing and testing of the chip is conducted in a conventional manner. Chips with faulty cells are corrected by programming the memory means with the cell addresses of the faulty cell locations. Subsequently, the memory means will respond to any of these addresses and, through interaction with input/output logic, cause the data input and/or output to be steered to or from a reserve cell instead of the addressed faulty cell.
Inventors
- 👤 William Clay Choate
- 👤 Dileep P. Bhandarkar
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 07:16
CPC Classifications
G; G11; G11C; G11C29/00; G11C29/70; G11C29/78; H; H03; H03K; H03K19/00; H03K19/003; H03K19/02; H03K19/173; H03K19/177; H03K19/17704; H03K19/17724; H03K19/17728; H03K19/17748; H03K19/1776; H03K19/17764; H03K19/1778
Claims Analysis
Total Claims: 57
Claim 1
Independent Claim
143 words
A defect-tolerant cell addressable array comprising: a. an array of functional cells arranged in rows and columns; b. a plurality of redundant functional cells; c. cell selection means responsive to cell address code signals for selectively addressing an individual functional cell in a respective row and column and simultaneously addressing a corresponding redundant cell; d. memory means in which address codes of the row and column addresses of defective functional cells are selectively storable, said memory means being responsive to said cell address code signals for detecting when the cell address code signals correspond to the address codes of defective ones of said functional cells and for generating a signal indicative thereof; and e. logic means responsive to the signal generated by said memory means for directing data into and/or out of the respectively addressed redundant cell instead of an addressed defective cell.
Claim 2
Dependent Claim
143 words
A defect-tolerant cell addressable array comprising: a. an array of functional cells arranged in rows and columns; b. a plurality of redundant functional cells; c. cell selection means responsive to cell address code signals for selectively addressing an individual functional cell in a respective row and column and simultaneously addressing a corresponding redundant cell; d. memory means in which address codes of the row and column addresses of defective functional cells are selectively storable, said memory means being responsive to said cell address code signals for detecting when the cell address code signals correspond to the address codes of defective ones of said functional cells and for generating a signal indicative thereof; and e. logic means responsive to the signal generated by said memory means for directing data into and/or out of the respectively addressed redundant cell instead of an addressed defective cell.
Claim 3
Dependent Claim
20 words
The defect-tolerant cell addressable array according to claim 1 wherein a redundant row and/or column of functional cells is provided.
Claim 4
Dependent Claim
19 words
The defect-tolerant cell addressable array according to claim 1 wherein said cell selection means selectively enables the addressed cells.
Claim 5
Dependent Claim
24 words
The defect-tolerant cell addressable array according to claim 1 wherein said cell selection means includes a row address decoder and a column address decoder.
Claim 6
Dependent Claim
30 words
The defect-tolerant cell addressable array according to claim 1 wherein said array, cell selection means, redundant functional cells, memory means and logic means are integrated as a monolithic semiconductor structure.
Claim 7
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 5 wherein said memory means is programmable after said integrated monolithic semiconductor structure is fabricated.
Claim 8
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 6 wherein said memory means is a field programmable logic array or read-only memory array.
Claim 9
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 7 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.
Claim 10
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 7 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.
Claim 11
Dependent Claim
19 words
The defect-tolerant cell addressable array according to claim 1 wherein said memory means is a field programmable memory means.
Claim 12
Dependent Claim
16 words
The defect-tolerant cell addressable array according to claim 10 wherein said memory means is electrically programmable.
Claim 13
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 11 wherein said memory means is a field programmable logic array or read-only memory array.
Claim 14
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 12 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.
Claim 15
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 12 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.
Claim 16
Dependent Claim
22 words
The defect-tolerant cell addressable array according to claim 12 wherein said field programmable memory means is comprised of MNOS or FAMOS devices.
Claim 17
Dependent Claim
16 words
The defect-tolerant cell addressable array according to claim 10 wherein said memory means is mechanically programmable.
Claim 18
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 16 wherein said memory means is programmable by the mechanical open-circuiting of selected bonded wires.
Claim 19
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 16 wherein said memory means is programmed by the bonding of wires to selected terminals of said memory means.
Claim 20
Dependent Claim
18 words
The defect-tolerant cell addressable array according to claim 1 wherein said memory means is a content addressable memory.
Claim 21
Dependent Claim
18 words
The defect-tolerant cell addressable array according to claim 1 wherein said array is a random access memory array.
Claim 22
Dependent Claim
186 words
A defect-tolerant cell addressable array comprising: a. an array of functional cells arranged in rows and columns; b. at least one redundant row or column of functional cells; c. cell selection means responsive to row and column address code signals for selectively addressing an individual cell in a respective row and column and for simultaneously addressing a corresponding cell in said at least one redundant row or column; d. programmable or programmed memory means coupled to receive said row and column address code signals for detecting the address codes of defective ones of said functional cells and generating a signal indicative thereof, said memory means including means for storing the row and column address codes of one or more defective cells of said array of functional cells; and e. logic means coupled to said memory means and responsive to the generated signal for selectively transferring data into and/or out of the addressed cell in said redundant row or column each time a defective cell is detected by said memory means and for otherwise selectively transferring data into and/or out of the addressed cell of said array.
Claim 23
Dependent Claim
186 words
A defect-tolerant cell addressable array comprising: a. an array of functional cells arranged in rows and columns; b. at least one redundant row or column of functional cells; c. cell selection means responsive to row and column address code signals for selectively addressing an individual cell in a respective row and column and for simultaneously addressing a corresponding cell in said at least one redundant row or column; d. programmable or programmed memory means coupled to receive said row and column address code signals for detecting the address codes of defective ones of said functional cells and generating a signal indicative thereof, said memory means including means for storing the row and column address codes of one or more defective cells of said array of functional cells; and e. logic means coupled to said memory means and responsive to the generated signal for selectively transferring data into and/or out of the addressed cell in said redundant row or column each time a defective cell is detected by said memory means and for otherwise selectively transferring data into and/or out of the addressed cell of said array.
Claim 24
Dependent Claim
61 words
The defect-tolerant cell addressable array according to claim 21 wherein said logic means includes means for inhibiting the transfer of data into or out of the addressed cell of said array each time a defective cell is detected by said memory means and for otherwise inhibiting data transfer into and/or out of the addressed cell in said redundant row or column.
Claim 25
Dependent Claim
50 words
The defect-tolerant cell addressable array according to claim 21 wherein a redundant row of cells is provided and wherein data is input to or output from the functional cell in such redundant row in the same column as the addressed defective cell which is selected by said cell selection means.
Claim 26
Dependent Claim
50 words
The defect-tolerant cell addressable array according to claim 21 wherein a redundant column of cells is provided and wherein data is input to or output from the functional cell in such redundant column in the same row as the addressed defective cell which is selected by said cell selection means.
Claim 27
Dependent Claim
52 words
The defect-tolerant cell addressable array according to claim 21 wherein a plurality of redundant rows or columns of cells are provided and wherein said memory means generates a signal for selecting one of said redundant rows or columns to or from which data is to be transferred instead of a defective cell.
Claim 28
Dependent Claim
53 words
The defect-tolerant cell addressable array according to claim 25 wherein a plurality of redundant rows of cells is provided and wherein data is input to or output from the functional cell in a selected redundant row in the same column as the addressed defective cell which is selected by said cell selection means.
Claim 29
Dependent Claim
53 words
The defect-tolerant cell addressable array according to claim 25 wherein a plurality of redundant columns of cells is provided and wherein data is input to or output from the functional cell in a selected redundant column in the same row as the addressed defective cell which is selected by said cell selection means.
Claim 30
Dependent Claim
19 words
The defect-tolerant cell addressable array according to claim 21 wherein said cell selection means selectively enables the addressed cells.
Claim 31
Dependent Claim
24 words
The defect-tolerant cell addressable array according to claim 21 wherein said cell selection means includes a row address decoder and a column address decoder.
Claim 32
Dependent Claim
30 words
The defect-tolerant cell addressable array according to claim 21 wherein said array, cell selection means, redundant functional cells, memory means and logic means are integrated as a monolithic semiconductor structure.
Claim 33
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 30 wherein said memory means is programmable after said integrated monolithic semiconductor structure is fabricated.
Claim 34
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 31 wherein said memory means is a field programmable logic array or read-only memory array.
Claim 35
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 32 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.
Claim 36
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 32 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.
Claim 37
Dependent Claim
19 words
The defect-tolerant cell addressable array according to claim 21 wherein said memory means is a field programmable memory means.
Claim 38
Dependent Claim
16 words
The defect-tolerant cell addressable array according to claim 35 wherein said memory means is electrically programmable.
Claim 39
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 36 wherein said memory means is a field programmable logic array or read-only memory array.
Claim 40
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 37 wherein said programmable logic array or read-only memory array is comprised of memory elements connected by fusible links.
Claim 41
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 37 wherein said field programmable logic array or read-only memory array is comprised of semiconductor avalanche induced migration devices.
Claim 42
Dependent Claim
22 words
The defect-tolerant cell addressable array according to claim 37 wherein said field programmable memory means is comprised of MNOS or FAMOS devices.
Claim 43
Dependent Claim
16 words
The defect-tolerant cell addressable array according to claim 35 wherein said memory means is mechanically programmable.
Claim 44
Dependent Claim
23 words
The defect-tolerant cell addressable array according to claim 41 wherein said memory means is programmable by the mechanical open-circuiting of selected bonded wires.
Claim 45
Dependent Claim
27 words
The defect-tolerant cell addressable array according to claim 41 wherein said memory means is programmed by the bonding of wires to selected terminals of said memory means.
Claim 46
Dependent Claim
18 words
The defect-tolerant cell addressable array according to claim 21 wherein said memory means is a content addressable memory.
Claim 47
Dependent Claim
18 words
The defect-tolerant cell addressable array according to claim 21 wherein said array is a random access memory array.
Claim 48
Independent Claim
189 words
A system of defect-tolerant cell addressable arrays comprising: a. a plurality of arrays of functional cells each being arranged in rows and columns; b. at least one redundant row or column of functional cells associated with each of said arrays; c. cell selection means responsive to row, column and array address code signals for selectively addressing an individual cell in a respective row, column and array and for simultaneously addressing a corresponding cell in the redundant row or column of such array; d. programmable or programmed memory means coupled to receive said row, column and array address code signals for detecting the address codes of defective ones of said functional cells and for generating a signal indicative thereof, said memory means including means for storing the row, column and array address codes of one or more defective cells of said arrays of functional cells; and e. logic means coupled to said memory means and responsive to the generated signal for selectively directing data into and/or out of the addressed cell of said arrays or said redundant row or column in dependence upon the signal generated by said memory means.
Claim 49
Independent Claim
189 words
A system of defect-tolerant cell addressable arrays comprising: a. a plurality of arrays of functional cells each being arranged in rows and columns; b. at least one redundant row or column of functional cells associated with each of said arrays; c. cell selection means responsive to row, column and array address code signals for selectively addressing an individual cell in a respective row, column and array and for simultaneously addressing a corresponding cell in the redundant row or column of such array; d. programmable or programmed memory means coupled to receive said row, column and array address code signals for detecting the address codes of defective ones of said functional cells and for generating a signal indicative thereof, said memory means including means for storing the row, column and array address codes of one or more defective cells of said arrays of functional cells; and e. logic means coupled to said memory means and responsive to the generated signal for selectively directing data into and/or out of the addressed cell of said arrays or said redundant row or column in dependence upon the signal generated by said memory means.
Claim 50
Dependent Claim
15 words
The system according to claim 46 wherein each of said arrays are integrated circuit modules.
Claim 51
Dependent Claim
18 words
The system according to claim 46 wherein said plurality of arrays are integrated as a monolithic semiconductor structure.
Claim 52
Dependent Claim
22 words
The system according to claim 48 wherein said cell selection means, memory means and logic means are integrated on the same structure.
Claim 53
Independent Claim
172 words
A system of defect-tolerant cell addressable arrays comprising: a. a plurality of arrays, including at least one redundant array, of functional cells each being arranged in rows and columns; b. at least one redundant row or column of functional cells associated with each of said arrays; c. cell selection means responsive to row, column and array address code signals for selectively addressing an individual cell in a respective row, column and array; d. programmable or programmed memory means coupled to receive said row, column and array address code signals for detecting the address codes of defective ones of said functional cells and for generating a signal indicative thereof, said memory means including means for storing the row, column and array address codes of one or more defective cells of said arrays of functional cells; and e. logic means coupled to said memory means and responsive to said generated signal for directing data into and/or out of a functional cell in said redundant array instead of the defective cell in the addressed array.
Claim 54
Independent Claim
172 words
A system of defect-tolerant cell addressable arrays comprising: a. a plurality of arrays, including at least one redundant array, of functional cells each being arranged in rows and columns; b. at least one redundant row or column of functional cells associated with each of said arrays; c. cell selection means responsive to row, column and array address code signals for selectively addressing an individual cell in a respective row, column and array; d. programmable or programmed memory means coupled to receive said row, column and array address code signals for detecting the address codes of defective ones of said functional cells and for generating a signal indicative thereof, said memory means including means for storing the row, column and array address codes of one or more defective cells of said arrays of functional cells; and e. logic means coupled to said memory means and responsive to said generated signal for directing data into and/or out of a functional cell in said redundant array instead of the defective cell in the addressed array.
Claim 55
Dependent Claim
15 words
The system according to claim 50 wherein each of said arrays are integrated circuit modules.
Claim 56
Dependent Claim
18 words
The system according to claim 59 wherein said plurality of arrays are integrated as a monolithic semiconductor structure.
Claim 57
Dependent Claim
22 words
The system according to claim 52 wherein said cell selection means, memory means and logic means are integrated on the same structure.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-09-05 | 1981-03-07 | 1981-09-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-09-05 | 1985-03-07 | 1985-09-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-09-05 | 1989-03-07 | 1989-09-06 | $7700.00 | Window Closed / Lapsed |