Method and apparatus for electron beam alignment with a member by detecting X-rays

Claim 3

A method of precision aligning an electron beam with selected areas of a major surface of a member as set forth in claim 1 wherein: the predetermined cross-sectional shape of the alignment beam portion of the electron beam corresponds in fabrication accuracy to the accuracy of alignment desired.

Claim 4

A method of precision aligning an electron beam with selected areas of a major surface of a member as set forth in claim 2 wherein: the predetermined shape of the marks correspond in fabrication accuracy to the accuracy of alignment desired.

Claim 5

A method of precision aligning an electron beam with selected areas of a major surface of a member as set forth in claim 1 wherein: the predetermined shape of each mark is substantially the same as the predetermined cross-sectional shape of the corresponding alignment beam portion.

Claim 6

A method of precision aligning an electron beam with selected areas of a major surface of a member as set forth in claim 1 wherein: forming each mark includes positioning an opaque layer adjacent a layer of x-ray generating material to circumscribe a portion of said layer in the predetermined shape and cause a differential in x-ray radiation projected by said layer at said portion on irradiation.

Claim 7

A method of precision aligning an electron beam with selected areas of a major surface of a member as set forth in claim 1 wherein: the major surface of the member is divided into contiguous fields with the marks positiond symmetrically along boundaries between said contiguous fields.

Claim 8

A method of precision aligning an electron beam with selected areas of a major surface of a member as set forth in claim 6 wherein: the electron beam to be aligned is a scanning electron beam for selectively irradiating an electroresist layer on the major surface of the member.

Claim 11

A method of precision aligning a patterned electron beam generated by a photocathode source with selected areas of a major surface of a member as set forth in claim 8 wherein: the predetermined cross-sectional shape of the alignment beam portions of the electron beam correspond in fabrication accuracy to the accuracy of alignment desired.

Claim 12

A method of precision aligning a patterned electron beam generated by a photocathode source with selected areas of a major surface of a member as set forth in claim 9 wherein: the predetermined shape of the marks correspond in fabrication accuracy to the accuracy of alignment desired.

Claim 13

A method of precision aligning a patterned electron beam generated by a photocathode source with selected areas of a major surface of a member as set forth in claim 8 wherein: the predetermined shape of each mark is substantially the same as predetermined cross-sectional shape of the corresponding alignment beam portion.

Claim 14

A method of precision aligning a patterned electron beam generated by a photocathode source with selected areas of a major surface of a member as set forth in claim 8 wherein: forming each mark includes positioning an opaque layer adjacent a layer of x-ray generating material to circumscribe a portion of said layer in the predetermined shape and cause a differential in x-ray radiation projected by said layer at said portion on irradiation.

Claim 15

A method of precision aligning a patterned electron beam generated by a photocathode source with selected areas of a major surface of a member as set forth in claim 8 wherein: step D is automatically performed by electrically processing the electrical signal output corresponding to the detected x-ray radiation on modulation of the movement of the alignment beam portions over the corresponding marks.

Claim 16

Apparatus for selectively irradiating precisely located areas of a major surface of a member comprising: A. a photocathode source for generating a patterned beam of electrons including at least one alignment beam portion of predetermined cross-sectional shape; B. at least one mark corresponding to each alignment beam portion and capable of generating x-ray radiation on irradiation with an electron beam corresponding to the area of the mark irradiated with the electron beam, each said mark being supported adjacent a major surface of a member to be aligned with the patterned beam of electrons and having a predetermined shape; C. means for positioning the member in a spaced relation to the photocathode source for the patterned beam; D. means for applying a potential between the member and the photocathode source whereby electrons from the photocathode source are directed to and selectively irradiate selected areas of the major surface of the member; E. electromagnetic means for directing the patterned beam of electrons from the photocathode source to irradiate selected portions of the major surface of the member close to the selected areas wherein each alignment beam portion irradiates selected portions of the surface portions of the major surface of the member close to a corresponding mark; F. detector means for detecting the x-ray radiation projected by the corresponding mark and producing an electrical signal corresponding to the area thereof irradiated by the alignment beam portions; and G. electrical means for moving the patterned beam of electrons relative to the member responsive to said electrical signal from the detector means to cause the alignment beam portions to align with corresponding marks, whereby the patterned beam of electrons from the photocathode source is located relative to the member so that precisely located areas of the major surface of the member can be selectively irradiated with the patterned electron beam.

Claim 17

Apparatus for selectively irradiating precisely located areas of a major surface of a member comprising: A. a photocathode source for generating a patterned beam of electrons including at least one alignment beam portion of predetermined cross-sectional shape; B. at least one mark corresponding to each alignment beam portion and capable of generating x-ray radiation on irradiation with an electron beam corresponding to the area of the mark irradiated with the electron beam, each said mark being supported adjacent a major surface of a member to be aligned with the patterned beam of electrons and having a predetermined shape; C. means for positioning the member in a spaced relation to the photocathode source for the patterned beam; D. means for applying a potential between the member and the photocathode source whereby electrons from the photocathode source are directed to and selectively irradiate selected areas of the major surface of the member; E. electromagnetic means for directing the patterned beam of electrons from the photocathode source to irradiate selected portions of the major surface of the member close to the selected areas wherein each alignment beam portion irradiates selected portions of the surface portions of the major surface of the member close to a corresponding mark; F. detector means for detecting the x-ray radiation projected by the corresponding mark and producing an electrical signal corresponding to the area thereof irradiated by the alignment beam portions; and G. electrical means for moving the patterned beam of electrons relative to the member responsive to said electrical signal from the detector means to cause the alignment beam portions to align with corresponding marks, whereby the patterned beam of electrons from the photocathode source is located relative to the member so that precisely located areas of the major surface of the member can be selectively irradiated with the patterned electron beam.

Claim 18

Apparatus for selectively irradiating precisely located areas of a major surface of a member as set forth in claim 14 wherein: the patterned beam of electrons generated by the photocathode source includes at least two spaced apart alignment beam portions of predetermined cross-sectional shape.

Claim 19

Apparatus for selectively irradiating precisely located areas of a major surface of a substrate as set forth in claim 15 wherein: the electrical means includes modulation means for oscillating the movement of each alignment beam portion on a corresponding mark, phase detection means for detecting along orthogonal axes the error from coincidence of the alignment beam portions and the marks and outputting the electrical signal corresponding thereto, and actuating means for changing the electrical input to the electromagnetic means responsive to the electrical signal from the phase detector means to bring the alignment beam portions and the marks into alignment.