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US3939488A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of manufacturing semiconductor device and resulting product

Assignee: Hitachi Ltd
•
Filing: 1974-02-28
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Granted: 1976-02-17
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Expires: 1994-02-28
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Abstract

Abstract In sealing at least a semiconductor element portion of a semiconductor device by the use of a resin, the semiconductor element is covered with a stabilizer or with a resin containing the stabilizer. The stabilizer is adapted to check the migration of a mobile substance such as hydrochloric acid and a mobile ion such as chlorine ion existent within the resin. Owing to the fixation of the ion, the electrical characteristics of the semiconductor device are prevented from being degraded, and constituent parts in the semiconductor device are prevented from being corroded.

Inventors

  • 👤 Yoshiaki Wakashima
  • 👤 Hiroshi Suzuki

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 17:46
CPC Classifications
H; H10; H10W; H10W74/00; H10W74/10; H10W74/111; H10W74/121; H10W74/131; H10W72/00; H10W72/01; H10W72/015; H10W72/01515; H10W72/071; H10W72/075; H10W90/00; H10W90/701; H10W90/751; H10W90/756

Claims Analysis

Total Claims: 26
Claim 1
Independent Claim 74 words
A method for sealing a semiconductor device comprising covering a semiconductor element with a protective covering layer containing a metal-containing stabilizer which prevents the migration of mobile substances and mobile ions within the protective covering layer, said metal-containing stabilizer comprising a salt of an organic acid, an alcoholate, a phenolate or mercaptide, the metal component of said metal-containing stabilizer being selected from the group consisting of Ca, Mg, Sr, Cd, Zn, Sn and Pb.
Claim 2
Independent Claim 74 words
A method for sealing a semiconductor device comprising covering a semiconductor element with a protective covering layer containing a metal-containing stabilizer which prevents the migration of mobile substances and mobile ions within the protective covering layer, said metal-containing stabilizer comprising a salt of an organic acid, an alcoholate, a phenolate or mercaptide, the metal component of said metal-containing stabilizer being selected from the group consisting of Ca, Mg, Sr, Cd, Zn, Sn and Pb.
Claim 3
Dependent Claim 22 words
The method of claim 1, wherein said stabilizer is selected from the group consisting of zinc mercaptide, zinc salicylate and lead phthalate.
Claim 4
Dependent Claim 21 words
The method of claim 2, wherein said layer is synthetic resin containing from 0.1 to 10% by weight of said stabilizer.
Claim 5
Dependent Claim 18 words
The method of claim 3, wherein the protective layer has a thickness ranging from 1μ to 1 mm.
Claim 6
Dependent Claim 18 words
The method of claim 2, wherein the protective layer has a thickness ranging from 1μ to 1 mm.
Claim 7
Dependent Claim 11 words
The method of claim 1, wherein said stabilizer is zinc mercaptide.
Claim 8
Dependent Claim 11 words
The method of claim 1, wherein said stabilizer is zinc salicylate.
Claim 9
Dependent Claim 11 words
The method of claim 1, wherein said stabilizer is lead phthalate.
Claim 10
Dependent Claim 21 words
The method of claim 1, wherein said layer is synthetic resin containing from 0.1 to 10% by weight of said stabilizer.
Claim 11
Dependent Claim 18 words
The method of claim 1, wherein the protective layer has a thickness ranging from 1μ to 1 mm.
Claim 12
Dependent Claim 78 words
A sealed semiconductor device comprising a semiconductor element having a protective covering layer covering a portion thereof, said protective covering layer containing a metal-containing stabilizer which prevents the migration of mobile substances and mobile ions within the protective covering layer, said metal-containing stabilizer comprising a salt of an organic acid, an alcoholate, a phenolate or mercaptide, the metal component of said metal-containing stabilizer being selected from the group consisting of Ca, Mg, Sr, Cd, Zn, Sn and Pb.
Claim 13
Dependent Claim 78 words
A sealed semiconductor device comprising a semiconductor element having a protective covering layer covering a portion thereof, said protective covering layer containing a metal-containing stabilizer which prevents the migration of mobile substances and mobile ions within the protective covering layer, said metal-containing stabilizer comprising a salt of an organic acid, an alcoholate, a phenolate or mercaptide, the metal component of said metal-containing stabilizer being selected from the group consisting of Ca, Mg, Sr, Cd, Zn, Sn and Pb.
Claim 14
Dependent Claim 22 words
The device of claim 2, wherein said stabilizer is selected from the group consisting of zinc mercaptide, zinc salicylate and lead phthalate.
Claim 15
Dependent Claim 21 words
The device of claim 12, wherein said layer is synthetic resin containing from 0.1 to 10% by weight of said stabilizer.
Claim 16
Dependent Claim 11 words
The device of claim 11, wherein said stabilizer is zinc mercaptide.
Claim 17
Dependent Claim 11 words
The device of claim 11, wherein said stabilizer is zinc salicylate.
Claim 18
Dependent Claim 11 words
The device of claim 11, wherein said stabilizer is lead phthalate.
Claim 19
Dependent Claim 21 words
The device of claim 11, wherein said layer is synthetic resin containing from 0.1 to 10% by weight of said stabilizer.
Claim 20
Dependent Claim 18 words
The device of claim 11, wherein the protective layer has a thickness ranging from 1μ to 1 mm.
Claim 21
Dependent Claim 18 words
The device of claim 13, wherein the protective layer has a thickness ranging from 1μ to 1 mm.
Claim 22
Dependent Claim 18 words
The device of claim 12, wherein the protective layer has a thickness ranging from 1μ to 1 mm.
Claim 23
Dependent Claim 30 words
The device of claim 12, wherein said protective covering layer includes a member selected from the group consisting of epoxy resin, silicon resin, phenol resin, polyimide resin and polyamide resin.
Claim 24
Dependent Claim 30 words
The device of claim 11, wherein said protective covering layer includes a member selected from the group consisting of epoxy resin, silicon resin, phenol resin, polyimide resin and polyamide resin.
Claim 25
Dependent Claim 30 words
The method of claim 2, wherein said protective covering layer includes a member selected from the group consisting of epoxy resin, silicon resin, phenol resin, polyimide resin and polyamide resin.
Claim 26
Dependent Claim 30 words
The method of claim 1, wherein said protective covering layer includes a member selected from the group consisting of epoxy resin, silicon resin, phenol resin, polyimide resin and polyamide resin.

References Cited (Backward Citations)

US3533965A Cited
US3700497A Cited
US3756872A Cited
US3684592A Cited
US3653959A Cited
US3696263A Cited
US3749601A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1979-02-16 1979-08-18 1980-02-17 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1983-02-16 1983-08-18 1984-02-17 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1987-02-16 1987-08-18 1988-02-17 $7700.00 Window Closed / Lapsed

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