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US3929529A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for gettering contaminants in monocrystalline silicon

Assignee: International Business Machines Corp
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Filing: 1974-12-09
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Granted: 1975-12-30
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Expires: 1994-12-09
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Abstract

Abstract A method for removing fast diffusing metal contaminants from a monocrystalline silicon body by (1) anodizing at least one side of the body in an aqueous liquid bath under conditions that result in the formation of a porous silicon surface layer, (2) annealing the resultant structure in a non-oxidizing environment, and (3) exposing the body to an oxidizing environment to oxidize the porous silicon layer to SiO2, or alternatively forming a capping layer over the porous silicon layer.

Inventors

  • 👤 Michael R Poponiak

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 14:01
CPC Classifications
H; H10; H10P; H10P90/00; H10P90/12; H10P90/124; H10P14/00; H10P14/60; H10P14/63; H10P14/6302; H10P14/6304; H10P14/6306; H10P14/6308; H10P14/6309; H10P14/6322; H10P14/65; H10P14/6502; H10P14/6508; H10P36/00; H10P36/03; H10P90/15; Y; Y10; Y10S; Y10S148/00; Y10S148/015; Y10S148/024; Y10S148/037; Y10S148/06; Y10S148/085; Y10S148/117; Y10S148/118; Y10S148/122; Y10S438/00; Y10S438/914; Y10S438/923; Y10S438/96; Y10S438/969

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 88 words
A METHOD FOR REMOVING FAST DIFFUSING METL CONTAMINATES FROM A MONOCRYSTALLINE SILICON BODY COMPRISING: ANODIZING AT LEAST ONE SIDE OF SAID BODY IN AN AQUEOUS LIQUID BATH UNDER CONDITIONS THAT RESULT IN THE FORMATION OF A LAYER OF POROUS SILICON, ANNEALING THE RESULTANT STRUCTURE IN A NONOXIDIZING ENVIRONMENT AT A TEMPERATURE AND A LENGTH OF TIME SUFFICIENT TO DIFFUSE THE CONTAMINATES OF INTEREST A DISTANCE AT LEAST THE THICKNESS OF THE BODY, AND EXPOSING THE BODY TO AN OXIDIZING ENVIRONMENT TO OXIDIZE SAID POROUS SILICON LAYER TO SIO2.
Claim 2
Independent Claim 88 words
A METHOD FOR REMOVING FAST DIFFUSING METL CONTAMINATES FROM A MONOCRYSTALLINE SILICON BODY COMPRISING: ANODIZING AT LEAST ONE SIDE OF SAID BODY IN AN AQUEOUS LIQUID BATH UNDER CONDITIONS THAT RESULT IN THE FORMATION OF A LAYER OF POROUS SILICON, ANNEALING THE RESULTANT STRUCTURE IN A NONOXIDIZING ENVIRONMENT AT A TEMPERATURE AND A LENGTH OF TIME SUFFICIENT TO DIFFUSE THE CONTAMINATES OF INTEREST A DISTANCE AT LEAST THE THICKNESS OF THE BODY, AND EXPOSING THE BODY TO AN OXIDIZING ENVIRONMENT TO OXIDIZE SAID POROUS SILICON LAYER TO SIO2.
Claim 3
Dependent Claim 14 words
The method of claim 1 wherein said layer of SiO2 is removed by etching.
Claim 4
Dependent Claim 18 words
The method of claim 2 wherein the etching solution used to remove the SiO2 includes a chelating agent.
Claim 5
Dependent Claim 23 words
The method of claim 2 which further includes the step of diffusing an impurity into and through said porous silicon layer before annealing.
Claim 6
Dependent Claim 29 words
The method of claim 4 wherein said impurity is diffused into said body at a concentration that equals or exceeds the solid solubility limit of the impurity in silicon.
Claim 7
Dependent Claim 10 words
The method of claim 5 wherein said impurity is boron.
Claim 8
Dependent Claim 10 words
The method of claim 5 wherein said impurity is phosphorus.
Claim 9
Dependent Claim 11 words
The method of claim 1 wherein the non-oxidizing environment is argon.
Claim 10
Dependent Claim 17 words
The method of claim 1 wherein said annealing is performed at a temperature of at least 1000*C.
Claim 11
Dependent Claim 15 words
The method of claim 1 wherein P type diffused regions are formed in said body.
Claim 12
Dependent Claim 22 words
The method of claim 10 wherein an epitaxial layer is deposited on the top surface of said body over the monocrystalline areas.
Claim 13
Dependent Claim 19 words
The method of claim 1 wherein said oxidizing environment is a steam ambient at a temperature greater than 900*C.

References Cited (Backward Citations)

US2462218A Cited
US2739882A Cited
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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1978-12-29 1979-06-30 1979-12-30 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1982-12-29 1983-06-30 1983-12-30 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1986-12-29 1987-06-30 1987-12-30 $7700.00 Window Closed / Lapsed

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